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EP0788149
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EP About this file: EP0788149
| EP0788149 - Method of depositing nanometre scale particles [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 02.06.2006 Database last updated on 21.05.2024 | Most recent event Tooltip | 02.06.2006 | Application deemed to be withdrawn | published on 05.07.2006 [2006/27] | Applicant(s) | For all designated states HITACHI EUROPE LIMITED Whitebrook Park, Lower Cookham Road Maidenhead Berkshire, SL6 8YA / GB | [N/P] |
| Former [1997/32] | For all designated states HITACHI EUROPE LIMITED Whitebrook Park, Lower Cookham Road Maidenhead, Berkshire, SL6 8YA / GB | Inventor(s) | 01 /
Sato, Toshihiko 1 George Nuttall Close Cambridge, CB4 1YE / GB | 02 /
Hasko, David 5 Perry Close Haddenham, Cambridge CB6 3SU / GB | 03 /
Ahmed, Haroon 28 Millington Road Cambridge CB3 9HP / GB | [1997/32] | Representative(s) | Read, Matthew Charles, et al Venner Shipley LLP 200 Aldersgate London EC1A 4HD / GB | [N/P] |
| Former [1997/32] | Read, Matthew Charles, et al Venner Shipley & Co. 20 Little Britain London EC1A 7DH / GB | Application number, filing date | 96300779.4 | 05.02.1996 | [1997/32] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0788149 | Date: | 06.08.1997 | Language: | EN | [1997/32] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 12.07.1996 | Classification | IPC: | H01L21/3205 | [1997/32] | CPC: |
B82B3/00 (EP,US);
G11B11/007 (EP);
G11B9/14 (EP);
G11B9/149 (EP);
H01L21/02107 (EP);
H01L21/02381 (EP);
H01L21/02488 (EP);
H01L21/02532 (EP);
H01L21/02557 (EP);
H01L21/0256 (EP);
H01L21/02601 (EP);
H01L21/02628 (EP);
H01L21/02639 (EP);
H01L21/32051 (EP);
H01L29/7606 (EP);
H10N99/00 (EP);
G01Q80/00 (EP);
G11B11/08 (EP);
| Designated contracting states | DE, FR, GB, NL [1997/46] |
| Former [1997/32] | AT, BE, CH, DE, DK, ES, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Verfahren zum Ablegen von nanometrischen Partikeln | [1997/32] | English: | Method of depositing nanometre scale particles | [1997/32] | French: | Méthode pour déposer des particules nanométriques | [1997/32] | Examination procedure | 06.02.1997 | Loss of particular rights, legal effect: designated state(s) | 04.06.1997 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, DK, ES, GR, IE, IT, LI, LU, MC, PT, SE | 21.01.1998 | Examination requested [1998/13] | 12.08.2002 | Despatch of a communication from the examining division (Time limit: M06) | 21.02.2003 | Reply to a communication from the examining division | 22.07.2004 | Despatch of a communication from the examining division (Time limit: M06) | 10.12.2004 | Reply to a communication from the examining division | 02.09.2005 | Communication of intention to grant the patent | 13.01.2006 | Application deemed to be withdrawn, date of legal effect [2006/27] | 16.02.2006 | Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time [2006/27] | Fees paid | Renewal fee | 20.02.1998 | Renewal fee patent year 03 | 23.02.1999 | Renewal fee patent year 04 | 24.02.2000 | Renewal fee patent year 05 | 20.02.2001 | Renewal fee patent year 06 | 19.02.2002 | Renewal fee patent year 07 | 27.02.2003 | Renewal fee patent year 08 | 20.02.2004 | Renewal fee patent year 09 | 17.02.2005 | Renewal fee patent year 10 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 19.03.1997 | AT M01 Not yet paid | 19.03.1997 | BE M01 Not yet paid | 19.03.1997 | CH M01 Not yet paid | 19.03.1997 | DK M01 Not yet paid | 19.03.1997 | ES M01 Not yet paid | 19.03.1997 | GR M01 Not yet paid | 19.03.1997 | IE M01 Not yet paid | 19.03.1997 | IT M01 Not yet paid | 19.03.1997 | LU M01 Not yet paid | 19.03.1997 | MC M01 Not yet paid | 19.03.1997 | PT M01 Not yet paid | 19.03.1997 | SE M01 Not yet paid | Additional fee for renewal fee | 28.02.2006 | 11 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A] - C. LUANGDILOK ET AL., "Size control and surface modification of colloidal semiconductor particles", ISRAEL JOURNAL OF CHEMISTRY, ISRAEL, (1993), vol. 33, no. 1, pages 53 - 58, XP000575118 | [A] - "Molecular brush assembly", IBM TECHNICAL DISCLOSURE BULLETIN, NEW YORK US, (199401), vol. 37, no. 1, pages 261 - 262, XP000428769 | [DA] - G.SCHÖN ET AL., "A fascinating new field in colloid science : small ligand-stabilized metal clusters and possible application in microelectronics", COLLOID & POLYMER SCIENCE, GERMANY, (199502), vol. 273, no. 2, pages 101 - 117, XP000570059 DOI: http://dx.doi.org/10.1007/BF00654007 |