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Extract from the Register of European Patents

EP About this file: EP0480512

EP0480512 - Position-sensitive radiation detection system and optical scanning device provided with such a system [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  16.02.1993
Database last updated on 03.09.2024
Most recent event   Tooltip16.02.1993Withdrawal of applicationpublished on 07.04.1993 [1993/14]
Applicant(s)For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
[N/P]
Former [1992/16]For all designated states
Philips Electronics N.V.
Groenewoudseweg 1
NL-5621 BA Eindhoven / NL
Inventor(s)01 / Van Amstel, Willem Dirk
c/o INT. OCTROOIBUREAU B.V., Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
02 / Van de Goor, Petrus Fredericus Antonius
c/o INT. OCTROOIBUREAU B.V., Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
[1992/16]
Representative(s)Cobben, Louis Marie Hubert, et al
Philips Intellectual Property & Standards P.O. Box 220
5600 AE Eindhoven / NL
[N/P]
Former [1992/16]Cobben, Louis Marie Hubert, et al
INTERNATIONAAL OCTROOIBUREAU B.V., Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
Application number, filing date91202569.902.10.1991
[1992/16]
Priority number, dateNL1990000221111.10.1990         Original published format: NL 9002211
[1992/16]
Filing languageNL
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0480512
Date:15.04.1992
Language:EN
[1992/16]
Search report(s)(Supplementary) European search report - dispatched on:EP29.11.1991
ClassificationIPC:G01B11/00, G01D5/26
[1992/16]
CPC:
G01B11/00 (EP); G01D5/26 (EP)
Designated contracting statesDE,   FR,   GB [1992/16]
TitleGerman:Stellenempfindliches Strahlungsdetektorsystem und optische Abtastvorrichtung mit einem derartigen System[1992/16]
English:Position-sensitive radiation detection system and optical scanning device provided with such a system[1992/16]
French:Système de détection de rayonnement sensible à la position et dispositif de balayage optique muni de ce système[1992/16]
File destroyed:12.06.1999
Examination procedure24.09.1992Examination requested  [1992/47]
10.02.1993Application withdrawn by applicant  [1993/14]
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Documents cited:Search[Y]US3463931  ;
 [A]DE3432308  ;
 [A]DE3317057  ;
 [A]DE2923386  ;
 [A]DE3441498  ;
 [A]DE3247659  ;
 [A]US4157477  ;
 [Y]JPS58113808  ;
 [AD]JPS59226318  ;
 [AD]JPS62246010  ;
 [A]JPS61207951
 [Y]  - PATENT ABSTRACTS OF JAPAN, Vol. 7, No. 220 (P-226)[1365] 30 September 1983; & JP-A-58 113 808 (KOMATSU) 6 July 1983Abstract.
 [Y]  - Review of Scientific Instruments, Vol. 60, No. 3, March 1989, American Institute of Phys. New York, US, pages 327-331; BURNS: "Method for fabricating a simple low-cost position-sensitive photodetector"the whole document.
 [AD]  - PATENT ABSTRACTS OF JAPAN, Vol. 9, No. 101 (P-353) 2 May 1985; & JP-A-59 226 318 (FUJITSU) 19 December 1984Abstract.
 [AD]  - PATENT ABSTRACTS OF JAPAN, Vol. 12, No. 199 (P-689) 14 April 1988; & JP-A-62 246 010 (FUJI) 27 October 1987Abstract.
 [A]  - PATENT ABSTRACTS OF JAPAN, Vol. 11, No. 37 (P-543)[2484] 4 February 1987; & JP-A-61 207 951 (NEC) 16 September 1986Abstract.
 [A]  - Measurements, Vol. 6, No. 1, 1 March 1988, London, GB, pages 5-9; B. SCHMIDT et al.: "Hybrid integrated sensor for position measurement"the whole document.
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.