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Extract from the Register of European Patents

EP About this file: EP0823089

EP0823089 - AUTOMATIC PARALLEL ELECTRONIC COMPONENT TESTING METHOD AND EQUIPMENT [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  05.01.2001
Database last updated on 14.09.2024
Most recent event   Tooltip05.01.2001No opposition filed within time limitpublished on 21.02.2001 [2001/08]
Applicant(s)For all designated states
SCHLUMBERGER Systèmes
50, avenue Jean Jaurès
92120 Montrouge / FR
[1999/23]
Former [1998/07]For all designated states
SCHLUMBERGER INDUSTRIES S.A.
50, avenue Jean-Jaurès
92120 Montrouge / FR
Inventor(s)01 / FOURNEL, Jean-Claude
Le Bourg
F-43140 Saint-Victor Malescours / FR
02 / CHAUSSE, Daniel
5, rue Joly-Gilly
F-42100 Saint-Etienne / FR
03 / MURGUE, Jean-Louis
La Planchette
F-42660 Saint-Romain-les-Atheux / FR
[1998/07]
Representative(s)Lemoyne, Didier
Schlumberger Industries
Propriété Intellectuelle
50 Avenue Jean Jaurès
BP 620-04
92542 Montrouge Cedex / FR
[N/P]
Former [1998/07]Lemoyne, Didier
Schlumberger Industries, Propriété Intellectuelle, 50, avenue Jean Jaurès, BP 620-04
92542 Montrouge-Cedex / FR
Application number, filing date96912093.010.04.1996
[1998/07]
WO1996FR00541
Priority number, dateFR1995000477619.04.1995         Original published format: FR 9504776
[1998/07]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report
No.:WO9633461
Date:24.10.1996
Language:FR
[1996/47]
Type: A1 Application with search report 
No.:EP0823089
Date:11.02.1998
Language:FR
The application published by WIPO in one of the EPO official languages on 24.10.1996 takes the place of the publication of the European patent application.
[1998/07]
Type: B1 Patent specification 
No.:EP0823089
Date:08.03.2000
Language:FR
[2000/10]
Search report(s)International search report - published on:EP24.10.1996
ClassificationIPC:G06F11/26, G01R31/28, G06F11/273
[1998/07]
CPC:
G01R31/2834 (EP,US); G01R31/31908 (EP,US); G01R31/31926 (EP,US);
G01R31/31922 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL,   SE [1998/07]
TitleGerman:VERFAHREN UND VORRICHTUNG ZUR PARALLELEN AUTOMATISCHEN PRÜFUNG VON ELEKTRONISCHEN SCHALTUNGEN[1998/07]
English:AUTOMATIC PARALLEL ELECTRONIC COMPONENT TESTING METHOD AND EQUIPMENT[1998/07]
French:PROCEDE ET EQUIPEMENT DE TEST AUTOMATIQUE EN PARALLELE DE COMPOSANTS ELECTRONIQUES[1998/07]
Entry into regional phase17.09.1997National basic fee paid 
17.09.1997Designation fee(s) paid 
17.09.1997Examination fee paid 
Examination procedure26.10.1996Request for preliminary examination filed
International Preliminary Examining Authority: EP
17.09.1997Examination requested  [1998/07]
01.07.1999Despatch of communication of intention to grant (Approval: Yes)
16.07.1999Communication of intention to grant the patent
02.09.1999Fee for grant paid
02.09.1999Fee for publishing/printing paid
Opposition(s)09.12.2000No opposition filed within time limit [2001/08]
Fees paidRenewal fee
16.04.1998Renewal fee patent year 03
29.03.1999Renewal fee patent year 04
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Cited inInternational search[A]EP0446550  (IBM [US]) [A] 1-4 * abstract * * claims 1,2,8-11 *;
 [A]  - KING P.N., "Flexible, high-performance pin electronics implementation", INTERNATIONAL TEST CONFERENCE 1989, WASHINGTON, USA, (19890829), pages 787 - 794, XP000090010 [A] 1-4 * page 788, column 1, line 10 - page 790, column 1, line 33 * * figure 1 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.