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EP0640829
European procedure
Extract from the Register of European Patents
EP About this file: EP0640829
| EP0640829 - Scanning probe microscope [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 23.09.2005 Database last updated on 15.06.2024 | Most recent event Tooltip | 29.08.2008 | Change - representative | published on 01.10.2008 [2008/40] | Applicant(s) | For all designated states Olympus Optical Co., Ltd. 43-2, 2-chome, Hatagaya Shibuya-ku Tokyo 151-0072 / JP | [N/P] |
| Former [2004/47] | For all designated states Olympus Optical Co., Ltd. 43-2, 2-chome, Hatagaya Shibuya-ku Tokyo 151-0072 / JP | ||
| Former [1995/09] | For all designated states OLYMPUS OPTICAL CO., LTD. 43-2, 2-chome, Hatagaya Shibuya-ku Tokyo 151 / JP | Inventor(s) | 01 /
SATO, Chiaki 1-54-3, Ichibancho Tachikawa-shi Tokyo 190 / JP | 02 /
KOSHIISHI, Kiyozo 7-32, Motohashimotocho Sagamihara-shi Kanagawa-ken 229 / JP | 03 /
SHIGETOMI, Sadao 3-1-6, Yokoyamacho Sagamihara-shi Kanagawa-ken 229 / JP | 04 /
MISHIMA, Shuzo 4-15-1-702, Minamioosawa Hachiooji-shi Tokyo 192-03 / JP | 05 /
TAKASE, Tsugiko 2-4-16, Nakanosannou Hachiooji-shi Tokyo 192 / JP | [1995/41] |
| Former [1995/09] | 01 /
SATO, Chiaki Greenhaitsu 202 3-27-9, Hikaricho Kokubunji-shi Tokyo 185 / JP | ||
| 02 /
KOSHIISHI, Kiyozo 7-32, Motohashimotocho Sagamihara-shi Kanagawa-ken 229 / JP | |||
| 03 /
SHIGETOMI, Sadao 3-1-6, Yokoyamacho Sagamihara-shi Kanagawa-ken 229 / JP | |||
| 04 /
MISHIMA, Shuzo 4-15-1-702, Minamioosawa Hachiooji-shi Tokyo 192-03 / JP | |||
| 05 /
TAKASE, Tsugiko 2-4-16, Nakanosannou Hachiooji-shi Tokyo 192 / JP | Representative(s) | Winter, Brandl - Partnerschaft mbB Alois-Steinecker-Straße 22 85354 Freising / DE | [N/P] |
| Former [2008/40] | Winter, Brandl, Fürniss, Hübner Röss, Kaiser, Polte Partnerschaft Patent- und Rechtsanwaltskanzlei Alois-Steinecker-Strasse 22 85354 Freising / DE | ||
| Former [1995/09] | KUHNEN, WACKER & PARTNER Alois-Steinecker-Strasse 22 D-85354 Freising / DE | Application number, filing date | 94116251.3 | 12.08.1988 | [1995/09] | Priority number, date | JP19870201281 | 12.08.1987 Original published format: JP 20128187 | [1995/09] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0640829 | Date: | 01.03.1995 | Language: | EN | [1995/09] | Type: | A3 Search report | No.: | EP0640829 | Date: | 04.06.1997 | [1997/23] | Type: | B1 Patent specification | No.: | EP0640829 | Date: | 17.11.2004 | Language: | EN | [2004/47] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 09.04.1997 | Classification | IPC: | G01N27/00 | [1995/09] | CPC: |
G01Q60/16 (EP,US);
A61P25/02 (EP);
A61P27/02 (EP);
C07D285/10 (EP,US);
C07D417/12 (EP,US);
G01Q30/025 (EP,US);
G02B21/002 (EP,US);
H02N2/023 (EP,US);
H02N2/028 (EP,US);
| Designated contracting states | CH, DE, FR, GB, LI [1995/09] | Title | German: | Rastertunnelmikroskop | [1995/09] | English: | Scanning probe microscope | [1995/09] | French: | Microscope à effet tunnel | [1995/09] | Examination procedure | 14.10.1994 | Examination requested [1995/09] | 24.09.1997 | Amendment by applicant (claims and/or description) | 04.03.2003 | Despatch of a communication from the examining division (Time limit: M06) | 12.09.2003 | Reply to a communication from the examining division | 28.01.2004 | Despatch of a communication from the examining division (Time limit: M04) | 17.02.2004 | Reply to a communication from the examining division | 12.03.2004 | Communication of intention to grant the patent | 21.07.2004 | Fee for grant paid | 21.07.2004 | Fee for publishing/printing paid | Parent application(s) Tooltip | EP88906897.9 / EP0406413 | Opposition(s) | 18.08.2005 | No opposition filed within time limit [2005/45] | Fees paid | Renewal fee | 14.10.1994 | Renewal fee patent year 03 | 14.10.1994 | Renewal fee patent year 04 | 14.10.1994 | Renewal fee patent year 05 | 14.10.1994 | Renewal fee patent year 06 | 14.10.1994 | Renewal fee patent year 07 | 25.08.1995 | Renewal fee patent year 08 | 28.08.1996 | Renewal fee patent year 09 | 28.08.1997 | Renewal fee patent year 10 | 28.08.1998 | Renewal fee patent year 11 | 30.08.1999 | Renewal fee patent year 12 | 29.08.2000 | Renewal fee patent year 13 | 29.08.2001 | Renewal fee patent year 14 | 02.09.2002 | Renewal fee patent year 15 | 27.08.2003 | Renewal fee patent year 16 | 26.08.2004 | Renewal fee patent year 17 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | CH | 17.11.2004 | LI | 17.11.2004 | [2005/25] | Documents cited: | Search | [A]EP0195349 (IBM [US]) [A] 1* column 4, line 16 - column 5, line 16; figure 3 *; | [AP]EP0296871 (SEIKO INSTR INC [JP]) [AP] 1 * column 5, line 23 - column 6, line 9; figures 2,3 * | Examination | - GUCKENBERGER R.; KOSSLINGER C.; BAUMEISTER W., "Design of a scanning tunnelling microscope for biological applications", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A, NEW YORK, US, (198804), vol. 6, no. 2, pages 383 - 385 |