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Extract from the Register of European Patents

EP About this file: EP0508707

EP0508707 - System for testing on-wafer devices [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  05.07.1995
Database last updated on 17.05.2024
Most recent event   Tooltip05.07.1995Application deemed to be withdrawnpublished on 23.08.1995 [1995/34]
Applicant(s)For all designated states
Texas Instruments Incorporated
13500 North Central Expressway
Dallas, Texas 75265 / US
[N/P]
Former [1992/42]For all designated states
TEXAS INSTRUMENTS INCORPORATED
13500 North Central Expressway
Dallas Texas 75265 / US
Inventor(s)01 / Wright, Fred J.
125 Wagonwheel
Wylie, Texas 75098 / US
[1992/42]
Representative(s)Blanco White, Henry Nicholas, et al
ABEL & IMRAY
20 Red Lion Street
London WC1R 4PQ / GB
[N/P]
Former [1992/42]Blanco White, Henry Nicholas, et al
ABEL & IMRAY Northumberland House 303-306 High Holborn
London WC1V 7LH / GB
Application number, filing date92303026.606.04.1992
[1992/42]
Priority number, dateUS1991068530812.04.1991         Original published format: US 685308
[1992/42]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0508707
Date:14.10.1992
Language:EN
[1992/42]
Search report(s)(Supplementary) European search report - dispatched on:EP15.07.1992
ClassificationIPC:G01R31/28, G01R1/073
[1992/42]
CPC:
G01R1/0735 (EP)
Designated contracting statesDE,   FR,   GB,   IT,   NL [1992/42]
TitleGerman:Anordnung zum Testen von Schaltungen auf dem Wafer[1992/42]
English:System for testing on-wafer devices[1992/42]
French:Système d'essai de circuit sur le wafer[1992/42]
File destroyed:03.03.2001
Examination procedure02.11.1992Examination requested  [1993/01]
17.08.1994Despatch of a communication from the examining division (Time limit: M06)
28.02.1995Application deemed to be withdrawn, date of legal effect  [1995/34]
30.03.1995Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [1995/34]
Fees paidRenewal fee
26.04.1994Renewal fee patent year 03
04.04.1995Renewal fee patent year 04
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Documents cited:Search[A]JP2237047  ;
 [X]WO8911659  ;
 [XP]US5012187  ;
 [Y]US4968931  ;
 [Y]US4985988  ;
 [A]GB1104090  ;
 [A]EP0230348  ;
 [A]US4922192  ;
 [A]US4972143  ;
 [A]US4639664  ;
 [A]DE3637502
 [A]  - PATENT ABSTRACTS OF JAPAN vol. 14, no. 550 (E-1009)6 December 1990 & JP-A-2 237 047 ( MITSUBISHI ELECTRIC ) 19 September 1990 & US-A-5 055 780, & JP2237047 A 19900919
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.