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Extract from the Register of European Patents

EP About this file: EP0577906

EP0577906 - Structure preventing a parasitic diode from being switched on in an epitaxial tub of integrated circuits [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.07.1999
Database last updated on 13.09.2024
Most recent event   Tooltip19.09.2003Lapse of the patent in a contracting state
New state(s): DK
published on 05.11.2003  [2003/45]
Applicant(s)For all designated states
STMicroelectronics Srl
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
[N/P]
Former [1998/34]For all designated states
STMicroelectronics S.r.l.
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
Former [1994/02]For all designated states
SGS-THOMSON MICROELECTRONICS S.r.l.
Via C. Olivetti, 2
I-20041 Agrate Brianza (Milano) / IT
Inventor(s)01 / Demicheli, Marco
Via Dante, 18
I-22070 Binago / IT
02 / Gola, Alberto
Via Eseguiti, 22 Bis
I-27043 Broni / IT
[1994/02]
Representative(s)Prato, Roberto, et al
Studio Torta S.p.A.
Via Viotti, 9
10121 Torino / IT
[N/P]
Former [1994/02]Prato, Roberto, et al
STUDIO TORTA Società Semplice Via Viotti 9
I-10121 Torino / IT
Application number, filing date92830338.730.06.1992
[1994/02]
Filing languageIT
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0577906
Date:12.01.1994
Language:EN
[1994/02]
Type: B1 Patent specification 
No.:EP0577906
Date:23.09.1998
Language:EN
[1998/39]
Search report(s)(Supplementary) European search report - dispatched on:EP09.03.1993
ClassificationIPC:H01L27/02
[1994/02]
CPC:
H01L27/0248 (EP,US)
Designated contracting statesAT,   BE,   CH,   DE,   DK,   ES,   FR,   GB,   GR,   IT,   LI,   LU,   MC,   NL,   PT,   SE [1994/02]
TitleGerman:Struktur zur Vermeidung des Durchschaltens einer parasitären Diode, die sich in einer epitaktischen Wanne von integrierten Schaltungen befindet[1994/02]
English:Structure preventing a parasitic diode from being switched on in an epitaxial tub of integrated circuits[1994/02]
French:Structure évitant la mise à l'état "passant" d'une diode parasite dans une région épitaxiale de circuits intégrés[1994/02]
Examination procedure29.07.1993Examination requested  [1994/02]
28.11.1995Despatch of a communication from the examining division (Time limit: M06)
30.05.1996Reply to a communication from the examining division
10.09.1997Despatch of communication of intention to grant (Approval: Yes)
04.12.1997Communication of intention to grant the patent
03.03.1998Fee for grant paid
03.03.1998Fee for publishing/printing paid
Opposition(s)24.06.1999No opposition filed within time limit [1999/37]
Fees paidRenewal fee
23.06.1994Renewal fee patent year 03
30.06.1995Renewal fee patent year 04
21.06.1996Renewal fee patent year 05
17.06.1997Renewal fee patent year 06
20.06.1998Renewal fee patent year 07
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT23.09.1998
BE23.09.1998
CH23.09.1998
ES23.09.1998
GR23.09.1998
LI23.09.1998
NL23.09.1998
DK23.12.1998
PT23.12.1998
SE23.12.1998
[2003/45]
Former [2003/07]AT23.09.1998
BE23.09.1998
CH23.09.1998
ES23.09.1998
GR23.09.1998
LI23.09.1998
NL23.09.1998
PT23.12.1998
SE23.12.1998
Former [2002/25]AT23.09.1998
BE23.09.1998
CH23.09.1998
ES23.09.1998
GR23.09.1998
LI23.09.1998
PT23.12.1998
SE23.12.1998
Former [2001/23]AT23.09.1998
BE23.09.1998
CH23.09.1998
GR23.09.1998
LI23.09.1998
PT23.12.1998
SE23.12.1998
Former [1999/34]AT23.09.1998
BE23.09.1998
CH23.09.1998
LI23.09.1998
PT23.12.1998
SE23.12.1998
Former [1999/32]BE23.09.1998
CH23.09.1998
LI23.09.1998
PT23.12.1998
SE23.12.1998
Former [1999/29]BE23.09.1998
CH23.09.1998
LI23.09.1998
PT23.12.1998
Former [1999/27]BE23.09.1998
CH23.09.1998
LI23.09.1998
Former [1999/22]CH23.09.1998
LI23.09.1998
Documents cited:Search[A]US3829709  (MAIGRET R, et al);
 [A]EP0284979  (SGS THOMSON MICROELECTRONICS [IT]);
 [A]US5051612  (AGIMAN DAN [US])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.