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Extract from the Register of European Patents

EP About this file: EP0489426

EP0489426 - Projection exposure method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  26.06.1998
Database last updated on 13.09.2024
Most recent event   Tooltip26.06.1998No opposition filed within time limitpublished on 12.08.1998 [1998/33]
Applicant(s)For all designated states
Sony Corporation
7-35, Kitashinagawa 6-chome
Shinagawa-ku
Tokyo / JP
[N/P]
Former [1992/24]For all designated states
SONY CORPORATION
7-35, Kitashinagawa 6-chome Shinagawa-ku
Tokyo / JP
Inventor(s)01 / Kitagawa, Tetsuya
c/o Sony Corporation, 7-35 Kitashinagawa 6-chome
Shinagawa-ku, Tokyo / JP
[1992/24]
Representative(s)Müller, Frithjof E.
Müller Hoffmann & Partner Patentanwälte Innere Wiener Strasse 17
81667 München / DE
[N/P]
Former [1997/34]Müller, Frithjof E., Dipl.-Ing.
Patentanwälte MÜLLER & HOFFMANN, Innere Wiener Strasse 17
81667 München / DE
Former [1992/24]TER MEER - MÜLLER - STEINMEISTER & PARTNER
Mauerkircherstrasse 45
D-81679 München / DE
Application number, filing date91120850.204.12.1991
[1992/24]
Priority number, dateJP1990040536206.12.1990         Original published format: JP 40536290
[1992/24]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0489426
Date:10.06.1992
Language:EN
[1992/24]
Type: A3 Search report 
No.:EP0489426
Date:16.09.1992
Language:EN
[1992/38]
Type: B1 Patent specification 
No.:EP0489426
Date:20.08.1997
Language:EN
[1997/34]
Search report(s)(Supplementary) European search report - dispatched on:EP24.07.1992
ClassificationIPC:G03F7/20
[1992/24]
CPC:
G03F7/70333 (EP,US); H01L21/423 (KR); G03F7/2022 (EP,US);
G03F7/70241 (EP,US); G03F7/70358 (EP,US)
Designated contracting statesDE,   FR,   GB [1992/24]
TitleGerman:Verfahren zur Projektionsbelichtung[1992/24]
English:Projection exposure method[1992/24]
French:Méthode d'exposition par projection[1992/24]
Examination procedure16.02.1993Examination requested  [1993/15]
12.06.1996Despatch of a communication from the examining division (Time limit: M04)
25.07.1996Reply to a communication from the examining division
16.10.1996Despatch of communication of intention to grant (Approval: Yes)
19.02.1997Communication of intention to grant the patent
15.05.1997Fee for grant paid
15.05.1997Fee for publishing/printing paid
Opposition(s)21.05.1998No opposition filed within time limit [1998/33]
Fees paidRenewal fee
14.12.1993Renewal fee patent year 03
07.12.1994Renewal fee patent year 04
08.12.1995Renewal fee patent year 05
11.12.1996Renewal fee patent year 06
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Documents cited:Search[XD]JP58017446  ;
 [E]EP0484131  (NIPPON KOGAKU KK [JP]);
 [AD]US4869999  (FUKUDA HIROSHI [JP], et al)
 [XD]  - PATENT ABSTRACTS OF JAPAN vol. 7, no. 90 (P-191)14 April 1983 & JP-A-58 017 446 ( HITACHI SEISAKUSHO K. K. ) 1 February 1983, & JP58017446 A 19830201
 [A]  - IBM TECHNICAL DISCLOSURE BULLETIN. vol. 32, no. 1, June 1989, NEW YORK US pages 125 - 127; 'EXTENDED FOCAL DEPTH MICROLITHOGRAPHY'
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.