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Extract from the Register of European Patents

EP About this file: EP0833144

EP0833144 - Method for measuring a spectral response [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  06.01.2006
Database last updated on 27.07.2024
Most recent event   Tooltip06.01.2006No opposition filed within time limitpublished on 22.02.2006  [2006/08]
Applicant(s)For all designated states
Digilab, LLC
68 Mazzeo Drive
Randolph, Massachusetts 02368 / US
[2002/41]
Former [1998/14]For all designated states
BIO-RAD LABORATORIES, INC.
1000 Alfred Nobel Drive
Hercules California 94547 / US
Inventor(s)01 / Curbelo, Raul
24 Philip Road
Lexington, Massachusetts 02173 / US
[1998/14]
Representative(s)O'Brien, Caroline Jane, et al
Mewburn Ellis LLP
33 Gutter Lane
London EC2V 8AS / GB
[N/P]
Former [1998/14]O'Brien, Caroline Jane, et al
MEWBURN ELLIS York House 23 Kingsway
London WC2B 6HP / GB
Application number, filing date97306335.720.08.1997
[1998/14]
Priority number, dateUS1996071294013.09.1996         Original published format: US 712940
[1998/14]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0833144
Date:01.04.1998
Language:EN
[1998/14]
Type: A3 Search report 
No.:EP0833144
Date:25.11.1998
[1998/48]
Type: B1 Patent specification 
No.:EP0833144
Date:02.03.2005
Language:EN
[2005/09]
Search report(s)(Supplementary) European search report - dispatched on:EP07.10.1998
ClassificationIPC:G01N21/25, G01N21/35, G01J3/45
[1998/46]
CPC:
G01J3/453 (EP,US); G01J2003/2866 (EP,US)
Former IPC [1998/14]G01N21/00
Designated contracting statesDE,   GB [1999/31]
Former [1998/14]AT,  BE,  CH,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Verfahren zur Messung einer spektralen Antwort[2004/35]
English:Method for measuring a spectral response[1998/14]
French:Procédé pour la mesure d'une réponse spectrale[2004/35]
Former [1998/14]Verfahren zur Messung spektraler Reaktion
Former [1998/14]Procédé pour la mesure d'une résponse spectrale
Examination procedure09.09.1997Examination requested  [1998/14]
14.01.2004Despatch of a communication from the examining division (Time limit: M06)
01.06.2004Reply to a communication from the examining division
17.08.2004Communication of intention to grant the patent
20.12.2004Fee for grant paid
20.12.2004Fee for publishing/printing paid
Opposition(s)05.12.2005No opposition filed within time limit [2006/08]
Fees paidRenewal fee
04.08.1999Renewal fee patent year 03
03.08.2000Renewal fee patent year 04
21.08.2001Renewal fee patent year 05
21.08.2002Renewal fee patent year 06
25.08.2003Renewal fee patent year 07
02.09.2004Renewal fee patent year 08
Penalty fee
Additional fee for renewal fee
31.08.200408   M06   Fee paid on   02.09.2004
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Documents cited:Search[ADP]US5612784  (CURBELO RAUL [US]) [ADP] 1;
 [A]US5251008  (MASUTANI KOJI [JP]) [A] 1;
 [A]DE4428600  (PERKIN ELMER LTD [GB]) [A] 1;
 [A]  XP002900134 [A] 1

DOI:   http://dx.doi.org/10.1063/1.1142003
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.