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Extract from the Register of European Patents

EP About this file: EP0561236

EP0561236 - An aqueous ammonia composition for the cleaning of semi-conductor substrates [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.11.2001
Database last updated on 15.07.2024
Most recent event   Tooltip30.11.2001No opposition filed within time limitpublished on 16.01.2002  [2002/03]
Applicant(s)For all designated states
NISSAN CHEMICAL INDUSTRIES LTD.
7-1, Kanda-Nishiki-cho 3-chome Chiyoda-ku
Tokyo / JP
For all designated states
Kanto Kagaku Kabushiki Kaisha
2-8, Nihonbashihoncho 3-chome Chuo-ku
Tokyo 103 / JP
[N/P]
Former [1993/38]For all designated states
NISSAN CHEMICAL INDUSTRIES LTD.
7-1, Kanda-Nishiki-cho 3-chome Chiyoda-ku
Tokyo / JP
For all designated states
KANTO KAGAKU KABUSHIKI KAISHA
2-8, Nihonbashihoncho 3-chome
Chuo-ku Tokyo 103 / JP
Inventor(s)01 / Morikawa, Fumihiro, c/o Nissan Chem. Ind., Ltd.
Toyama-Kojo, 635, Sasakura
Fuchumachi, Nei-gun, Toyama-ken / JP
02 / Yoshikawa, Akihisa, c/o Nissan Chem. Ind., Ltd.
Toyama-Kojo, 635, Sasakura
Fuchumachi, Nei-gun, Toyama-ken / JP
03 / Ishikawa, Norio, c/o Kanto Kagaku K.K.
Chuo-Kenkyusho, 1-7-1, Inari
Soka-shi, Saitama-ken / JP
04 / Shihoya, Takao, c/o Kanto Kagaku K.K.
2-8, Nihonbashihoncho 3-chome
Chuo-ku, Tokyo / JP
[1993/38]
Representative(s)Vossius & Partner Patentanwälte Rechtsanwälte mbB
Siebertstrasse 3
81675 München / DE
[N/P]
Former [1995/52]VOSSIUS & PARTNER
Postfach 86 07 67
D-81634 München / DE
Former [1993/38]VOSSIUS & PARTNER
P.O. Box 86 07 67
D-81634 München / DE
Application number, filing date93103573.705.03.1993
[1993/38]
Priority number, dateJP1992009751606.03.1992         Original published format: JP 9751692
[1993/38]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0561236
Date:22.09.1993
Language:EN
[1993/38]
Type: B1 Patent specification 
No.:EP0561236
Date:24.01.2001
Language:EN
[2001/04]
Search report(s)(Supplementary) European search report - dispatched on:EP20.07.1993
ClassificationIPC:H01L21/306
[1993/38]
CPC:
H01L21/02052 (EP,US); C11D10/00 (KR)
Designated contracting statesDE,   FR,   GB,   IT,   NL [1993/38]
TitleGerman:Wässrige, Ammoniak enthaltende, Zusammensetzung für die Reinigung von Halbleitersubstraten[1993/38]
English:An aqueous ammonia composition for the cleaning of semi-conductor substrates[1993/38]
French:Composition aqueuse à base d'ammoniaque pour le nettoyage de substrats semi-conducteurs[1993/38]
Examination procedure02.03.1994Examination requested  [1994/17]
19.04.1994Despatch of a communication from the examining division (Time limit: M06)
24.10.1994Reply to a communication from the examining division
19.07.1995Despatch of a communication from the examining division (Time limit: M06)
29.01.1996Reply to a communication from the examining division
20.09.1996Despatch of a communication from the examining division (Time limit: M04)
29.01.1997Reply to a communication from the examining division
29.01.1998Despatch of a communication from the examining division (Time limit: M04)
08.06.1998Reply to a communication from the examining division
30.12.1999Despatch of communication of intention to grant (Approval: No)
19.07.2000Despatch of communication of intention to grant (Approval: later approval)
26.07.2000Communication of intention to grant the patent
17.10.2000Fee for grant paid
17.10.2000Fee for publishing/printing paid
Opposition(s)25.10.2001No opposition filed within time limit [2002/03]
Fees paidRenewal fee
30.03.1995Renewal fee patent year 03
29.03.1996Renewal fee patent year 04
27.03.1997Renewal fee patent year 05
30.03.1998Renewal fee patent year 06
30.03.1999Renewal fee patent year 07
29.03.2000Renewal fee patent year 08
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Documents cited:Search[Y]JP1014924  ;
 [Y]EP0416126  (NISSAN CHEMICAL IND LTD [JP], et al)
 [Y]  - PATENT ABSTRACTS OF JAPAN vol. 13, no. 195 (E-754)10 May 1989 & JP-A-10 14 924 ( MITSUBISHI GAS ), & JP1014924 A 19890510
 [A]  - IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING vol. 2, no. 3, August 1989, NEW YORK US pages 69 - 75 MISHIMA ET AL 'Particle-free wafer cleaning and drying technology'
 [A]  - JOURNAL OF THE ELECTROCHEMICAL SOCIETY vol. 137, no. 4, April 1990, MANCHESTER, NEW HAMPSHIRE US pages 1239 - 1243 VAN DEN MEERAKKER ET AL 'A mechanistic study of silicon etching in NH3/H2O2 cleaning solutions'
 [A]  - IBM TECHNICAL DISCLOSURE BULLETIN. vol. 26, no. 12, May 1984, NEW YORK US pages 6456 - 6457 CAZCARRA ET AL 'Improvements to surface characteristics of silicon wafers'
ExaminationJPH02285051
    - DATABASE WPI, 0, Derwent World Patents Index, vol. 00, Database accession no. 91-011695, & JPH02285051 A 00000000
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.