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Extract from the Register of European Patents

EP About this file: EP0679250

EP0679250 - SYSTEM FOR ANALYSING SUBSTANCES AT THE SURFACE OF AN OPTICAL SENSOR [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  12.01.2001
Database last updated on 03.09.2024
Most recent event   Tooltip04.01.2008Lapse of the patent in a contracting state
New state(s): IT		published on 06.02.2008  [2008/06]
Applicant(s)For all designated states
CARL ZEISS JENA GmbH
Tatzendpromenade 1a
07745 Jena / DE
For all designated states
F. Hoffmann-La Roche AG
4002 Basel / CH
For:AT  BE  CH  LI  DE  DK  ES  FR  GR  IE  IT  NL  PT  SE 
Schott Glas
Hattenbergstrasse 10
55122 Mainz / DE
For:GB 
Carl-Zeiss-Stiftung trading as Schott Glas
Hattenbergstrasse 10
55122 Mainz / DE
[N/P]
Former [2000/11]For all designated states
CARL ZEISS JENA GmbH
Tatzendpromenade 1a
07745 Jena / DE
For all designated states
F. Hoffmann-La Roche AG
4002 Basel / CH
For:AT  BE  CH  LI  DE  DK  ES  FR  GR  IE  IT  NL  PT  SE 
Schott Glas
Hattenbergstrasse 10
55122 Mainz / DE
For:GB 
Carl-Zeiss-Stiftung trading as Schott Glas
Hattenbergstrasse 10
55122 Mainz / DE
Former [1998/28]For all designated states
CARL ZEISS JENA GmbH
Tatzendpromenade 1a
D-07745 Jena / DE
For all designated states
F. Hoffmann-La Roche AG
CH-4002 Basel / CH
For:AT  BE  CH  LI  DE  DK  ES  FR  GR  IE  IT  NL  PT  SE 
Schott Glas
Hattenbergstrasse 10
55122 Mainz / DE
For:GB 
Carl-Zeiss-Stiftung trading as Schott Glas
Hattenbergstrasse 10
55122 Mainz / DE
Former [1998/21]For all designated states
CARL ZEISS JENA GmbH
Tatzendpromenade 1a
D-07745 Jena / DE
For all designated states
F. Hoffmann-La Roche AG
CH-4002 Basel / CH
For all designated states
Schott Glas
Hattenbergstrasse 10
55122 Mainz / DE
Former [1995/44]For all designated states
CARL ZEISS JENA GmbH
Tatzendpromenade 1a
D-07745 Jena / DE
For all designated states
F. Hoffmann-La Roche AG
CH-4002 Basel / CH
For all designated states
SCHOTT GLASWERKE
Postfach 24 80
D-55014 Mainz / DE
Inventor(s)01 / FATTINGER, Christof
Emmengasse 7
CH-4223 Blauen / CH
02 / DANIELZIK, Burkhard
Autunstrasse 23
D-55218 Ingelheim / DE
03 / GRÄFE, Dieter
Hanns-Eisler-Strasse 32
D-07745 Jena / DE
04 / HEMING, Martin
Huxelweg 2
D-55291 Saulheim / DE
05 / LENTES, Frank-Thomas
Goethestrasse 9
D-55411 Bingen / DE
[2000/10]
Former [1995/44]01 / FATTINGER, Christof
Emmengasse 7
CH-4223 Blauen / CH
02 / DANIELZIK, Burkhard
Autunstrasse 23
D-55218 Ingelheim / CH
03 / GRÄFE, Dieter
Hanns-Eisler-Strasse 32
D-07745 Jena / DE
04 / HEMING, Martin
Huxelweg 2
D-55291 Saulheim / DE
05 / LENTES, Frank-Thomas
Goethestrasse 9
D-55411 Bingen / DE
Representative(s)Geyer, Werner, et al
Patentanwälte
Geyer, Fehners & Partner
Perhamerstrasse 31
80687 München / DE
[N/P]
Former [1995/44]Geyer, Werner, et al
Patentanwälte Geyer, Fehners & Partner, Perhamerstrasse 31
D-80687 München / DE
Application number, filing date95900731.114.11.1994
[1995/44]
WO1994EP03769
Priority number, dateDE1993433889415.11.1993         Original published format: DE 4338894
DE1994443375322.09.1994         Original published format: DE 4433753
[1995/44]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO9514225
Date:26.05.1995
Language:DE
[1995/22]
Type: A1 Application with search report 
No.:EP0679250
Date:02.11.1995
Language:DE
The application published by WIPO in one of the EPO official languages on 26.05.1995 takes the place of the publication of the European patent application.
[1995/44]
Type: B1 Patent specification 
No.:EP0679250
Date:15.03.2000
Language:DE
[2000/11]
Search report(s)International search report - published on:EP26.05.1995
ClassificationIPC:G01N21/55, G01N21/77
[1995/44]
CPC:
G01N21/552 (EP,US); G01N2021/4711 (EP,US); G01N21/45 (EP,US)
Designated contracting statesAT,   BE,   CH,   DE,   DK,   ES,   FR,   GB,   GR,   IE,   IT,   LI,   NL,   PT,   SE [1995/44]
TitleGerman:ANORDNUNG ZUR ANALYSE VON SUBSTANZEN AN DER OBERFLÄCHE EINES OPTISCHEN SENSORS[1995/44]
English:SYSTEM FOR ANALYSING SUBSTANCES AT THE SURFACE OF AN OPTICAL SENSOR[1995/44]
French:SYSTEME PERMETTANT D'ANALYSER DES SUBSTANCES A LA SURFACE D'UN DETECTEUR OPTIQUE[1995/44]
Entry into regional phase06.07.1995National basic fee paid 
06.07.1995Designation fee(s) paid 
06.07.1995Examination fee paid 
Examination procedure06.07.1995Examination requested  [1995/44]
09.04.1998Despatch of a communication from the examining division (Time limit: M04)
06.08.1998Reply to a communication from the examining division
14.12.1998Despatch of a communication from the examining division (Time limit: M04)
22.04.1999Reply to a communication from the examining division
25.05.1999Despatch of communication of intention to grant (Approval: Yes)
23.08.1999Communication of intention to grant the patent
07.10.1999Fee for grant paid
07.10.1999Fee for publishing/printing paid
Opposition(s)16.12.2000No opposition filed within time limit [2001/09]
Fees paidRenewal fee
27.11.1996Renewal fee patent year 03
27.11.1997Renewal fee patent year 04
27.11.1998Renewal fee patent year 05
12.11.1999Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipES15.03.2000
FR15.03.2000
GR15.03.2000
IT15.03.2000
NL15.03.2000
SE15.03.2000
DK15.06.2000
PT15.06.2000
AT14.11.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
[2008/06]
Former [2004/07]ES15.03.2000
FR15.03.2000
GR15.03.2000
NL15.03.2000
SE15.03.2000
DK15.06.2000
PT15.06.2000
AT14.11.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
Former [2003/45]ES15.03.2000
FR15.03.2000
NL15.03.2000
SE15.03.2000
DK15.06.2000
PT15.06.2000
AT14.11.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
Former [2003/08]ES15.03.2000
FR15.03.2000
NL15.03.2000
SE15.03.2000
PT15.06.2000
AT14.11.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
Former [2002/32]ES15.03.2000
FR15.03.2000
SE15.03.2000
PT15.06.2000
AT14.11.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
Former [2002/26]ES15.03.2000
SE15.03.2000
PT15.06.2000
AT14.11.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
Former [2002/23]SE15.03.2000
PT15.06.2000
AT14.11.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
Former [2002/15]PT15.06.2000
AT14.11.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
Former [2002/13]PT15.06.2000
GB14.11.2000
BE30.11.2000
CH30.11.2000
LI30.11.2000
Former [2002/12]PT15.06.2000
GB14.11.2000
BE30.11.2000
Former [2002/03]PT15.06.2000
BE30.11.2000
Former [2001/50]IE15.03.2000
PT15.06.2000
Former [2001/09]PT15.06.2000
Cited inInternational search[XA]EP0482377  (FRAUNHOFER GES FORSCHUNG [DE]) [X] 34 * column 4, line 25 - column 5, line 49 * * figures 1,2; claim 1 *[A] 1,27;
 [DXA]WO9301487  (ARTIFICIAL SENSING INSTR ASI A [CH]) [DX] 34 * page 5, paragraph 2 * * figures 1,2; claim 1 * [DA] 1,27
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.