blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0656645

EP0656645 - Field effect transistor with a sealed diffusion junction [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  26.07.2002
Database last updated on 28.06.2024
Most recent event   Tooltip28.12.2007Lapse of the patent in a contracting state
New state(s): IT
published on 30.01.2008  [2008/05]
Applicant(s)For all designated states
AT&T Corp.
32 Avenue of the Americas
New York, NY 10013-2412 / US
[1995/23]
Inventor(s)01 / Lee, Kuo-Hua
1308 Country Club Road
Wescosville, Pennsylvania 18106 / US
02 / Liu, Chun-Ting
1475 Bogie Avenue
Wescosville, Pennsylvania 18106 / US
03 / Liu, Ruichen
4 Northridge Way
Warren, New Jersey 07060 / US
[1995/23]
Representative(s)Williams, David John, et al
Page White & Farrer Limited
Bedford House
21A John Street
London WC1N 2BF / GB
[N/P]
Former [2001/19]Williams, David John, et al
Page White & Farrer, 54 Doughty Street
London WC1N 2LS / GB
Former [1995/23]Watts, Christopher Malcolm Kelway, Dr., et al
AT&T (UK) Ltd. 5, Mornington Road
Woodford Green Essex, IG8 0TU / GB
Application number, filing date94308646.223.11.1994
[1995/23]
Priority number, dateUS1993016060001.12.1993         Original published format: US 160600
[1995/23]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0656645
Date:07.06.1995
Language:EN
[1995/23]
Type: A3 Search report 
No.:EP0656645
Date:31.07.1996
[1996/31]
Type: B1 Patent specification 
No.:EP0656645
Date:19.09.2001
Language:EN
[2001/38]
Search report(s)(Supplementary) European search report - dispatched on:EP12.06.1996
ClassificationIPC:H01L21/225, H01L21/336, H01L21/8238, H01L23/532
[1995/23]
CPC:
H01L29/0847 (EP,US); H01L21/2257 (EP,US); H01L29/456 (EP,US);
H01L29/66575 (EP,US)
Designated contracting statesDE,   ES,   FR,   GB,   IT [1995/23]
TitleGerman:Feldeffekttransistor mit einem versiegelten diffundierten Übergang[2000/40]
English:Field effect transistor with a sealed diffusion junction[1995/23]
French:Transistor à effet de champ à jonction diffusée scellée[1995/23]
Former [1995/23]Feldeffekttransistor mit einem diffusionierten versiegelten Übergang
Examination procedure16.01.1997Examination requested  [1997/12]
27.10.1998Despatch of a communication from the examining division (Time limit: M04)
04.03.1999Reply to a communication from the examining division
23.11.2000Despatch of communication of intention to grant (Approval: Yes)
29.03.2001Communication of intention to grant the patent
28.06.2001Fee for grant paid
28.06.2001Fee for publishing/printing paid
Opposition(s)20.06.2002No opposition filed within time limit [2002/37]
Fees paidRenewal fee
18.11.1996Renewal fee patent year 03
07.11.1997Renewal fee patent year 04
25.11.1998Renewal fee patent year 05
16.11.1999Renewal fee patent year 06
20.09.2000Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT19.09.2001
ES26.03.2002
[2008/05]
Former [2004/04]ES26.03.2002
Documents cited:Search[A]EP0399141  (HEWLETT PACKARD CO [US]) [A] 1,8,9 * abstract *;
 [DA]EP0319215  (AMERICAN TELEPHONE & TELEGRAPH [US]) [DA] 1,8,9;
 [A]US5206187  (DOAN TRUNG T [US], et al) [A] 1 * column 5, line 42 - column 7, line 4; figures 5-8,13 *
 [A]  - NIAZMAND M ET AL, "SHALLOW JUNCTION FORMATION BY DOPANT OUTDIFFUSION FROM COSI2 AND ITS APPLICATION IN SUB 0.5UM MOS PROCESSES", MICROELECTRONIC ENGINEERING, (19930401), vol. 21, no. 1 / 04, pages 427 - 430, XP000361119 [A] 1,4-6,7 * page 428 *

DOI:   http://dx.doi.org/10.1016/0167-9317(93)90105-E
 [A]  - CHIH-YUAN LU ET AL, "A FOLDED EXTENDED WINDOW MOSFET FOR ULSI APPLICATIONS", IEEE ELECTRON DEVICE LETTERS, NEW YORK, NY, US, (198808), vol. 9, no. 8, pages 388 - 390, XP000001536 [A] 1,4-7 * page 388; figure 1 *

DOI:   http://dx.doi.org/10.1109/55.753
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.