-
EP0743676
European procedure
Extract from the Register of European Patents
EP About this file: EP0743676
| EP0743676 - Semiconductor device checking method [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 07.03.2003 Database last updated on 26.07.2024 | Most recent event Tooltip | 07.03.2003 | No opposition filed within time limit | published on 23.04.2003 [2003/17] | Applicant(s) | For all designated states MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 1006, Oaza Kadoma Kadoma-shi Osaka 571-8501 / JP | For all designated states TOKYO ELECTRON LIMITED 3-6 Akasaka 5-chome Minato-ku Tokyo 107-8481 / JP | [N/P] |
| Former [2002/33] | For all designated states MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 1006, Oaza-Kadoma Kadoma-shi, Osaka 571-8501 / JP | ||
| For all designated states TOKYO ELECTRON LIMITED 3-6 Akasaka 5-chome Minato-ku, Tokyo 107-8481 / JP | |||
| Former [2002/18] | For all designated states MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 1006, Oaza Kadoma Kadoma-shi, Osaka 571-0050 / JP | ||
| For all designated states TOKYO ELECTRON LIMITED 3-6 Akasaka 5-chome Minato-ku, Tokyo 107-8481 / JP | |||
| Former [1996/47] | For all designated states MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 1006, Oaza Kadoma Kadoma-shi, Osaka 571 / JP | ||
| For all designated states TOKYO ELECTRON LIMITED 3-6 Akasaka 5-chome Minato-ku, Tokyo 107 / JP | Inventor(s) | 01 /
Nakata, Yoshiro 5-8-3-1, Hikaridai, Seiko-cho Souraku-gun, Kyoto 619-02 / JP | 02 /
Oki, Shinichi 3-12-9, Hikino-cho Sakai-shi, Osaka 591 / JP | 03 /
Nagao, Koichi 11-33-712, Gotenyama-cho Hirakata-shi, Osaka 573 / JP | 04 /
Hatada, Kenzo 4-8-3, Nanseidai Katano-shi, Osaka 576 / JP | 05 /
Mori, Shigeoki 5675-1-C-604, Fukaya Ayase-shi, Kanagawa 252 / JP | 06 /
Sato, Takashi 1180-15, Kitagejo, Fujii-cho Nirasaki-shi, Yamanashi 407 / JP | 07 /
Sano, Kunio 375, Kato-nakajima, Showa-cho Nakakoma-gun, Yamanashi 409-38 / JP | [1996/47] | Representative(s) | Grünecker Patent- und Rechtsanwälte PartG mbB Leopoldstrasse 4 80802 München / DE | [N/P] |
| Former [1996/47] | Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät Maximilianstrasse 58 80538 München / DE | Application number, filing date | 96107937.3 | 17.05.1996 | [1996/47] | Priority number, date | JP19950121008 | 19.05.1995 Original published format: JP 12100895 | [1996/47] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0743676 | Date: | 20.11.1996 | Language: | EN | [1996/47] | Type: | A3 Search report | No.: | EP0743676 | Date: | 07.01.1998 | [1998/02] | Type: | B1 Patent specification | No.: | EP0743676 | Date: | 02.05.2002 | Language: | EN | [2002/18] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 20.11.1997 | Classification | IPC: | H01L21/66, G01R31/316 | [1998/02] | CPC: |
G01R31/2884 (EP,US);
H01L22/00 (KR);
G01R31/2831 (EP,US)
|
| Former IPC [1996/47] | H01L21/66 | Designated contracting states | DE, FR, GB, IT, NL [1996/47] | Title | German: | Halbleiter-Prüfmethode | [1996/47] | English: | Semiconductor device checking method | [1996/47] | French: | Méthode d'essai de dispositifs semi-conducteurs | [1996/47] | Examination procedure | 06.03.1998 | Examination requested [1998/19] | 29.12.1999 | Despatch of a communication from the examining division (Time limit: M06) | 06.07.2000 | Reply to a communication from the examining division | 09.07.2001 | Despatch of communication of intention to grant (Approval: Yes) | 05.11.2001 | Communication of intention to grant the patent | 24.01.2002 | Fee for grant paid | 24.01.2002 | Fee for publishing/printing paid | Opposition(s) | 04.02.2003 | No opposition filed within time limit [2003/17] | Fees paid | Renewal fee | 28.05.1998 | Renewal fee patent year 03 | 27.05.1999 | Renewal fee patent year 04 | 30.05.2000 | Renewal fee patent year 05 | 30.05.2001 | Renewal fee patent year 06 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [YA]US3774088 (MAGDO I, et al) [Y] 2,5 * abstract * * figure 1C * [A] 3,7,8,10; | [Y]EP0339871 (ADVANCED MICRO DEVICES INC [US]) [Y] 6,9 * abstract * * column 2, line 24 - line 53 * * column 3, line 51 - column 4, line 8 * * figures 2,2B,3 *; | [Y]EP0492609 (TOSHIBA KK [JP]) [Y] 6,9 * abstract * * column 2, line 26 - line 37 * * column 8, line 36 - line 43 * * column 10, line 41 - column 11, line 3 * * figure 1 *; | [A]US5346858 (THOMAS JAMES R [US], et al) [A] 1-10 * abstract * * column 2, line 28 - line 47 * * column 3, line 6 - line 25 ** figures 3,5 *; | [XY]US5399505 (DASSE EDWARD C [US], et al) [X] 1,4 * abstract * * column 2, line 38 - line 61 * * column 3, line 64 - column 4, line 14 * * column 6, line 38 - line 51 * * column 22, line 2 - line 18 * * column 25, line 8 - line 40 * * figures 2,4-6 * [Y] 2,5 |