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EP About this file: EP0917854

EP0917854 - Non-contact non-invasive measuring method and apparatus [Right-click to bookmark this link]
Status	The application has been withdrawn Status updated on 06.07.2001 Database last updated on 21.08.2024
Most recent event Tooltip	06.07.2001	Withdrawal of application	published on 22.08.2001 [2001/34]
Applicant(s)	For all designated states Kyoto Dai-ichi Kagaku Co., Ltd. 57, Nishiaketa-cho Higashikujo, Minato-ku Kyoto-shi Kyoto 601 / JP
	For all designated states Kurashiki Boseki Kabushiki Kaisha 7-1, Hommachi Kurashiki-shi Okayama 710 / JP
	[N/P]
Former [1999/21]	For all designated states Kyoto Dai-ichi Kagaku Co., Ltd. 57, Nishiaketa-cho Higashikujo, Minato-ku Kyoto-shi, Kyoto 601 / JP
	For all designated states Kurashiki Boseki Kabushiki Kaisha 7-1, Hommachi Kurashiki-shi Okayama 710 / JP
Inventor(s)	01 / Kexin, Xu c/o Kyoto Dai-ichi Kagaku Co., Ltd. 57, Nishiaketa-cho, Higashikujo, Minami-ku Kyoto 601 / JP
	[1999/21]
Representative(s)	Schoppe, Fritz Schoppe, Zimmermann, Stöckeler & Zinkler Patentanwälte Postfach 246 82043 Pullach bei München / DE
	[N/P]
Former [1999/21]	Schoppe, Fritz, Dipl.-Ing. Schoppe & Zimmermann Patentanwälte Postfach 71 08 67 81458 München / DE
Application number, filing date	98120518.0	29.10.1998
	[1999/21]
Priority number, date	JP19970337913	21.11.1997 Original published format: JP 33791397
	[1999/21]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP0917854
	Date:	26.05.1999
	Language:	EN
	[1999/21]
	Type:	A3 Search report
	No.:	EP0917854
	Date:	28.07.1999
	[1999/30]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	10.06.1999
Classification	IPC:	A61B5/00, G01N21/01, G01B11/27	[1999/30]
	CPC:	A61B5/0073 (EP,US)
	Former IPC [1999/21]	A61B5/00, G01N21/01
Designated contracting states	DE, FR, GB, IT [2000/14]
Former [1999/21]	AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE
Title	German:	Berührungsloses, nichtinvasives Messverfahren und dazu geeignete Vorrichtung	[1999/21]
	English:	Non-contact non-invasive measuring method and apparatus	[1999/21]
	French:	Procédé non invasif de mesure sans contact et dispositif pour sa mise en oeuvre	[1999/21]
Examination procedure	12.01.2000	Examination requested [2000/11]
	20.06.2001	Application withdrawn by applicant [2001/34]
Fees paid	Renewal fee
	28.09.2000	Renewal fee patent year 03
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[A]JPH08299310 ;
		[A]US4701049 (BECKMAN LEO H J F [NL], et al) [A] 7 * column 1, line 10 - line 31 * * figure 4 *;
		[A]US5436455 (ROSENTHAL ROBERT D [US], et al) [A] 1,5 * abstract * * column 4, line 37 - line 51 * * column 5, line 45 - line 60 * * column 7, line 53 - line 57 * * figure 8 *;
		[A]US5572313 (ZHENG WENXIN [SE], et al) [A] 8* abstract *;
		[YA]EP0795293 (KYOTO DAIICHI KAGAKU KK [JP], et al) [Y] 1,2,4 * abstract * * column 3, line 18 - line 24 * * column 3, line 43 - line 55 * * column 4, line 50 - column 5, line 2 * * column 10, line 36 - column 11, line 21 * * column 12, line 24 - line 52 * * figures 8-10 * [A] 5,10,11;
		[DYA]EP0801297 (KYOTO DAIICHI KAGAKU KK [JP], et al) [DY] 1,2,4 * abstract * * column 1, line 34 - line 38 * * column 6, line 15 - line 43 * * column 10, line 14 - line 28 * * column 11, line 12 - line 22 * * column 12, line 56 - line 5 * * figure 1 * [A] 5,6,10,11;
		US5769076 [ ] (MAEKAWA YASUNORI [JP], et al) [ ] * abstract * * column 1, line 66 - column 2, line 22 * * column 3, line 30 - line 41 * * column 4, line 34 - line 37 * * column 4, line 45 - line 50 * * column 6, line 55 - line 60 * * figure 6 *
		[A] - PATENT ABSTRACTS OF JAPAN, (19970331), vol. 097, no. 003, & JP08299310 A 19961119 (TOA MEDICAL ELECTRONICS CO LTD;ISHIHARA KEN) [A] 1,4,6,11 * abstract *

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