Extract from the Register of European Patents

EP About this file: EP0905798

EP0905798 - Method of manufacturing optical semiconductor device [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  07.10.2005
Database last updated on 28.03.2026
Most recent event   Tooltip07.10.2005Withdrawal of applicationpublished on 23.11.2005  [2005/47]
Applicant(s)For all designated states
NEC Compound Semiconductor Devices, Ltd.
1753, Shimonumabe, Nakahara-ku
Kawasaki, Kanagawa 211-8666 / JP
[N/P]
Former [2002/46]For all designated states
NEC Compound Semiconductor Devices, Ltd.
1753, Shimonumabe, Nakahara-ku
Kawasaki, Kanagawa 211-8666 / JP
Former [1999/13]For all designated states
NEC CORPORATION
7-1, Shiba 5-chome Minato-ku
Tokyo / JP
Inventor(s)01 / Sakata, Yasutaka
Nec corpration, 7-1,Shiba-5-chome
Minato-ku, Tokyo / JP
[1999/13]
Representative(s)Baronetzky, Klaus, et al
Splanemann
Patentanwälte Partnerschaft
Rumfordstrasse 7
80469 München / DE
[N/P]
Former [1999/13]Baronetzky, Klaus, Dipl.-Ing., et al
Patentanwälte Dipl.-Ing. R. Splanemann, Dr. B. Reitzner, Dipl.-Ing. K. Baronetzky Tal 13
80331 München / DE
Application number, filing date98118177.925.09.1998
[1999/13]
Priority number, dateJP1997026664530.09.1997         Original published format: JP 26664597
[1999/13]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0905798
Date:31.03.1999
Language:EN
[1999/13]
Type: A3 Search report 
No.:EP0905798
Date:29.03.2000
[2000/13]
Search report(s)(Supplementary) European search report - dispatched on:EP10.02.2000
ClassificationIPC:H01L21/20, H01L21/205, C30B25/00, H01L33/00, H01S3/19
[2000/13]
CPC:
H01S5/227 (EP,US); H10H20/013 (EP,KR,US); H10H20/81 (KR);
H01S2304/04 (EP,US); H01S5/2272 (EP,US); H01S5/2277 (EP,US)
Former IPC [1999/13]H01L33/00, H01S3/19
Designated contracting statesDE,   FR,   GB [2000/49]
Former [1999/13]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Verfahren zur Herstellung einer optischen Halbleitervorrichtung[1999/13]
English:Method of manufacturing optical semiconductor device[1999/13]
French:Procédé pour la production d'un dispositif optique à semi-conducteur[1999/13]
Examination procedure28.02.2000Examination requested  [2000/17]
07.07.2005Despatch of a communication from the examining division (Time limit: M04)
26.09.2005Application withdrawn by applicant  [2005/47]
Fees paidRenewal fee
29.08.2000Renewal fee patent year 03
28.08.2001Renewal fee patent year 04
30.08.2002Renewal fee patent year 05
02.09.2003Renewal fee patent year 06
30.08.2004Renewal fee patent year 07
26.08.2005Renewal fee patent year 08
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Documents cited:Search[XAY]   SAKATA Y ET AL: "High-temperature characteristics for 1.3um strained MQW LDs fabricated by pulse-mode selective MOVPE", CONFERENCE ON INTEGRATED OPTICS AND OPTICAL FIBRE COMMUNICATIONS / EUROPEAN CONFERENCE ON OPTICAL COMMUNICATIONS, LONDON, UK, 22 September 1997 (1997-09-22) - 25 September 1997 (1997-09-25), pages 99 - 102, XP000874138, ISBN: 0-85296-697-0 [X] 1-4,7-9 * the whole document *[A] 12,13 [Y] 11
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