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Extract from the Register of European Patents

EP About this file: EP0902481

EP0902481 - Fabrication method for thin film transistor with reduced parasitic capacitance [Right-click to bookmark this link]
Former [1999/11]Thin film transistor with reduced parasitic capacitance
[2007/17]
StatusNo opposition filed within time limit
Status updated on  01.08.2008
Database last updated on 05.10.2024
Most recent event   Tooltip01.08.2008No opposition filed within time limitpublished on 03.09.2008  [2008/36]
Applicant(s)For all designated states
Xerox Corporation
Xerox Square - 20A
Rochester, NY 14644 / US
[2007/39]
Former [1999/11]For all designated states
Xerox Corporation
Xerox Square - 20A
Rochester, New York 14644 / US
Inventor(s)01 / Mei, Ping
4276 Wilke Way, Apt. D
Palo Alto, CA 94306 / US
02 / Lujan, Rene A.
115 West Duane Avenue
Sunnyvale, CA 94086 / US
03 / Boyce, James B.
1036 Russel Avenue
Los Altos, CA 94024 / US
04 / Chua, Christopher L.
234 Escuela Ave, Apt. 110
Mountain View, CA 94040 / US
05 / Hack, Michael G.
372, Mountain View Avenue
Mountain View, CA 94041 / US
[1999/11]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstrasse 4
80802 München / DE
[N/P]
Former [1999/11]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date98115454.517.08.1998
[1999/11]
Priority number, dateUS1997092702310.09.1997         Original published format: US 927023
[1999/11]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0902481
Date:17.03.1999
Language:EN
[1999/11]
Type: A3 Search report 
No.:EP0902481
Date:21.06.2000
[2000/25]
Type: B1 Patent specification 
No.:EP0902481
Date:26.09.2007
Language:EN
[2007/39]
Search report(s)(Supplementary) European search report - dispatched on:EP09.05.2000
ClassificationIPC:H01L29/786, H01L21/336, H01L21/223, C30B31/08, H01L27/146, G02F1/136, H01L31/0216
[2000/25]
CPC:
H01L29/78696 (EP,US); H01L21/223 (EP,US); H01L21/2236 (EP,US);
H01L21/2254 (EP,US); H01L21/2255 (EP,US); H01L21/266 (EP,US);
H01L27/1443 (EP,US); H01L27/14603 (EP,US); H01L29/66757 (EP,US);
H01L29/66765 (EP,US); H01L29/78669 (EP,US); H01L31/02162 (EP,US);
H01L31/02165 (EP,US); Y10S438/94 (EP,US) (-)
Former IPC [1999/11]H01L29/786, H01L21/336, H01L21/223, C30B31/08, H01L27/146, G02F1/136
Designated contracting statesDE,   FR,   GB [2001/09]
Former [1999/11]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Herstellungsverfahren für Dünnschichtfeldeffekttransistor mit verminderter Streukapazität[2007/17]
English:Fabrication method for thin film transistor with reduced parasitic capacitance[2007/17]
French:Procédé de fabrication d'un transistor à couches minces ayant une capacité parasite réduite[2007/17]
Former [1999/11]Dünnschichtfeldeffekttransistor mit verminderter Streukapazität
Former [1999/11]Thin film transistor with reduced parasitic capacitance
Former [1999/11]Transistor à couches minces ayant une capacité parasite réduite
Examination procedure21.12.2000Examination requested  [2001/08]
24.05.2006Despatch of a communication from the examining division (Time limit: M04)
04.10.2006Reply to a communication from the examining division
08.03.2007Cancellation of oral proceeding that was planned for 13.03.2007
13.03.2007Date of oral proceedings (cancelled)
10.04.2007Communication of intention to grant the patent
06.08.2007Fee for grant paid
06.08.2007Fee for publishing/printing paid
Opposition(s)27.06.2008No opposition filed within time limit [2008/36]
Fees paidRenewal fee
31.08.2000Renewal fee patent year 03
31.08.2001Renewal fee patent year 04
02.09.2002Renewal fee patent year 05
01.09.2003Renewal fee patent year 06
31.08.2004Renewal fee patent year 07
31.08.2005Renewal fee patent year 08
31.08.2006Renewal fee patent year 09
31.08.2007Renewal fee patent year 10
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Documents cited:Search[XA]JPS61187369  ;
 [XA]JPS62205664  ;
 [XA]JPS62120075  ;
 [X]EP0766294  (CANON KK [JP]) [X] 1-5 * figures 34,69 *
 [XA]  - PATENT ABSTRACTS OF JAPAN, (19870117), vol. 011, no. 017, Database accession no. (E - 471), & JP61187369 A 19860821 (HITACHI LTD) [X] 1-5 * the whole document * [A] 6-10
 [XA]  - PATENT ABSTRACTS OF JAPAN, (19880225), vol. 012, no. 063, Database accession no. (E - 585), & JP62205664 A 19870910 (MATSUSHITA ELECTRIC IND CO LTD) [X] 1-5 * the whole document * [A] 6-10
 [XA]  - PATENT ABSTRACTS OF JAPAN, (19871107), vol. 011, no. 341, Database accession no. (E - 554), & JP62120075 A 19870601 (FUJITSU LTD) [X] 1-5 * the whole document * [A] 6-10
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.