Extract from the Register of European Patents

EP About this file: EP0483002

EP0483002 - Slurry sampling device [Right-click to bookmark this link]
Former [1992/18]Slurry sampling device and method
[1996/08]
StatusNo opposition filed within time limit
Status updated on  03.01.1997
Database last updated on 28.03.2026
Most recent event   Tooltip03.01.1997No opposition filed within time limitpublished on 19.02.1997 [1997/08]
Applicant(s)For all designated states
MITSUBISHI JUKOGYO KABUSHIKI KAISHA
5-1, Marunouchi 2-chome Chiyoda-ku
Tokyo / JP
[N/P]
Former [1992/18]For all designated states
MITSUBISHI JUKOGYO KABUSHIKI KAISHA
5-1, Marunouchi 2-chome Chiyoda-ku
Tokyo / JP
Inventor(s)01 / Tatani, Atsushi, c/o Hiroshima Technical Institute
6-22 Kanonshin-machi 4-chome, Nishi-ku
Hiroshima, Hiroshima Pref. / JP
02 / Ukawa, Naohiko, c/o Hiroshima Technical Institute
6-22 Kanonshin-machi 4-chome, Nishi-ku
Hiroshima, Hiroshima Pref. / JP
03 / Okino, Susumu, c/o Hiroshima Technical Institute
6-22 Kanonshin-machi 4-chome, Nishi-ku
Hiroshima, Hiroshima Pref. / JP
04 / Takashina, Tooru, c/o Hiroshima Technical Inst.
6-22 Kanonshin-machi 4-chome, Nishi-ku
Hiroshima, Hiroshima Pref. / JP
05 / Nakamura, Tsumoru, c/o Hiroshima Technical Inst.
6-22 Kanonshin-machi 4-chome, Nishi-ku
Hiroshima, Hiroshima Pref. / JP
06 / Arai, Tokuma, c/o Mitsubishi Jukogyo K.K.
5-1, Marunouchi 2-chome
Chiyoda-ku, Tokyo / JP
07 / Shiraishi, Yoshihiro
38-9, Nakasu 1-chome, Asaminami-ku
Hiroshima, Hiroshima Pref. / JP
[1992/18]
Representative(s)Keib, Gérard, et al
Novagraaf Technologies SA 122, rue Edouard Vaillant
92593 Levallois Perret Cedex / FR
[N/P]
Former [1996/24]Keib, Gérard, et al
Cabinet Claude Rodhain SA 3, rue Moncey
75009 Paris / FR
Former [1992/18]Rodhain, Claude, et al
Cabinet Claude Rodhain S.A. 3, rue Moncey
F-75009 Paris / FR
Application number, filing date91402827.923.10.1991
[1992/18]
Priority number, dateJP1990011048124.10.1990         Original published format: JP 11048190
[1992/18]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0483002
Date:29.04.1992
Language:EN
[1992/18]
Type: A3 Search report 
No.:EP0483002
Date:23.09.1992
Language:EN
[1992/39]
Type: B1 Patent specification 
No.:EP0483002
Date:21.02.1996
[1996/08]
Search report(s)(Supplementary) European search report - dispatched on:EP31.07.1992
ClassificationIPC:G01N1/00, G01N1/20
[1992/39]
CPC:
G01N35/1097 (EP,US); G01N1/2035 (EP,US)
Former IPC [1992/18]G01N1/20
Designated contracting statesDE,   DK,   FR,   GB,   IT,   SE [1992/18]
TitleGerman:Vorrichtung zur Entnahme von Suspensionsproben[1996/08]
English:Slurry sampling device[1996/08]
French:Dispositif de prélèvement d'échantillons dans une suspension[1996/08]
Former [1992/18]Verfahren und Vorrichtung zur Entnahme von Suspensionsproben
Former [1992/18]Slurry sampling device and method
Former [1992/18]Dispositif et méthode de prélèvement d'échantillons dans une suspension
Examination procedure15.01.1993Examination requested  [1993/11]
13.05.1994Despatch of a communication from the examining division (Time limit: M06)
22.12.1994Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
23.01.1995Reply to a communication from the examining division
16.06.1995Despatch of communication of intention to grant (Approval: Yes)
22.08.1995Communication of intention to grant the patent
12.10.1995Fee for grant paid
12.10.1995Fee for publishing/printing paid
Opposition(s)22.11.1996No opposition filed within time limit [1997/08]
Request for further processing for:23.01.1995Request for further processing filed
27.01.1995Full payment received (date of receipt of payment)
Request granted
17.02.1995Decision despatched
Fees paidRenewal fee
26.10.1993Renewal fee patent year 03
26.10.1994Renewal fee patent year 04
27.10.1995Renewal fee patent year 05
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