EP0480512 - Position-sensitive radiation detection system and optical scanning device provided with such a system [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 16.02.1993 Database last updated on 03.09.2024 | Most recent event Tooltip | 16.02.1993 | Withdrawal of application | published on 07.04.1993 [1993/14] | Applicant(s) | For all designated states Koninklijke Philips Electronics N.V. Groenewoudseweg 1 5621 BA Eindhoven / NL | [N/P] |
Former [1992/16] | For all designated states Philips Electronics N.V. Groenewoudseweg 1 NL-5621 BA Eindhoven / NL | Inventor(s) | 01 /
Van Amstel, Willem Dirk c/o INT. OCTROOIBUREAU B.V., Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | 02 /
Van de Goor, Petrus Fredericus Antonius c/o INT. OCTROOIBUREAU B.V., Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | [1992/16] | Representative(s) | Cobben, Louis Marie Hubert, et al Philips Intellectual Property & Standards P.O. Box 220 5600 AE Eindhoven / NL | [N/P] |
Former [1992/16] | Cobben, Louis Marie Hubert, et al INTERNATIONAAL OCTROOIBUREAU B.V., Prof. Holstlaan 6 NL-5656 AA Eindhoven / NL | Application number, filing date | 91202569.9 | 02.10.1991 | [1992/16] | Priority number, date | NL19900002211 | 11.10.1990 Original published format: NL 9002211 | [1992/16] | Filing language | NL | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0480512 | Date: | 15.04.1992 | Language: | EN | [1992/16] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 29.11.1991 | Classification | IPC: | G01B11/00, G01D5/26 | [1992/16] | CPC: |
G01B11/00 (EP);
G01D5/26 (EP)
| Designated contracting states | DE, FR, GB [1992/16] | Title | German: | Stellenempfindliches Strahlungsdetektorsystem und optische Abtastvorrichtung mit einem derartigen System | [1992/16] | English: | Position-sensitive radiation detection system and optical scanning device provided with such a system | [1992/16] | French: | Système de détection de rayonnement sensible à la position et dispositif de balayage optique muni de ce système | [1992/16] | File destroyed: | 12.06.1999 | Examination procedure | 24.09.1992 | Examination requested [1992/47] | 10.02.1993 | Application withdrawn by applicant [1993/14] |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US3463931 ; | [A]DE3432308 ; | [A]DE3317057 ; | [A]DE2923386 ; | [A]DE3441498 ; | [A]DE3247659 ; | [A]US4157477 ; | [Y]JPS58113808 ; | [AD]JPS59226318 ; | [AD]JPS62246010 ; | [A]JPS61207951 | [Y] - PATENT ABSTRACTS OF JAPAN, Vol. 7, No. 220 (P-226)[1365] 30 September 1983; & JP-A-58 113 808 (KOMATSU) 6 July 1983Abstract. | [Y] - Review of Scientific Instruments, Vol. 60, No. 3, March 1989, American Institute of Phys. New York, US, pages 327-331; BURNS: "Method for fabricating a simple low-cost position-sensitive photodetector"the whole document. | [AD] - PATENT ABSTRACTS OF JAPAN, Vol. 9, No. 101 (P-353) 2 May 1985; & JP-A-59 226 318 (FUJITSU) 19 December 1984Abstract. | [AD] - PATENT ABSTRACTS OF JAPAN, Vol. 12, No. 199 (P-689) 14 April 1988; & JP-A-62 246 010 (FUJI) 27 October 1987Abstract. | [A] - PATENT ABSTRACTS OF JAPAN, Vol. 11, No. 37 (P-543)[2484] 4 February 1987; & JP-A-61 207 951 (NEC) 16 September 1986Abstract. | [A] - Measurements, Vol. 6, No. 1, 1 March 1988, London, GB, pages 5-9; B. SCHMIDT et al.: "Hybrid integrated sensor for position measurement"the whole document. |