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Extract from the Register of European Patents

EP About this file: EP0606580

EP0606580 - Method for the formation of a silicon oxide film [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  08.11.1996
Database last updated on 03.09.2024
Most recent event   Tooltip08.11.1996No opposition filed within time limitpublished on 27.12.1996 [1996/52]
Applicant(s)For all designated states
Dow Corning Toray Silicone Company, Limited
Mitsui Bldg. No. 6, 2-3-16, Nihonbashi-Muromachi, Chuo-Ku
Tokyo 103 / JP
[1994/29]
Inventor(s)01 / Mine, Katsutoshi, c/o Dow Corning Toray Silicone
Company, Ltd., 2-2, Chigusa Kaigan
Ichihara-shi, Chiba Pref. / JP
02 / Nakamura, Takashi, c/o Dow Corning Toray Silicone
Company, Ltd., 2-2, Chigusa Kaigan
Ichihara-shi, Chiba Pref. / JP
03 / Sasaki, Motoshi, c/o Dow Corning Toray Silicone
Company, Ltd., 2-2, Chigusa Kaigan
Ichihara-shi, Chiba Pref. / JP
[1994/29]
Representative(s)Sternagel, Hans-Günther, et al
Sternagel, Fleischer, Godemeyer & Partner Patentanwälte Braunsberger Feld 29
51429 Bergisch Gladbach / DE
[N/P]
Former [1994/29]Sternagel, Hans-Günther, Dr., et al
Patentanwälte Dr. Michael Hann, Dr. H.-G. Sternagel, Dr. H. Dörries, Sander Aue 30
D-51465 Bergisch Gladbach / DE
Application number, filing date93119493.003.12.1993
[1994/29]
Priority number, dateJP1992035340511.12.1992         Original published format: JP 35340592
[1994/29]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0606580
Date:20.07.1994
Language:EN
[1994/29]
Type: B1 Patent specification 
No.:EP0606580
Date:03.01.1996
Language:EN
[1996/01]
Search report(s)(Supplementary) European search report - dispatched on:EP26.04.1994
ClassificationIPC:C04B41/50, C23C18/12, H01L21/312, H01L21/316
[1994/29]
CPC:
C04B41/87 (EP,KR,US); C03C17/25 (KR); C03C17/23 (EP,US);
C03C17/30 (KR); C04B41/009 (EP,US); C04B41/5035 (EP,KR,US);
C23C18/1212 (EP,KR,US); C23C18/122 (EP,KR,US); C23C18/1275 (EP,US);
H01L21/02134 (EP,KR,US); H01L21/02164 (EP,KR,US); H01L21/02282 (EP,US);
H01L21/02337 (EP,US); H01L21/316 (US); C03C2217/213 (EP,KR,US);
C03C2218/32 (EP,US); C04B2111/00844 (EP,US); H01L21/02126 (EP);
H01L21/02216 (EP) (-)
C-Set:
C04B41/009, C04B35/00 (US,EP);
C04B41/5035, C04B41/4519, C04B41/4554, C04B41/463 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL [1994/29]
TitleGerman:Verfahren zur Herstellung einer Siliciumdioxidschicht[1994/29]
English:Method for the formation of a silicon oxide film[1994/29]
French:Procédé pour la fabrication d'une couche d'oxyde de silicium[1994/29]
Examination procedure29.09.1994Examination requested  [1994/47]
19.05.1995Despatch of communication of intention to grant (Approval: Yes)
03.07.1995Communication of intention to grant the patent
13.09.1995Fee for grant paid
13.09.1995Fee for publishing/printing paid
Opposition(s)05.10.1996No opposition filed within time limit [1996/52]
Fees paidRenewal fee
01.09.1995Renewal fee patent year 03
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Documents cited:Search[D]JPS4731838  (...);
 [DA]US3615272  (COLLINS WARDE T, et al) [DA] 1-8 * the whole document *;
 [A]EP0386969  (DOW CORNING [US]) [A] 1-8 * page 3, line 19 - line 27; claim - *;
 [A]EP0427395  (DOW CORNING [US]) [A] 1-8 * the whole document *;
 [PA]EP0560485  (DOW CORNING [US]) [PA] 1-8 * page 4, line 25 - line 41; claim - *
 [A]  - T.E. GENTLE, "Oxidation of hydrogen silsesquioxane, (HSiO3/2)n, by rapid thermal processing.", PROCEEDINGS OF THE SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, REDONDO BEACH US, (1992), vol. 1595, pages 146 - 164 [A] 1-7 * the whole document *
 [A]  - H. ADACHI ET AL, "NEW SPIN-ON GLASS MATERIALS CONTAINING POLYPHENYLSILSESQUIOXANE.", EXTENDED ABSTRACTS, PRINCETON, NEW JERSEY US, (19861024), vol. 86-2, page 858 [A] 1-8
 [A]  - V. BELOT ET AL, "Thermal decomposition of hydrosilsesquioxane gels under argon.", EUROPEAN MATERIALS RESEARCH SOCIETY MONOGRAPHS, AMSTERDAM NL, (1992), vol. 5, pages 77 - 84 [A] 1-8
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.