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Extract from the Register of European Patents

EP About this file: EP0916958

EP0916958 - Method for the testing of an inductive resonant circuit [Right-click to bookmark this link]
Former [1999/20]Test method for an inductive resonant circuit
[2001/21]
StatusNo opposition filed within time limit
Status updated on  02.08.2002
Database last updated on 05.10.2024
Most recent event   Tooltip13.06.2008Change - representativepublished on 16.07.2008  [2008/29]
Applicant(s)For all designated states
STMicroelectronics S.A.
29, Boulevard Romain Rolland
92120 Montrouge / FR
[2001/51]
Former [1999/20]For all designated states
STMicroelectronics SA
7, avenue Gallieni
94250 Gentilly Cedex / FR
Inventor(s)01 / Enguent, Jean-Pierre
6, Place de la Libération, LA VALENTINE
13119 Saint Savournin / FR
[1999/20]
Representative(s)Bentz, Jean-Paul, et al
Novagraaf Technologies
122 Rue Edouard Vaillant
92593 Levallois-Perret Cedex / FR
[N/P]
Former [2008/29]Bentz, Jean-Paul, et al
Novagraaf Technologies 122 Rue Edouard Vaillant
92593 Levallois-Perret Cedex / FR
Former [2002/31]Bentz, Jean-Paul, et al
Cabinet Ballot 9 Boulevard de Strasbourg
83000 Toulon / FR
Former [1999/20]Ballot, Paul Denis Jacques
Cabinet Ballot-Schmit, 9, boulevard de Strasbourg
83000 Toulon / FR
Application number, filing date98121545.217.11.1998
[1999/20]
Priority number, dateFR1997001468718.11.1997         Original published format: FR 9714687
[1999/20]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report 
No.:EP0916958
Date:19.05.1999
Language:FR
[1999/20]
Type: B1 Patent specification 
No.:EP0916958
Date:26.09.2001
Language:FR
[2001/39]
Search report(s)(Supplementary) European search report - dispatched on:EP27.01.1999
ClassificationIPC:G01R31/315, G01R31/04
[1999/20]
CPC:
G01R31/315 (EP,US); G01R31/67 (EP,US); H04B17/12 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT [2000/04]
Former [1999/20]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Verfahren zum Prüfen einer induktiven Resonanzschaltung[2001/21]
English:Method for the testing of an inductive resonant circuit[2001/21]
French:Procédé de test d'un circuit résonant inductif[1999/20]
Former [1999/20]Prüfverfahren einer induktiven resonanten Schaltung
Former [1999/20]Test method for an inductive resonant circuit
Examination procedure24.06.1999Examination requested  [1999/34]
25.06.1999Request for accelerated examination filed
28.09.1999Despatch of a communication from the examining division (Time limit: M04)
28.09.1999Decision about request for accelerated examination - accepted: Yes
20.11.1999Loss of particular rights, legal effect: designated state(s)
07.02.2000Reply to a communication from the examining division
01.03.2000Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GR, IE, LU, MC, NL, PT, SE
01.12.2000Despatch of communication of intention to grant (Approval: Yes)
22.03.2001Fee for grant paid
22.03.2001Fee for publishing/printing paid
05.04.2001Communication of intention to grant the patent
Opposition(s)27.06.2002No opposition filed within time limit [2002/38]
Fees paidRenewal fee
13.11.2000Renewal fee patent year 03
Penalty fee
Penalty fee Rule 85a EPC 1973
16.12.1999AT   M01   Not yet paid
16.12.1999BE   M01   Not yet paid
16.12.1999CH   M01   Not yet paid
16.12.1999CY   M01   Not yet paid
16.12.1999DK   M01   Not yet paid
16.12.1999ES   M01   Not yet paid
16.12.1999FI   M01   Not yet paid
16.12.1999GR   M01   Not yet paid
16.12.1999IE   M01   Not yet paid
16.12.1999LU   M01   Not yet paid
16.12.1999MC   M01   Not yet paid
16.12.1999NL   M01   Not yet paid
16.12.1999PT   M01   Not yet paid
16.12.1999SE   M01   Not yet paid
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Lapses during opposition  TooltipGB26.09.2001
IT26.09.2001
[2008/12]
Former [2002/37]GB26.09.2001
Documents cited:Search[A]US4392106  (YAKOVLEV NIKOLAI I [SU], et al) [A] 1 * column 3, line 34 - column 4, line 2; figure 1 *;
 [A]US5631572  (SHEEN TIMOTHY W [US], et al) [A] 1 * claim 11 *;
 [A]JPH0647513
 [A]  - PATENT ABSTRACTS OF JAPAN, (19940524), vol. 018, no. 272, Database accession no. (M - 1610), & JP06047513 A 19940222 (SUMITOMO LIGHT METAL IND LTD) [A] 1 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.