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EP0475588
European procedure
Extract from the Register of European Patents
EP About this file: EP0475588
| EP0475588 - A semiconductor memory with inhibited test mode entry during power-up [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 02.05.1997 Database last updated on 10.07.2024 | Most recent event Tooltip | 02.05.1997 | No opposition filed within time limit | published on 18.06.1997 [1997/25] | Applicant(s) | For all designated states STMicroelectronics, Inc. 1310 Electronics Drive Carrollton, TX 75006-5039 / US | [N/P] |
| Former [1992/12] | For all designated states SGS-THOMSON MICROELECTRONICS, INC. 1310 Electronics Drive Carrollton Texas 75006 / US | Inventor(s) | 01 /
McClure, David Charles 1120 McArthur Drive, No. 202 Carrollton, Texas 75007 / US | 02 /
Coker, Thomas Allyn 1926 Dennis Street Irving, Texas 75062 / US | [1992/12] | Representative(s) | Palmer, Roger, et al PAGE, WHITE & FARRER 54 Doughty Street London WC1N 2LS / GB | [1992/12] | Application number, filing date | 91307419.1 | 12.08.1991 | [1992/12] | Priority number, date | US19900570148 | 17.08.1990 Original published format: US 570148 | [1992/12] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0475588 | Date: | 18.03.1992 | Language: | EN | [1992/12] | Type: | B1 Patent specification | No.: | EP0475588 | Date: | 26.06.1996 | Language: | EN | [1996/26] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 13.01.1992 | Classification | IPC: | G11C29/00 | [1992/12] | CPC: |
G11C29/46 (EP,US);
G11C29/00 (KR)
| Designated contracting states | DE, FR, GB, IT [1992/12] | Title | German: | Halbleiter-Speicher mit unterdrücktem Testmodus-Eingang während des Strom-Einschaltens | [1992/12] | English: | A semiconductor memory with inhibited test mode entry during power-up | [1992/12] | French: | Mémoire à semi-conducteur avec entrée de mode test empêchée pendant couple de démarrage | [1996/26] |
| Former [1992/12] | Mémoire à semi-conducteur avec entrée de mode test pendant couple de démarrage | Examination procedure | 04.09.1992 | Examination requested [1992/45] | 24.08.1995 | Despatch of communication of intention to grant (Approval: Yes) | 29.12.1995 | Communication of intention to grant the patent | 23.03.1996 | Fee for grant paid | 23.03.1996 | Fee for publishing/printing paid | Opposition(s) | 27.03.1997 | No opposition filed within time limit [1997/25] | Fees paid | Renewal fee | 09.08.1993 | Renewal fee patent year 03 | 04.08.1994 | Renewal fee patent year 04 | 11.08.1995 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]WO8600736 (AMERICAN TELEPHONE & TELEGRAPH [US]); | [A]GB2137785 (OKI ELECTRIC IND CO LTD) | [A] - SOVIET INVENTIONS ILLUSTRATED, section El, week D 46, December 23, 1981, DERWENT PUBLICATIONS LTD., London, U 14 |