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EP0580446
European procedure
Extract from the Register of European Patents
EP About this file: EP0580446
| EP0580446 - Electric field measuring apparatus [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 16.07.1999 Database last updated on 19.10.2024 | Most recent event Tooltip | 16.07.1999 | No opposition filed within time limit | published on 01.09.1999 [1999/35] | Applicant(s) | For all designated states HAMAMATSU PHOTONICS K.K. 1126-1 Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | [N/P] |
| Former [1994/04] | For all designated states HAMAMATSU PHOTONICS K.K. 1126-1 Ichino-cho Hamamatsu-shi Shizuoka-ken / JP | Inventor(s) | 01 /
Takahashi, Hironori, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | 02 /
Aoshima, Shinichiro, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | 03 /
Hirano, Isuke, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | [1994/04] | Representative(s) | Burke, Steven David, et al R.G.C. Jenkins & Co 26 Caxton Street London SW1H 0RJ / GB | [N/P] |
| Former [1994/04] | Burke, Steven David, et al R.G.C. Jenkins & Co. 26 Caxton Street London SW1H 0RJ / GB | Application number, filing date | 93305824.0 | 23.07.1993 | [1994/04] | Priority number, date | JP19920198791 | 24.07.1992 Original published format: JP 19879192 | [1994/04] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0580446 | Date: | 26.01.1994 | Language: | EN | [1994/04] | Type: | B1 Patent specification | No.: | EP0580446 | Date: | 09.09.1998 | Language: | EN | [1998/37] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 10.11.1993 | Classification | IPC: | G01R1/067, G01R31/308 | [1994/04] | CPC: |
G01R1/071 (EP,US);
G01R31/308 (EP,US)
| Designated contracting states | DE, FR, GB [1994/04] | Title | German: | Apparat zur Messung elektrischer Felder | [1994/04] | English: | Electric field measuring apparatus | [1994/04] | French: | Appareil de mesure de champs électriques | [1994/04] | Examination procedure | 02.02.1994 | Examination requested [1994/14] | 07.10.1996 | Despatch of a communication from the examining division (Time limit: M04) | 17.02.1997 | Reply to a communication from the examining division | 23.06.1997 | Despatch of communication of intention to grant (Approval: Yes) | 03.12.1997 | Despatch of communication that the application is refused, reason: formalities examination {1} | 17.02.1998 | Communication of intention to grant the patent | 25.05.1998 | Fee for grant paid | 25.05.1998 | Fee for publishing/printing paid | Opposition(s) | 10.06.1999 | No opposition filed within time limit [1999/35] | Request for further processing for: | 18.12.1997 | Request for further processing filed | 18.12.1997 | Full payment received (date of receipt of payment) Request granted | 17.02.1998 | Decision despatched | Fees paid | Renewal fee | 11.07.1995 | Renewal fee patent year 03 | 11.07.1996 | Renewal fee patent year 04 | 14.07.1997 | Renewal fee patent year 05 | 08.07.1998 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XY] - SHINAGAWA ET AL., "A LASER-DIODE-BASED PICOSECOND ELECTROOPTIC PROBER...", IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, NEW YORK US, (199206), vol. 41, no. 3, doi:doi:10.1109/19.153332, pages 375 - 380, XP000307979 [X] 1,8,9,11 * page 377, column L, paragraph 2; figures 1,2,4 * [Y] 10 DOI: http://dx.doi.org/10.1109/19.153332 | [DYA] - NAGATSUMA ET AL., "SUBPICOSECOND SAMPLING USING A NONCONTACT ELECTRO-OPTIC PROBE", JOURNAL OF APPLIED PHYSICS, NEW YORK US, (19891101), vol. 66, no. 9, doi:doi:10.1063/1.344008, pages 4001 - 4009, XP000073114 [DY] 10 * figures 12,13 * [A] 1,8,9,11 DOI: http://dx.doi.org/10.1063/1.344008 | [A] - FRANKEL ET AL., "EXPERIMENTAL CHARACTERIZATION OF EXTERNAL ELECTROOPTIC PROBES", IEEE MICROWAVE AND GUIDED WAVE LETTERS, NEW YORK US, (199103), vol. 1, no. 3, doi:doi:10.1109/75.80723, pages 60 - 62, XP000175331 [A] 1,11 * page 60, column R, paragraph 1 * * page 61, column R, paragraph 1; figure 1 * DOI: http://dx.doi.org/10.1109/75.80723 |