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EP0492806
European procedure
Extract from the Register of European Patents
EP About this file: EP0492806
| EP0492806 - Identification of pin-open faults by capacitive coupling through the integrated circuit package [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 18.09.1998 Database last updated on 09.09.2024 | Most recent event Tooltip | 18.09.1998 | No opposition filed within time limit | published on 04.11.1998 [1998/45] | Applicant(s) | For all designated states Hewlett-Packard Company 3000 Hanover Street Palo Alto, CA 94304-1112 / US | [N/P] |
| Former [1992/27] | For all designated states Hewlett-Packard Company 3000 Hanover Street Palo Alto, California 94304 / US | Inventor(s) | 01 /
Cilingiroglu, Ugur 1501 Harvey Road, Apt. 846 College Station, TX 77840 / US | [1992/27] | Representative(s) | Colgan, Stephen James, et al CARPMAELS & RANSFORD 43 Bloomsbury Square London WC1A 2RA / GB | [N/P] |
| Former [1992/27] | Colgan, Stephen James, et al CARPMAELS & RANSFORD 43 Bloomsbury Square London WC1A 2RA / GB | Application number, filing date | 91310861.9 | 26.11.1991 | [1992/27] | Priority number, date | US19900631609 | 20.12.1990 Original published format: US 631609 | [1992/27] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0492806 | Date: | 01.07.1992 | Language: | EN | [1992/27] | Type: | A3 Search report | No.: | EP0492806 | Date: | 14.10.1992 | Language: | EN | [1992/42] | Type: | B1 Patent specification | No.: | EP0492806 | Date: | 12.11.1997 | Language: | EN | [1997/46] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 25.08.1992 | Classification | IPC: | G01R31/312, G01R31/04 | [1992/42] | CPC: |
G01R31/312 (EP,US);
G01R31/70 (EP,US)
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| Former IPC [1992/27] | G01R31/312 | Designated contracting states | DE, FR, GB [1992/27] | Title | German: | Identifizierung von nichtverbundenen Anschlussstiften durch kapazitive Kopplung durch das Gehäuse der integrierten Schaltung | [1992/27] | English: | Identification of pin-open faults by capacitive coupling through the integrated circuit package | [1992/27] | French: | Identification des broches non connectées par couplage capacitif à travers un boîtier du circuit intégré | [1992/27] | Examination procedure | 19.03.1993 | Examination requested [1993/20] | 15.12.1994 | Despatch of a communication from the examining division (Time limit: M10) | 24.08.1995 | Reply to a communication from the examining division | 15.02.1996 | Despatch of a communication from the examining division (Time limit: M06) | 19.08.1996 | Reply to a communication from the examining division | 28.01.1997 | Despatch of communication of intention to grant (Approval: No) | 28.04.1997 | Despatch of communication of intention to grant (Approval: later approval) | 05.05.1997 | Communication of intention to grant the patent | 28.05.1997 | Fee for grant paid | 28.05.1997 | Fee for publishing/printing paid | Opposition(s) | 13.08.1998 | No opposition filed within time limit [1998/45] | Fees paid | Renewal fee | 15.10.1993 | Renewal fee patent year 03 | 31.10.1994 | Renewal fee patent year 04 | 30.10.1995 | Renewal fee patent year 05 | 28.10.1996 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4695788 (MARSHALL NEIL A [US]); | [A]GB2179751 (BICC PLC); | [A]EP0317440 (THOMSON CSF [FR]) | Examination | FR2101335 | by applicant | EP0317440 |