blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP0819924

EP0819924 - Apparatus and method for measuring characteristics of optical pulses [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  08.07.2011
Database last updated on 13.07.2024
Most recent event   Tooltip08.07.2011Withdrawal of applicationpublished on 10.08.2011  [2011/32]
Applicant(s)For all designated states
Japan Science and Technology Corporation
1-8, Honcho 4-chome Kawaguchi-shi
Saitama 332-0012 / JP
[N/P]
Former [2002/31]For all designated states
Japan Science and Technology Corporation
1-8, Hon-cho 4-chome
Kawaguchi-shi, Saitama 332 / JP
Former [1998/04]For all designated states
Japan Science and Technology Corporation
1-8, Hon-cho 4-chome
Kawaguchi-shi, Saitama 332 / JP
For all designated states
Yamamoto, Yoshihisa
8 Ryan Court Stanford
California 94305 / US
Inventor(s)01 / Machida, Susumu
4-39, Midori-cho 2-chome
Musashino-shi, Tokyo 180 / JP
02 / Jiang, Shudong, Room 201, Park Hills Musashino
4-35, Hachiman-cho 1-chome
Musashino-shi, Tokyo 180 / JP
03 / Yamamoto, Yoshihisa
8 Ryan Court
Stanford, California 94305 / US
[1998/04]
Representative(s)Fiener, Josef
Patentanw. J. Fiener et col.
P.O. Box 12 49
87712 Mindelheim / DE
[N/P]
Former [1998/04]Fiener, Josef
Patentanwälte Kahler, Käck, Fiener et col., P.O. Box 12 49
87712 Mindelheim / DE
Application number, filing date97112135.516.07.1997
[1998/04]
Priority number, dateJP1996018523516.07.1996         Original published format: JP 18523596
[1998/04]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0819924
Date:21.01.1998
Language:EN
[1998/04]
Type: A3 Search report 
No.:EP0819924
Date:10.02.1999
[1999/06]
Search report(s)(Supplementary) European search report - dispatched on:EP28.12.1998
ClassificationIPC:G01J11/00, G04F13/02
[1998/04]
CPC:
G04F13/026 (EP,US); G01J11/00 (EP,US)
Designated contracting statesDE,   FR,   GB [1999/42]
Former [1998/04]AT,  BE,  CH,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Gerät und Verfahren für die Messung von Charakteristiken von optischen Pulsen[1998/04]
English:Apparatus and method for measuring characteristics of optical pulses[1998/04]
French:Appareil et procédé pour la mesure des caractéristiques d'impulsions optiques[1998/04]
Examination procedure12.06.1998Examination requested  [1998/33]
24.09.2007Despatch of a communication from the examining division (Time limit: M04)
21.01.2008Reply to a communication from the examining division
06.10.2008Despatch of a communication from the examining division (Time limit: M04)
29.01.2009Reply to a communication from the examining division
02.11.2009Despatch of a communication from the examining division (Time limit: M04)
24.02.2010Reply to a communication from the examining division
04.07.2011Application withdrawn by applicant  [2011/32]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  24.09.2007
Fees paidRenewal fee
02.08.1999Renewal fee patent year 03
31.07.2000Renewal fee patent year 04
31.07.2001Renewal fee patent year 05
30.07.2002Renewal fee patent year 06
31.07.2003Renewal fee patent year 07
30.07.2004Renewal fee patent year 08
28.07.2005Renewal fee patent year 09
26.07.2006Renewal fee patent year 10
30.07.2007Renewal fee patent year 11
29.07.2008Renewal fee patent year 12
30.07.2009Renewal fee patent year 13
24.07.2010Renewal fee patent year 14
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US4792230  (NAGANUMA KAZUNORI [JP], et al) [Y] 1,2,5,6 * column 13, line 34 - line 48; figure 3 *;
 [Y]JPS63208729  ;
 [A]US4480192  (ALBRECHT GEORG F [US], et al) [A] 1,2,5 * column 2, line 31 - line 48; figure 1 *
 [XY]  - OKSANEN J A I ET AL, "A FEMTOSECOND AUTOCORRELATOR WITH INTERNAL CALIBRATION", REVIEW OF SCIENTIFIC INSTRUMENTS, (19930901), vol. 64, no. 9, page 2706/2707, XP000395659 [X] 1,2,5,6 * the whole document * [Y] 3,4

DOI:   http://dx.doi.org/10.1063/1.1143863
 [Y]  - KYOO NAM CHOI, "CORRELATION METHOD FOR FEMTOSECOND OPTICAL PULSES", MEASUREMENT SCIENCE AND TECHNOLOGY, (19930801), vol. 4, no. 8, pages 850 - 853, XP000384622 [Y] 3,4 * paragraph [0001] * * paragraph [0003] *

DOI:   http://dx.doi.org/10.1088/0957-0233/4/8/009
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19881227), vol. 012, no. 499, Database accession no. (P - 807), & JP63208729 A 19880830 (HITACHI LTD) [Y] 1,2,5,6 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.