EP0508707 - System for testing on-wafer devices [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 05.07.1995 Database last updated on 17.05.2024 | Most recent event Tooltip | 05.07.1995 | Application deemed to be withdrawn | published on 23.08.1995 [1995/34] | Applicant(s) | For all designated states Texas Instruments Incorporated 13500 North Central Expressway Dallas, Texas 75265 / US | [N/P] |
Former [1992/42] | For all designated states TEXAS INSTRUMENTS INCORPORATED 13500 North Central Expressway Dallas Texas 75265 / US | Inventor(s) | 01 /
Wright, Fred J. 125 Wagonwheel Wylie, Texas 75098 / US | [1992/42] | Representative(s) | Blanco White, Henry Nicholas, et al ABEL & IMRAY 20 Red Lion Street London WC1R 4PQ / GB | [N/P] |
Former [1992/42] | Blanco White, Henry Nicholas, et al ABEL & IMRAY Northumberland House 303-306 High Holborn London WC1V 7LH / GB | Application number, filing date | 92303026.6 | 06.04.1992 | [1992/42] | Priority number, date | US19910685308 | 12.04.1991 Original published format: US 685308 | [1992/42] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0508707 | Date: | 14.10.1992 | Language: | EN | [1992/42] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 15.07.1992 | Classification | IPC: | G01R31/28, G01R1/073 | [1992/42] | CPC: |
G01R1/0735 (EP)
| Designated contracting states | DE, FR, GB, IT, NL [1992/42] | Title | German: | Anordnung zum Testen von Schaltungen auf dem Wafer | [1992/42] | English: | System for testing on-wafer devices | [1992/42] | French: | Système d'essai de circuit sur le wafer | [1992/42] | File destroyed: | 03.03.2001 | Examination procedure | 02.11.1992 | Examination requested [1993/01] | 17.08.1994 | Despatch of a communication from the examining division (Time limit: M06) | 28.02.1995 | Application deemed to be withdrawn, date of legal effect [1995/34] | 30.03.1995 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [1995/34] | Fees paid | Renewal fee | 26.04.1994 | Renewal fee patent year 03 | 04.04.1995 | Renewal fee patent year 04 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]JP2237047 ; | [X]WO8911659 ; | [XP]US5012187 ; | [Y]US4968931 ; | [Y]US4985988 ; | [A]GB1104090 ; | [A]EP0230348 ; | [A]US4922192 ; | [A]US4972143 ; | [A]US4639664 ; | [A]DE3637502 | [A] - PATENT ABSTRACTS OF JAPAN vol. 14, no. 550 (E-1009)6 December 1990 & JP-A-2 237 047 ( MITSUBISHI ELECTRIC ) 19 September 1990 & US-A-5 055 780, & JP2237047 A 19900919 |