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Extract from the Register of European Patents

EP About this file: EP0645804

EP0645804 - Metal casing for semiconductor device having high thermal conductivity and thermal expansion coefficient similar to that of semiconductor and method for manufacturing the same [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  27.02.2004
Database last updated on 11.09.2024
Most recent event   Tooltip27.02.2004No opposition filed within time limitpublished on 14.04.2004  [2004/16]
Applicant(s)For all designated states
SUMITOMO ELECTRIC INDUSTRIES, LIMITED
5-33, Kitahama 4-chome Chuo-ku
Osaka 541 / JP
[N/P]
Former [1995/13]For all designated states
SUMITOMO ELECTRIC INDUSTRIES, LIMITED
5-33, Kitahama 4-chome Chuo-ku
Osaka 541 / JP
Inventor(s)01 / Tsujioka, Masanori, c/o Itami Works of Sumitomo
Electric Industries, Ltd., 1-1, Koyakita 1-Chome
Itami-Shi, Hyogo / JP
02 / Matsumura, Junzoh, c/o Itami Works of Sumitomo
Electric Industries, Ltd., 1-1, Koyakita 1-Chome
Itami-Shi, Hyogo / JP
[1995/13]
Representative(s)Michelet, Alain, et al
Cabinet HARLE et PHELIP
14-16, rue Ballu
75009 Paris / FR
[N/P]
Former [1995/13]Michelet, Alain, et al
Cabinet Harlé et Phelip 21 rue de la Rochefoucauld
F-75009 Paris / FR
Application number, filing date94402072.616.09.1994
[1995/13]
Priority number, dateJP1993025381816.09.1993         Original published format: JP 25381893
[1995/13]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0645804
Date:29.03.1995
Language:EN
[1995/13]
Type: A3 Search report 
No.:EP0645804
Date:29.05.1996
[1996/22]
Type: B1 Patent specification 
No.:EP0645804
Date:23.04.2003
Language:EN
[2003/17]
Search report(s)(Supplementary) European search report - dispatched on:EP10.04.1996
ClassificationIPC:H01L21/48, H01L23/14
[1996/07]
CPC:
H01L31/0203 (EP,US); H01L21/4817 (EP,US); H01L23/045 (EP,US);
H01L23/047 (EP,US); H01L23/06 (EP,US); H01S5/02216 (EP,US);
H01L2924/0002 (EP,US); H01L2924/01079 (EP,US); H01L2924/09701 (EP,US);
H01S5/02469 (EP,US) (-)
C-Set:
H01L2924/0002, H01L2924/00 (EP,US)
Former IPC [1995/13]H01L21/48
Designated contracting statesDE,   FR,   GB,   IT,   NL,   SE [1995/13]
TitleGerman:Metallgehäuse für Halbleiterbauelement und Verfahren zu seiner Herstellung[1995/13]
English:Metal casing for semiconductor device having high thermal conductivity and thermal expansion coefficient similar to that of semiconductor and method for manufacturing the same[1995/13]
French:Boîtier métallique pour dispositif à semi-conducteur et procédé pour sa fabrication[1995/13]
Examination procedure26.07.1996Examination requested  [1996/40]
04.02.1998Despatch of a communication from the examining division (Time limit: M06)
03.08.1998Reply to a communication from the examining division
26.10.1999Despatch of a communication from the examining division (Time limit: M06)
28.04.2000Reply to a communication from the examining division
27.12.2001Despatch of a communication from the examining division (Time limit: M02)
26.02.2002Reply to a communication from the examining division
28.05.2002Despatch of communication of intention to grant (Approval: Yes)
31.10.2002Communication of intention to grant the patent
10.02.2003Fee for grant paid
10.02.2003Fee for publishing/printing paid
Divisional application(s)EP02023598.2  / EP1282166
Opposition(s)26.01.2004No opposition filed within time limit [2004/16]
Fees paidRenewal fee
29.08.1996Renewal fee patent year 03
17.07.1997Renewal fee patent year 04
08.08.1998Renewal fee patent year 05
10.07.1999Renewal fee patent year 06
28.08.2000Renewal fee patent year 07
02.07.2001Renewal fee patent year 08
30.09.2002Renewal fee patent year 09
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Documents cited:Search[X]US5167697  (KOUMURA TAKESHIE [JP], et al) [X] 1-6 * column 2, line 53 - line 61 * * column 5, line 11 - line 50 * * column 6, line 50 - line 60 * * column 7, line 25 - line 34 *;
 [X]EP0100232  (SUMITOMO ELECTRIC INDUSTRIES [JP]) [X] 1-6 * page 2, line 28 - page 4, line 25; tables 1,3 *;
 [D]JPS5921032  (SUMITOMO ELECTRIC INDUSTRIES);
 [AD]WO8902803  (FINE PARTICLE TECHN CORP [US]) [AD] 1,3 * page 10, line 8 - page 12, line 9 *;
 [YA]JPS59143347  ;
 [Y]US4710223  (MATEJCZYK DANIEL E [US]) [Y] 7-11,13,14 * column 3, line 63 - column 5, line 17 *;
 [A]JPH05222402  ;
 [AP]US5342573  (AMANO YOSHINARI [JP], et al) [AP] * claim 7 *;
 [A]JPS58117261  ;
 [A]DE2137829  (INSTITUTUL DE CERCETARI METALURGICE ICEM) [A] 7 * claim . *;
 [A]DE2820974  (JOHNSON MATTHEY CO LTD) [A] 7 * claim 1 *
 [YA]  - PATENT ABSTRACTS OF JAPAN, (19841213), vol. 008, no. 272, Database accession no. (E - 284), & JP59143347 A 19840816 (SUMITOMO DENKI KOGYO KK) [Y] 7-11,13,14 * abstract * [A] 1-6
 [A]  - PATENT ABSTRACTS OF JAPAN, (19931209), vol. 017, no. 667, Database accession no. (M - 1524), & JP05222402 A 19930831 (SUMITOMO ELECTRIC IND LTD) [A] 11 * abstract *
 [A]  - DATABASE WPI, 1, Derwent World Patents Index, vol. 83, no. 33, Database accession no. 83-738929, & JPS58117261 A 19830712 (MIZUYA T) [A] 12 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.