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EP0867726
European procedure
Extract from the Register of European Patents
EP About this file: EP0867726
| EP0867726 - Measuring method for detecting of a short circuit between windings of a coil integrated on a chip, and integrated circuit adapted to such a measuring method [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 26.11.2004 Database last updated on 15.06.2024 | Most recent event Tooltip | 03.02.2006 | Lapse of the patent in a contracting state New state(s): NL | published on 22.03.2006 [2006/12] | Applicant(s) | For all designated states EM Microelectronic-Marin SA Rue des Sors 3 2074 Marin / CH | [1998/40] | Inventor(s) | 01 /
Kunz, Pascal Orangerie 4 2000 Neuchâtel / CH | 02 /
Banyai, Antal Pierre-à-Mazel 11 2000 Neuchâtel / CH | [1998/40] | Representative(s) | Balsters, Robert, et al I C B Ingénieurs Conseils en Brevets S.A. Faubourg de l'Hôpital 3 2001 Neuchâtel / CH | [N/P] |
| Former [1998/40] | Balsters, Robert, et al I C B, Ingénieurs Conseils en Brevets S.A., 7, rue des Sors 2074 Marin / CH | Application number, filing date | 97104959.8 | 24.03.1997 | [1998/40] | Filing language | FR | Procedural language | FR | Publication | Type: | A1 Application with search report | No.: | EP0867726 | Date: | 30.09.1998 | Language: | FR | [1998/40] | Type: | B1 Patent specification | No.: | EP0867726 | Date: | 21.01.2004 | Language: | FR | [2004/04] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 02.09.1997 | Classification | IPC: | G01R31/06 | [2004/22] | CPC: |
G01R31/72 (EP,US)
|
| Former IPC [1998/40] | G01R31/02, G01R31/06 | Designated contracting states | AT, BE, CH, DE, FR, GB, LI, NL [1999/23] |
| Former [1998/40] | AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Messverfahren zur Feststellung eines Kurzschlusses zwischen den Windungen einer auf einem Chip integrierten Spule und auf ein solches Messverfahren zugeschnit- tene integrierte Schaltung | [2003/21] | English: | Measuring method for detecting of a short circuit between windings of a coil integrated on a chip, and integrated circuit adapted to such a measuring method | [1998/40] | French: | Méthode de mesure pour détecter un court-circuit entre des spires d'une bobine intégrée sur une puce, et structure de circuit intégré adaptée à une telle méthode de mesure | [1998/40] |
| Former [1998/40] | Messverfharen zur Feststellung eines Kurzschlusses zwischen den Windungen einer auf einem Chip integrierten Spule und auf ein solches Messverfahren zugeschittene integrierte Schaltung | Examination procedure | 30.03.1999 | Examination requested [1999/21] | 25.04.2003 | Communication of intention to grant the patent | 05.11.2003 | Fee for grant paid | 05.11.2003 | Fee for publishing/printing paid | Opposition(s) | 22.10.2004 | No opposition filed within time limit [2005/02] | Fees paid | Renewal fee | 31.03.1999 | Renewal fee patent year 03 | 31.03.2000 | Renewal fee patent year 04 | 02.04.2001 | Renewal fee patent year 05 | 02.04.2002 | Renewal fee patent year 06 | 31.03.2003 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | AT | 21.01.2004 | GB | 21.01.2004 | NL | 21.01.2004 | BE | 31.03.2004 | CH | 31.03.2004 | LI | 31.03.2004 | DE | 22.04.2004 | [2006/12] |
| Former [2005/21] | AT | 21.01.2004 | |
| GB | 21.01.2004 | ||
| BE | 31.03.2004 | ||
| CH | 31.03.2004 | ||
| LI | 31.03.2004 | ||
| DE | 22.04.2004 | ||
| Former [2005/14] | AT | 21.01.2004 | |
| GB | 21.01.2004 | ||
| BE | 31.03.2004 | ||
| DE | 22.04.2004 | ||
| Former [2005/12] | AT | 21.01.2004 | |
| GB | 21.01.2004 | ||
| DE | 22.04.2004 | ||
| Former [2004/45] | AT | 21.01.2004 | |
| GB | 21.01.2004 | ||
| Former [2004/43] | AT | 21.01.2004 | Documents cited: | Search | [A]DE1178938 (HELMUT LANGKAU DIPL ING) [A] 1 * column 1, line 8 - column 2, line 34; figures 1,2 *; | [AD]WO8800785 (BI INC [US]) [AD] 1,2 * abstract *; | [A]EP0655628 (FAKULTETA ZA ELEKTROTEHNIKO IN [SI]) [A] 2 * abstract ** column 2, line 5 - column 18; figures 1,2 *; | [A] - MILA, "TESTING TWISTED PAIRS FOR OPENS,SHORTS,...", TECHNICAL DIGEST - WESTERN ELECTRIC, NEW YORK US, (197410), no. 36, pages 23 - 24, XP002039215 [A] 1 * the whole document * |