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EP0710832
European procedure
Extract from the Register of European Patents
EP About this file: EP0710832
| EP0710832 - Method and apparatus for measuring scattering and absorption characteristics of a scattering medium [Right-click to bookmark this link] | |||
| Former [1996/19] | Method and apparatus for measuring scattering property and absorption property in scattering medium | ||
| [2001/11] | Status | No opposition filed within time limit Status updated on 06.12.2002 Database last updated on 02.09.2024 | Most recent event Tooltip | 06.12.2002 | No opposition filed within time limit | published on 22.01.2003 [2003/04] | Applicant(s) | For all designated states HAMAMATSU PHOTONICS K.K. 1126-1 Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | [N/P] |
| Former [1996/19] | For all designated states HAMAMATSU PHOTONICS K.K. 1126-1 Ichino-cho Hamamatsu-shi Shizuoka-ken / JP | Inventor(s) | 01 /
Miwa, Mitsuharu, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | 02 /
Tsuchiya, Yutaka, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | 03 /
Ueda, Yukio, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | [1996/21] |
| Former [1996/19] | 01 /
Miwa, Mitsuhara, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | ||
| 02 /
Tsuchiya, Yutaka, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | |||
| 03 /
Ueda, Yukio, c/o Hamamatsu Photonics K.K. 1126-1, Ichino-cho Hamamatsu-shi, Shizuoka-ken / JP | Representative(s) | Whitten, George Alan, et al R.G.C. Jenkins & Co 26 Caxton Street London SW1H 0RJ / GB | [N/P] |
| Former [1996/19] | Whitten, George Alan, et al R.G.C. Jenkins & Co., 26 Caxton Street London SW1H 0RJ / GB | Application number, filing date | 95307941.5 | 07.11.1995 | [1996/19] | Priority number, date | JP19940272508 | 07.11.1994 Original published format: JP 27250894 | [1996/19] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0710832 | Date: | 08.05.1996 | Language: | EN | [1996/19] | Type: | B1 Patent specification | No.: | EP0710832 | Date: | 30.01.2002 | Language: | EN | [2002/05] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 11.03.1996 | Classification | IPC: | G01N21/47, A61B5/00 | [1996/19] | CPC: |
A61B5/0091 (EP,US);
A61B5/14553 (EP,US);
A61B5/4312 (EP,US);
G01N21/49 (EP,US);
A61B2562/0242 (EP,US)
| Designated contracting states | DE, FR, GB [1996/19] | Title | German: | Verfahren und Vorrichtung zur Messung der Streu- und Absorptionsmerkmale eines streuenden Mediums | [2001/11] | English: | Method and apparatus for measuring scattering and absorption characteristics of a scattering medium | [2001/11] | French: | Procédé et appareil pour mesurer les caractéristiques de diffusion et d'absorption d'un milieu diffusant | [2001/11] |
| Former [1996/19] | Verfahren und Vorrichtung zur Messung der Streu- und Absorptionseigenschaften eines streuenden Mediums | ||
| Former [1996/19] | Method and apparatus for measuring scattering property and absorption property in scattering medium | ||
| Former [1996/19] | Procédé et appareil pour mesurer les propriétés de diffusion et d'absorption dans un milieu diffusant | Examination procedure | 21.10.1996 | Examination requested [1996/51] | 17.02.2000 | Despatch of a communication from the examining division (Time limit: M06) | 02.08.2000 | Reply to a communication from the examining division | 22.03.2001 | Despatch of communication of intention to grant (Approval: Yes) | 08.06.2001 | Communication of intention to grant the patent | 12.09.2001 | Fee for grant paid | 12.09.2001 | Fee for publishing/printing paid | Opposition(s) | 31.10.2002 | No opposition filed within time limit [2003/04] | Fees paid | Renewal fee | 10.11.1997 | Renewal fee patent year 03 | 10.11.1998 | Renewal fee patent year 04 | 12.11.1999 | Renewal fee patent year 05 | 13.11.2000 | Renewal fee patent year 06 | 14.11.2001 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]WO9422361 (NON INVASIVE TECHNOLOGY INC [US], et al) [Y] 1,10,21 * the whole document *; | [Y]GB2228314 (HAMAMATSU PHOTONICS KK [JP]) [Y] 1,10,21 * abstract *; | [A]WO9313395 (INSITE TECHNOLOGIES INC [US]) [A] 1,9,10,18 * page 22, line 8 - page 23, line 11 *; | [PX]EP0627620 (HAMAMATSU PHOTONICS KK [JP]) [PX] 1,10,21 * the whole document *; | [AP]EP0628804 (HAMAMATSU PHOTONICS KK [JP]) [AP] 1,10,21 * the whole document * | [AD] - M. S. PATTERSON ET AL., APPLIED OPTICS, NEW YORK US, (19890615), vol. 28, no. 12, pages 2331 - 2336, XP000032642 [AD] 1,21 * the whole document * DOI: http://dx.doi.org/10.1364/AO.28.002331 | [A] - B. C. WILSON ET AL., IEEE JOURNAL OF QUANTUM ELECTRONICS, NEW YORK US, vol. 26, no. 12, pages 2186 - 2199, XP000453579 [A] 1,10,21 * the whole document * DOI: http://dx.doi.org/10.1109/3.64355 |