EP0685729 - Spectroscopic method for measuring weak absorptions [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 15.10.1999 Database last updated on 26.06.2024 | Most recent event Tooltip | 28.12.2007 | Lapse of the patent in a contracting state New state(s): IT | published on 30.01.2008 [2008/05] | Applicant(s) | For all designated states LASERSPEC ANALYTIK GmbH Frankfurter Ring 193a 80807 München / DE | [1998/31] |
Former [1995/49] | For all designated states LASERSPEC ANALYTIK GmbH Leopoldstrasse 28a D-80802 München / DE | Inventor(s) | 01 /
Zybin, Alexandre, Dr. c/o Inst. f. Spektroskopie Russ. Akademie der Wissenschaften 142092 Troitzk, Region Moskau / RU | 02 /
Niemax, Kay, Prof., Dr. c/o Universität Hohenheim Institut für Physik Garbenstrasse 30 D-70599 Stuttgart / DE | 03 /
Schnürer-Patschan, Christoph, Dr. LaserSpec Analytik GmbH Leopoldstrasse 28a D-80802 München / DE | [1995/49] | Representative(s) | Heusler, Wolfgang, et al V. Bezold & Partner Patentanwälte - PartG mbB Akademiestrasse 7 80799 München / DE | [N/P] |
Former [1995/49] | Heusler, Wolfgang, Dipl.-Ing., et al Dr. Dieter von Bezold Dipl.-Ing. Peter Schütz Dipl.-Ing. Wolfgang Heusler Brienner Strasse 52 D-80333 München / DE | Application number, filing date | 94108465.9 | 01.06.1994 | [1995/49] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP0685729 | Date: | 06.12.1995 | Language: | DE | [1995/49] | Type: | B1 Patent specification | No.: | EP0685729 | Date: | 09.12.1998 | Language: | DE | [1998/50] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 06.12.1994 | Classification | IPC: | G01N21/31, G01N21/39, G01J3/433 | [1995/49] | CPC: |
G01N30/74 (EP,US);
G01N21/39 (EP,US);
G01N2021/399 (EP,US);
G01N2030/623 (EP,US);
G01N21/3103 (EP,US)
| Designated contracting states | DE, FR, GB, IT, NL [1995/49] | Title | German: | Spektroskopisches Verfahren zur Messung kleinster spezifischer Absorptionssignale | [1995/49] | English: | Spectroscopic method for measuring weak absorptions | [1995/49] | French: | Procédé spectroscopique de mesure des absorptions très faibles | [1995/49] | Examination procedure | 23.12.1994 | Examination requested [1995/49] | 23.12.1996 | Despatch of a communication from the examining division (Time limit: M04) | 30.04.1997 | Reply to a communication from the examining division | 30.03.1998 | Despatch of communication of intention to grant (Approval: Yes) | 12.06.1998 | Communication of intention to grant the patent | 16.09.1998 | Fee for grant paid | 16.09.1998 | Fee for publishing/printing paid | Opposition(s) | 10.09.1999 | No opposition filed within time limit [1999/48] | Fees paid | Renewal fee | 25.06.1996 | Renewal fee patent year 03 | 12.12.1997 | Renewal fee patent year 04 | 22.06.1998 | Renewal fee patent year 05 | Penalty fee | Additional fee for renewal fee | 30.06.1997 | 04   M06   Fee paid on   12.12.1997 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | IT | 09.12.1998 | NL | 09.12.1998 | [2008/05] |
Former [2003/08] | NL | 09.12.1998 | Documents cited: | Search | [X]US4934816 (SILVER JOEL A [US], et al) [X] 1-4,8-10,12 * the whole document *; | [A]US5267019 (WHITTAKER EDWARD A [US], et al) [A] 1,8-10,12* column 5, line 50 - column 9, line 61; figure 1 *; | [X] - Lian-Guo Wang et al, "High-sensitivity frequency-modulation spectroscopy with a GaAlAs diode laser", JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B (OPTICAL PHYSICS), MAI 1989, USA, BAND 6, NR. 5, SEITEN 871 - 876, ISSN 0740-3224 [X] 1-4,8-10,12 * page 871, column R, paragraph 2 - page 873, column L, paragraph 1; figures 1,2 * | [X] - Maruyama K et al, "Measurement of the CF3 radical using infrared diode laser absorption spectroscopy", JOURNAL OF PHYSICS D (APPLIED PHYSICS), 14 FEB. 1993, UK, BAND. 26, NR. 2, SEITEN 199 - 202, ISSN 0022-3727 [X] 1-3,5-12 * the whole document * | [X] - CHANGKANG PAN ET AL, "Direct determination of trace elements in graphite matrices using modulated glow discharge atomic absorption spectrometry", APPLIED SPECTROSCOPY, BALTIMORE US, (199303), vol. 47, no. 3, doi:doi:10.1366/0003702934066730, pages 300 - 304, XP000349123 [X] 1-3,5-8,11,12 * the whole document * DOI: http://dx.doi.org/10.1366/0003702934066730 | [X] - MOERNER W E ET AL, "Finding a single molecule in a haystack: optical detection and spectroscopy of single absorbers in solids", ANALYTICAL CHEMISTRY, COLUMBUS US, (198911), vol. 61, no. 21, pages 1217A - 1223A, XP000134374 [X] 1,2,8-10 * page 1221A, column L, paragraph 2 - column R, paragraph 1; figure 4 * |