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Extract from the Register of European Patents

EP About this file: EP0817239

EP0817239 - Ion trapping mass spectrometry apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  16.04.2004
Database last updated on 16.09.2024
Most recent event   Tooltip16.04.2004No opposition filed within time limitpublished on 02.06.2004  [2004/23]
Applicant(s)For all designated states
Hitachi, Ltd.
6, Kanda Surugadai 4-chome
Chiyoda-ku
Tokyo 101 / JP
[N/P]
Former [2003/24]For all designated states
Hitachi, Ltd.
6, Kanda Surugadai 4-chome
Chiyoda-ku, Tokyo 101 / JP
Former [1998/02]For all designated states
HITACHI, LTD.
6, Kanda Surugadai 4-chome
Chiyoda-ku, Tokyo 101 / JP
Inventor(s)01 / Baba, Takashi
Fuji-Kopo 305, 2-19-14 Motojuku
Higashi-Matsuyama-shi, Saitama-ken / JP
02 / Waki, Izumi
3-23-5-104, Mihara
Asaka-shi, Saitama-ken / JP
[1998/02]
Representative(s)Beetz & Partner mbB
Patentanwälte
Prinzregentenstraße 54
80538 München / DE
[N/P]
Former [1998/02]Beetz & Partner Patentanwälte
Steinsdorfstrasse 10
80538 München / DE
Application number, filing date97111068.902.07.1997
[1998/02]
Priority number, dateJP1996017202302.07.1996         Original published format: JP 17202396
[1998/02]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0817239
Date:07.01.1998
Language:EN
[1998/02]
Type: B1 Patent specification 
No.:EP0817239
Date:11.06.2003
Language:EN
[2003/24]
Search report(s)(Supplementary) European search report - dispatched on:EP17.10.1997
ClassificationIPC:H01J49/42
[1998/02]
CPC:
H01J49/4225 (EP); H01J49/423 (EP)
Designated contracting statesDE,   FR,   GB [1998/38]
Former [1998/02]AT,  BE,  CH,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Ionenspeicherungsvorrichtung für Massenspektrometrie[2003/18]
English:Ion trapping mass spectrometry apparatus[1998/02]
French:Dispositif de stockage d'ions à des fins de spectrométrie de masse[1998/02]
Former [1998/02]Ionenspeicherungsvorrichtung zur Massenspektrometrie
Examination procedure30.10.1997Examination requested  [1998/02]
08.10.1999Despatch of a communication from the examining division (Time limit: M06)
03.04.2000Reply to a communication from the examining division
03.04.2001Despatch of a communication from the examining division (Time limit: M06)
12.10.2001Reply to a communication from the examining division
04.10.2002Communication of intention to grant the patent
24.01.2003Fee for grant paid
24.01.2003Fee for publishing/printing paid
Opposition(s)12.03.2004No opposition filed within time limit [2004/23]
Fees paidRenewal fee
30.07.1999Renewal fee patent year 03
31.07.2000Renewal fee patent year 04
30.07.2001Renewal fee patent year 05
30.07.2002Renewal fee patent year 06
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Documents cited:Search[PXA]US5576540  (JOLLIFFE CHARLES L) [PX] 1,2,8 * abstract * * column 4, line 65 - column 5, line 30 * * column 6, line 22 - line 53 * * column 8, paragraph 1 - paragraph 2 * * column 10, line 23 - line 51 * * column 10, line 65 - line 68 * [A] 9;
 [DPA]EP0736894  (HITACHI LTD) [DPA] 1,8,9 * abstract *;
 [DA]US5420425  (BIER MARK E ET AL) [DA] 1,8 * column 10, line 40 - line 63; figures 2A-2C *;
 [DA]EP0262928  (FINNIGAN CORP) [DA] 1 * abstract *;
 [DA]EP0409362  (FINNIGAN CORP) [DA] 1 * abstract *;
 [DA]EP0113207  (FINNIGAN CORP) [DA] 1 * abstract *;
 [DPA]WO9702591  (HITACHI LTD ;BABA TAKASHI (JP); WAKI IZUMI (JP)) [DPA] 1 * abstract *;
 [DA]US2939952  (W. PAUL ET AL.) [DA] 1 * figures 2-5; claim 8 *;
 [DA]  - WAKI I ET AL, "OBSERVATION OF ORDERED STRUCTURES OF LASER-COOLED IONS IN A QUADRUPOLE STORAGE RING", PHYSICAL REVIEW LETTERS, vol. 68, no. 13, pages 2007 - 2010, XP000274504 [DA] 1 * abstract *

DOI:   http://dx.doi.org/10.1103/PhysRevLett.68.2007
 [DA]  - D. A. CHURCH, "Strorage-Ring ion Trap derived from the linear quadrupole radio frequency mass filter.", JOURNAL OF APPLIED PHYSICS., NEW YORK US, (196907), vol. 40, no. 1, pages 3127 - 3134, XP002042989 [DA] 1

DOI:   http://dx.doi.org/10.1063/1.1658153
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.