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Extract from the Register of European Patents

EP About this file: EP0622806

EP0622806 - Nonvolatile semiconductor memory device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  22.10.1999
Database last updated on 15.06.2024
Most recent event   Tooltip22.10.1999No opposition filed within time limitpublished on 08.12.1999 [1999/49]
Applicant(s)For all designated states
Kabushiki Kaisha Toshiba
72, Horikawa-cho, Saiwai-ku Kawasaki-shi
Kanagawa-ken 210-8572 / JP
[N/P]
Former [1998/51]For all designated states
KABUSHIKI KAISHA TOSHIBA
72, Horikawa-cho, Saiwai-ku
Kawasaki-shi, Kanagawa-ken 210 / JP
Former [1994/44]For all designated states
KABUSHIKI KAISHA TOSHIBA
72, Horikawa-cho, Saiwai-ku
Kawasaki-shi, Kanagawa-ken 210, Tokyo / JP
Inventor(s)01 / Ohtsuka, Nobuaki, Intell.Property Division
K.K. Toshiba, 1-1 Shibaura 1-chome
Minato-ku, Tokyo 105 / JP
02 / Miyamoto, Junichi, Intell.Property Division
K.K. Toshiba, 1-1 Shibaura 1-chome
Minato-ku, Tokyo 105 / JP
[1994/44]
Representative(s)Lehn, Werner, et al
Hoffmann Eitle, Patent- und Rechtsanwälte, Arabellastrasse 4
81925 München / DE
[N/P]
Former [1994/44]Lehn, Werner, Dipl.-Ing., et al
Hoffmann, Eitle & Partner, Patentanwälte, Arabellastrasse 4
D-81925 München / DE
Application number, filing date94104501.522.03.1994
[1994/44]
Priority number, dateJP1993010440630.04.1993         Original published format: JP 10440693
[1994/44]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0622806
Date:02.11.1994
Language:EN
[1994/44]
Type: A3 Search report 
No.:EP0622806
Date:18.10.1995
Language:EN
[1995/42]
Type: B1 Patent specification 
No.:EP0622806
Date:16.12.1998
Language:EN
[1998/51]
Search report(s)(Supplementary) European search report - dispatched on:EP30.08.1995
ClassificationIPC:G11C16/06, G11C8/00
[1994/44]
CPC:
G11C16/08 (EP,US); G11C16/16 (EP,US)
Designated contracting statesFR [1998/46]
Former [1994/44]DE,  FR,  GB 
TitleGerman:Nichtflüchtige Halbleiterspeicheranordnung[1998/18]
English:Nonvolatile semiconductor memory device[1994/44]
French:Dispositif de mémoire non-volatile à semi-conducteur[1994/44]
Former [1994/44]Nichtflüchtige halbleiterspeicheranordnung
Examination procedure22.03.1994Examination requested  [1994/44]
23.03.1998Despatch of communication of intention to grant (Approval: Yes)
18.06.1998Communication of intention to grant the patent
17.09.1998Fee for grant paid
17.09.1998Fee for publishing/printing paid
Opposition(s)17.09.1999No opposition filed within time limit [1999/49]
Fees paidRenewal fee
08.03.1996Renewal fee patent year 03
12.03.1997Renewal fee patent year 04
10.03.1998Renewal fee patent year 05
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Documents cited:Search[A]EP0182198  (EXEL MICROELECTRONICS INC [US]) [A] 1,3-7 * page 20, line 6 - page 23, line 9; figures 5B,5D *;
 [A]WO9205560  (TOSHIBA KK [JP]) [A] 1,2,5-7;
 EP0550751  [ ] (TOSHIBA KK [JP]) [ ] * page 7, line 23 - line 58; figure 3; table 3 * * page 9, line 42 - page 11, line 48; figures 11-13,16; table 4 * * page 16, line 5 - line 12; figure 28 *;
 [A]US5199001  (TZENG JYH-CHERNG J [US]) [A] 1,2,6 * column 2, line 40 - column 3, line 41; figure 3 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.