blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0515181

EP0515181 - Method for preparing semiconductor member [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  15.06.2001
Database last updated on 11.09.2024
Most recent event   Tooltip26.12.2003Lapse of the patent in a contracting state
New state(s): GR
published on 11.02.2004  [2004/07]
Applicant(s)For all designated states
CANON KABUSHIKI KAISHA
30-2, 3-chome, Shimomaruko, Ohta-ku
Tokyo / JP
[N/P]
Former [1992/48]For all designated states
CANON KABUSHIKI KAISHA
30-2, 3-chome, Shimomaruko, Ohta-ku
Tokyo / JP
Inventor(s)01 / Sakaguchi, Kiyofumi, c/o Canon Kabushiki Kaisha
30-2, 3-chome, Shimomaruko
Ohta-ku, Tokyo / JP
02 / Yonehara, Takao, c/o Canon Kabushiki Kaisha
30-2, 3-chome, Shimomaruko
Ohta-ku, Tokyo / JP
[1992/48]
Representative(s)Beresford, Keith Denis Lewis, et al
Beresford Crump LLP
16 High Holborn
London WC1V 6BX / GB
[N/P]
Former [1992/48]Beresford, Keith Denis Lewis, et al
BERESFORD & Co. 2-5 Warwick Court High Holborn
London WC1R 5DJ / GB
Application number, filing date92304605.621.05.1992
[1992/48]
Priority number, dateJP1991014528622.05.1991         Original published format: JP 14528691
JP1991014816224.05.1991         Original published format: JP 14816291
JP1991014930327.05.1991         Original published format: JP 14930391
JP1991014930427.05.1991         Original published format: JP 14930491
JP1991014930527.05.1991         Original published format: JP 14930591
JP1991015098628.05.1991         Original published format: JP 15098691
JP1991015098728.05.1991         Original published format: JP 15098791
JP1991015098828.05.1991         Original published format: JP 15098891
JP1991015225229.05.1991         Original published format: JP 15225291
[1992/48]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0515181
Date:25.11.1992
Language:EN
[1992/48]
Type: A3 Search report 
No.:EP0515181
Date:02.06.1993
Language:EN
[1993/22]
Type: B1 Patent specification 
No.:EP0515181
Date:16.08.2000
Language:EN
[2000/33]
Search report(s)(Supplementary) European search report - dispatched on:EP15.04.1993
ClassificationIPC:H01L21/20, H01L21/76
[1992/48]
CPC:
H01L21/76256 (EP,US); H01L21/0203 (EP,US); H01L21/02381 (EP,US);
H01L21/02422 (EP,US); H01L21/0245 (EP,US); H01L21/02532 (EP,US);
H01L21/0262 (EP,US); H01L21/02631 (EP,US); H01L21/2007 (EP,US);
H01L21/76245 (EP,US); H01L21/76251 (EP,US); Y10S438/96 (EP,US);
Y10S438/977 (EP,US) (-)
Designated contracting statesAT,   BE,   CH,   DE,   DK,   ES,   FR,   GB,   GR,   IT,   LI,   LU,   NL,   PT,   SE [1992/48]
TitleGerman:Verfahren zur Herstellung eines Halbleiterkörpers[1992/48]
English:Method for preparing semiconductor member[1992/48]
French:Procédé pour fabriquer un corps semi-conducteur[1992/48]
Examination procedure18.10.1993Examination requested  [1993/50]
17.11.1993Despatch of a communication from the examining division (Time limit: M06)
27.05.1994Reply to a communication from the examining division
29.06.1994Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
02.08.1995Despatch of a communication from the examining division (Time limit: M04)
12.12.1995Reply to a communication from the examining division
13.02.1998Despatch of a communication from the examining division (Time limit: M06)
01.07.1998Reply to a communication from the examining division
29.06.1999Despatch of communication of intention to grant (Approval: No)
19.08.1999Despatch of communication of intention to grant (Approval: later approval)
30.12.1999Communication of intention to grant the patent
06.03.2000Fee for grant paid
06.03.2000Fee for publishing/printing paid
Opposition(s)17.05.2001No opposition filed within time limit [2001/31]
Request for further processing for:07.09.1994Request for further processing filed
07.09.1994Full payment received (date of receipt of payment)
Request granted
06.10.1994Decision despatched
Fees paidRenewal fee
20.05.1994Renewal fee patent year 03
02.05.1995Renewal fee patent year 04
22.05.1996Renewal fee patent year 05
21.05.1997Renewal fee patent year 06
20.05.1998Renewal fee patent year 07
19.05.1999Renewal fee patent year 08
22.05.2000Renewal fee patent year 09
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipGR16.08.2000
DK16.11.2000
[2004/07]
Former [2003/45]DK16.11.2000
Documents cited:Search[XP]EP0469630  (CANON KK [JP]);
 [E]EP0499488  (CANON KK [JP])
 [A]  - JAPANESE JOURNAL OF APPLIED PHYSICS. PART II vol. 23, no. 10, 1984, TOKYO JP pages L815 - L817 T. HAMAGUCHI ET AL. 'DEVICE LAYER TRANSFER TECHNIQUE USING CHEMI-MECHANICAL POLISHING'
 [A]  - MATERIALS LETTERS vol. 7, no. 3, September 1988, AMSTERDAM NL pages 94 - 98 L. VESCAN ET AL. 'LOW-PRESSURE VAPOR-EPITAXY OF SILICON ON POROUS SILICON.'
 [A]  - APPLIED PHYSICS LETTERS. vol. 57, no. 10, 3 September 1990, NEW YORK US pages 1046 - 1048 L.T. CANHAM 'SILICON QUANTUM WIRE ARRAY FABRICATION BY ELECTROCHEMICAL AND CHEMICAL DISSOLUTION OF WAFERS'
 [A]  - JOURNAL OF THE ELECTROCHEMICAL SOCIETY vol. 135, no. 8, August 1988, MANCHESTER, NEW HAMPSHIRE US pages 2105 - 2107 X.-Z TU 'FABRICATION OF SILICON MICROSTRUCTURES BASED ON SELECTIVE FORMATION AND ETCHING OF POROUS SILICON.'
Examination   - Jap. Journal of Applied Physics, vol. 28, no. 8, 1989, pages 1426 - 1443; Patent Abstracts of Japan vol. 4, no. 44, (E-005), 05-04-1980 8 6 JP-a-55016464)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.