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EP0849791
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EP About this file: EP0849791
| EP0849791 - Improvements in or relating to electronic devices [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 20.08.1999 Database last updated on 16.07.2024 | Most recent event Tooltip | 20.08.1999 | Application deemed to be withdrawn | published on 06.10.1999 [1999/40] | Applicant(s) | For all designated states Texas Instruments Incorporated 7839 Churchill Way Mail Station 3999 Dallas, Texas 75251 / US | [N/P] |
| Former [1998/26] | For all designated states Texas Instruments Incorporated 7839 Churchill Way, Mail Station 3999 Dallas, Texas 75251 / US | Inventor(s) | 01 /
Rost, Timothy A. 801 Legacy Dr., Apt. No. 428 Plano, TX 75023 / US | 02 /
Giolma, William H. 5723 Bent Creek Trail Dallas, TX 75287 / US | 03 /
Montgomery, Clinton L. 744 Eagle Dr. Coppell, TX 75019 / US | [1998/26] | Representative(s) | Schwepfinger, Karl-Heinz Prinz & Partner GbR Manzingerweg 7 81241 München / DE | [N/P] |
| Former [1998/26] | Schwepfinger, Karl-Heinz, Dipl.-Ing. Prinz & Partner, Manzingerweg 7 81241 München / DE | Application number, filing date | 97122693.1 | 22.12.1997 | [1998/26] | Priority number, date | US19960033771P | 20.12.1996 Original published format: US 33771 P | [1998/26] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0849791 | Date: | 24.06.1998 | Language: | EN | [1998/26] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 24.04.1998 | Classification | IPC: | H01L21/8249, H01L21/8222 | [1998/26] | CPC: |
H01L27/0623 (EP)
| Designated contracting states | DE, FR, GB, IT, NL [1999/10] |
| Former [1998/26] | AT, BE, CH, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Verbesserungen an oder in Bezug auf Halbleiteranordnungen | [1998/26] | English: | Improvements in or relating to electronic devices | [1998/26] | French: | Améliorations dans ou concernant des dispositifs semi-conducteurs | [1998/26] | Examination procedure | 29.12.1998 | Application deemed to be withdrawn, date of legal effect [1999/40] | 12.05.1999 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [1999/40] |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [YA]EP0320217 (TEXAS INSTRUMENTS INC) [Y] 15-18,20,21,23,25-27,29 * abstract * * column 10, line 41 - column 12, line 36 * * column 13, line 42 - column 14, line 17 * [A] 1; | [X]JPS6089969 ; | [A]US4613885 (HAKEN ROGER A) [A] 1,8,15,22,25,30 * abstract * * column 4, line 43 - line 50 *; | [XY] - NITSU Y ET AL, "Anomalous current gain degradation in bipolar transistors", 29TH ANNUAL PROCEEDINGS. RELIABILITY PHYSICS 1991 (CAT. NO.91CH2974-4), LAS VEGAS, NV, USA, 9-11 APRIL 1991, ISBN 0-87942-680-2, 1991, NEW YORK, NY, USA, IEEE, USA, pages 193 - 199, XP002060547 [X] 1-3,5,7 * page 193, column 1 * * page 194, column 1, line 13 - line 24 * * page 195, column 1 - column 2 * [Y] 15-18,20,21,23,25-27,29 DOI: http://dx.doi.org/10.1109/RELPHY.1991.146013 | [X] - PATENT ABSTRACTS OF JAPAN, (19850926), vol. 009, no. 240, Database accession no. (E - 345), & JP60089969 A 19850520 (NIPPON DENSHIN DENWA KOSHA) [X] 1,5,8 * abstract * | [A] - TAKAHIRO ONAI ET AL, "AN NPN 30 GHZ, PNP 32 GHZ FT COMPLEMENTARY BIPOLAR TECHNOLOGY", PROCEEDINGS OF THE INTERNATIONAL ELECTRON DEVICES MEETING, WASHINGTON, DEC. 5 - 8, 1993, INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, (19931205), pages 63 - 66, XP000481569 [A] 1,5,6,8,15,22,25,30 * page 63, column 2, paragraph B * * figure 2 * | [A] - REUSS R H ET AL, "Effects of interfacial oxide on hot carrier reliability of polysilicon emitter npn transistors", PROCEEDINGS OF THE 1993 BIPOLAR/BICOMS CIRCUITS AND TECHNOLOGY MEETING (CAT. NO.93CH3315-9), PROCEEDINGS OF IEEE BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, MINNEAPOLIS, MN, USA, 4-5 OCT. 1993, ISBN 0-7803-1316-X, 1993, NEW YORK, NY, USA, IEEE, USA, pages 219 - 222, XP002060549 [A] 1-3,5,7,15,20,21,23,25-27 * page 219, column 2, paragraph EXP. * * page 220, column 2, paragraph ANNEAL * DOI: http://dx.doi.org/10.1109/BIPOL.1993.617502 |