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Extract from the Register of European Patents

EP About this file: EP0867475

EP0867475 - Epoxy resin composition to seal semiconductors and resin-sealed semiconductor device [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  23.10.2009
Database last updated on 26.06.2024
Most recent event   Tooltip10.06.2011Lapse of the patent in a contracting state
New state(s): IT
published on 13.07.2011  [2011/28]
Applicant(s)For all designated states
SUMITOMO BAKELITE CO., LTD.
5-8, Higashishinagawa 2-chome Shinagawa-ku
Tokyo 140-0002 / JP
[2008/51]
Former [2004/24]For all designated states
Sumitomo Bakelite Co., Ltd.
5-8, Higashishinagawa 2-chome Shinagawa-ku
Tokyo 140-0002 / JP
Former [1998/40]For all designated states
TORAY INDUSTRIES, INC.
2-1, Nihonbashi-Muromachi 2-chome, Chuo-ku
Tokyo 103-8666 / JP
Inventor(s)01 / Tanaka, Masayuki
258, Horagai 1-chome, Midori-ku
Nagoya-shi, Aichi, 458 / JP
02 / Tsurumi, Yumiko
706, Bell-wood Nogawa, 4162, Nogawa, Miyamae-ku
Kawasaki-shi, Kanagawa, 216 / JP
[1998/40]
Representative(s)Coleiro, Raymond, et al
Mewburn Ellis LLP
33 Gutter Lane
London EC2V 8AS / GB
[N/P]
Former [1998/40]Coleiro, Raymond, et al
MEWBURN ELLIS York House 23 Kingsway
London WC2B 6HP / GB
Application number, filing date98300448.223.01.1998
[1998/40]
Priority number, dateJP1997001072123.01.1997         Original published format: JP 1072197
[1998/40]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0867475
Date:30.09.1998
Language:EN
[1998/40]
Type: A3 Search report 
No.:EP0867475
Date:18.11.1998
[1998/47]
Type: B1 Patent specification 
No.:EP0867475
Date:17.12.2008
Language:EN
[2008/51]
Search report(s)(Supplementary) European search report - dispatched on:EP02.10.1998
ClassificationIPC:C08L63/00, C08K3/00, H01L23/29
[1998/40]
CPC:
H01L23/293 (EP,US); C08G59/62 (KR); C08G59/40 (KR);
C08G59/621 (EP,US); C08L63/00 (EP,KR,US); H01L2224/32225 (EP,US);
H01L2224/45124 (EP,US); H01L2224/48091 (EP,US); H01L2224/48227 (EP,US);
H01L2224/73265 (EP,US); H01L2924/15311 (EP,US); Y10T428/12528 (EP,US) (-)
C-Set:
C08L63/00, C08L2666/22 (US,EP);
C08L63/00, C08L61/04 (EP,US);
H01L2224/45124, H01L2924/00 (EP,US);
H01L2224/48091, H01L2924/00014 (US,EP);
H01L2224/73265, H01L2224/32225, H01L2224/48227, H01L2924/00 (US,EP);
H01L2924/15311, H01L2224/73265, H01L2224/32225, H01L2224/48227, H01L2924/00 (EP,US)
(-)
Designated contracting statesDE,   FR,   GB,   IE,   IT,   NL [1999/30]
Former [1998/40]AT,  BE,  CH,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Epoxidharzzusammensetzung geeignet zur Verkapselung von Halbleiteranordnungen und harzverkapselte Halbleiteranordnungen[1998/40]
English:Epoxy resin composition to seal semiconductors and resin-sealed semiconductor device[1998/40]
French:Composition de résine époxyde utilisable pour l'encapsulation de sémiconducteurs et sémiconducteurs encapsulés par une résine[1998/40]
Examination procedure01.02.1999Examination requested  [1999/13]
11.08.2004Despatch of a communication from the examining division (Time limit: M06)
10.02.2005Reply to a communication from the examining division
25.11.2005Despatch of a communication from the examining division (Time limit: M04)
30.03.2006Reply to a communication from the examining division
25.06.2008Communication of intention to grant the patent
28.10.2008Fee for grant paid
28.10.2008Fee for publishing/printing paid
Opposition(s)18.09.2009No opposition filed within time limit [2009/48]
Fees paidRenewal fee
24.01.2000Renewal fee patent year 03
23.01.2001Renewal fee patent year 04
22.01.2002Renewal fee patent year 05
22.01.2003Renewal fee patent year 06
22.01.2004Renewal fee patent year 07
24.01.2005Renewal fee patent year 08
24.01.2006Renewal fee patent year 09
23.01.2007Renewal fee patent year 10
22.01.2008Renewal fee patent year 11
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipIT17.12.2008
NL17.12.2008
IE23.01.2009
FR17.02.2009
GB17.03.2009
[2011/28]
Former [2010/28]NL17.12.2008
IE23.01.2009
FR17.02.2009
GB17.03.2009
Former [2010/07]NL17.12.2008
IE23.01.2009
Former [2009/30]NL17.12.2008
Documents cited:Search[X]EP0749996  (TORAY INDUSTRIES [JP]) [X] 1-20 * page 5, line 18 - line 21; example -; claim - *;
 [X]DE4408176  (SEL ALCATEL AG [DE]) [X] 1-20 * column 2, line 27 - line 28; claim - *;
 [X]EP0511833  (ROHM & HAAS [US]) [X] 1-20 * example -; claim - *;
 [X]EP0751561  (HITACHI CHEMICAL CO LTD [JP]) [X] 1,21,22 * figure -; example -; claim - *;
 [X]EP0676806  (SGS THOMSON MICROELECTRONICS [US]) [X] 1,21,22 * figure -; claim - *
 [X]  - REHME F ET AL, "CHIPGEHAUSE IM WERKSTOFFTEST", F & M. FEINWERKTECHNIK MIKROTECHNIK MESSTECHNIK, (19950801), vol. 103, no. 7/08, pages 425 - 428, XP000524175 [X] 1-20 * page 425; figure . *
 [X]  - ROBINSON D ET AL, "GLOB TOP ENCAPSULATION OF LARGE DIE ON MCM-L", INTERNATIONAL JOURNAL OF MICROCIRCUITS AND ELECTRONIC PACKAGING, (19920101), vol. 15, no. 4, pages 213 - 228, XP000303596 [X] 1-20 * The whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.