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Extract from the Register of European Patents

EP About this file: EP0505877

EP0505877 - Impurity doping method with adsorbed diffusion source [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  12.05.1995
Database last updated on 02.07.2024
Most recent event   Tooltip12.05.1995Application deemed to be withdrawnpublished on 05.07.1995 [1995/27]
Applicant(s)For all designated states
Seiko Instruments Inc.
31-1, Kameido 6-chome Koto-ku
Tokyo 136 / JP
[N/P]
Former [1992/40]For all designated states
SEIKO INSTRUMENTS INC.
31-1, Kameido 6-chome Koto-ku
Tokyo 136 / JP
Inventor(s)01 / Akamine, Tadao, c/o Seiko Instruments Inc.
31-1, Kameido 6-chome
Koto-ku, Tokyo / JP
02 / Saito, Naoto, c/o Seiko Instruments Inc.
31-1, Kameido 6-chome
Koto-ku, Tokyo / JP
03 / Aoko, Kenji, c/o Seiko Instruments Inc.
31-1, Kameido 6-chome
Koto-ku, Tokyo / JP
[1992/40]
Representative(s)Fleuchaus, Leo, et al
Fleuchaus & Gallo Melchiorstrasse 42
81479 München / DE
[N/P]
Former [1992/40]Fleuchaus, Leo, Dipl.-Ing., et al
Melchiorstrasse 42
D-81479 München / DE
Application number, filing date92104495.415.03.1992
[1992/40]
Priority number, dateJP1991006332327.03.1991         Original published format: JP 6332391
JP1991011354417.05.1991         Original published format: JP 11354491
[1992/40]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0505877
Date:30.09.1992
Language:EN
[1992/40]
Type: A3 Search report 
No.:EP0505877
Date:30.03.1994
Language:EN
[1994/13]
Search report(s)(Supplementary) European search report - dispatched on:EP07.02.1994
ClassificationIPC:H01L21/225, C30B31/02
[1992/40]
CPC:
H01L21/2254 (EP,US); H01L21/2225 (EP,US)
Designated contracting statesDE,   FR,   GB [1992/40]
TitleGerman:Dotierungsverfahren mittels einer adsorbierten Diffusionsquelle[1992/40]
English:Impurity doping method with adsorbed diffusion source[1992/40]
French:Méthode de dopage à l'aide d'une source de diffusion adsorbée[1992/40]
File destroyed:31.08.2001
Examination procedure01.10.1994Application deemed to be withdrawn, date of legal effect  [1995/27]
25.01.1995Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [1995/27]
Fees paidRenewal fee
28.03.1994Renewal fee patent year 03
Penalty fee
Penalty fee Rule 85b EPC 1973
11.11.1994M01   Not yet paid
Additional fee for renewal fee
31.03.199504   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:SearchEP0417457  [ ] (SEIKO INSTR INC [JP]);
 EP0413982  [ ] (NISHIZAWA JUNICHI [JP], et al);
 EP0454055  [ ] (TOSHIBA KK [JP], et al)
 [AD]  - APPLIED PHYSICS LETTERS. vol. 56, no. 14, 2 April 1990NEW YORK US pages 1334 - 1335 J.NISHIZAWA ET AL. 'Ultrashallow,high doping of boron using molecular layer doping'
 [A]  - JOURNAL OF THE ELECTROCHEMICAL SOCIETY vol. 138, no. 1, January 1991, MANCHESTERNEW HAMPSHIRE US pages 233 - 238 J.R.FLEMISH ET AL. 'Phosphorus doping of silicon using a solid planar diffusion source at reduced pressures'
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.