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EP0902482

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Extract from the Register of European Patents

EP About this file: EP0902482

EP0902482 - SOI-MOSFET and fabrication process thereof [Right-click to bookmark this link]
Status	No opposition filed within time limit Status updated on 23.07.2004 Database last updated on 19.10.2024
Most recent event Tooltip	23.07.2004	No opposition filed within time limit	published on 08.09.2004 [2004/37]
Applicant(s)	For all designated states Sharp Kabushiki Kaisha 22-22, Nagaike-cho Abeno-ku Osaka-shi, Osaka 545-8522 / JP
	[N/P]
Former [2003/38]	For all designated states Sharp Kabushiki Kaisha 22-22, Nagaike-cho, Abeno-ku Osaka-shi, Osaka 545-8522 / JP
Former [1999/11]	For all designated states Sharp Kabushiki Kaisha 22-22, Nagaike-cho, Abeno-ku Osaka 545-8522 / JP
Inventor(s)	01 / Adan, Alberto O. 1-30, Hikarioka 3-chome Ikoma-shi, Nara 630-0141 / JP
	[1999/11]
Representative(s)	Brown, Kenneth Richard, et al R.G.C. Jenkins & Co 26 Caxton Street London SW1H 0RJ / GB
	[N/P]
Former [1999/11]	Brown, Kenneth Richard, et al R.G.C. Jenkins & Co. 26 Caxton Street London SW1H 0RJ / GB
Application number, filing date	98305138.4	29.06.1998
	[1999/11]
Priority number, date	JP19970241482	05.09.1997 Original published format: JP 24148297
	[1999/11]
Filing language	EN
Procedural language	EN
Publication	Type:	A1 Application with search report
	No.:	EP0902482
	Date:	17.03.1999
	Language:	EN
	[1999/11]
	Type:	B1 Patent specification
	No.:	EP0902482
	Date:	17.09.2003
	Language:	EN
	[2003/38]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	28.12.1998
Classification	IPC:	H01L29/786, H01L29/10, H01L21/336, H01L21/265	[1999/11]
	CPC:	H01L29/66772 (EP,KR,US); H01L29/78612 (EP,KR,US); H01L21/26586 (EP,KR,US)
Designated contracting states	DE, FR, GB, NL [1999/48]
Former [1999/11]	AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE
Title	German:	SOI-MOSFET und Verfahren zu dessen Herstellung	[1999/11]
	English:	SOI-MOSFET and fabrication process thereof	[1999/11]
	French:	MOSFET SOI et procédé de fabrication correspondant	[1999/11]
Examination procedure	02.07.1999	Examination requested [1999/35]
	18.09.1999	Loss of particular rights, legal effect: designated state(s)
	27.01.2000	Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GR, IE, IT, LI, LU, MC, PT, SE
	20.03.2000	Despatch of a communication from the examining division (Time limit: M04)
	24.07.2000	Reply to a communication from the examining division
	27.02.2002	Despatch of communication of intention to grant (Approval: No)
	06.05.2002	Despatch of communication of intention to grant (Approval: later approval)
	22.05.2002	Communication of intention to grant the patent
	04.09.2002	Fee for grant paid
	04.09.2002	Fee for publishing/printing paid
Opposition(s)	18.06.2004	No opposition filed within time limit [2004/37]
Request for further processing for:	04.09.2002	Request for further processing filed
	04.09.2002	Full payment received (date of receipt of payment) Request granted
	23.09.2002	Decision despatched
Fees paid	Renewal fee
	13.06.2000	Renewal fee patent year 03
	13.06.2001	Renewal fee patent year 04
	12.06.2002	Renewal fee patent year 05
	12.06.2003	Renewal fee patent year 06
	Penalty fee
	Penalty fee Rule 85a EPC 1973
	15.11.1999	AT M01 Not yet paid
	15.11.1999	BE M01 Not yet paid
	15.11.1999	CH M01 Not yet paid
	15.11.1999	CY M01 Not yet paid
	15.11.1999	DK M01 Not yet paid
	15.11.1999	ES M01 Not yet paid
	15.11.1999	FI M01 Not yet paid
	15.11.1999	GR M01 Not yet paid
	15.11.1999	IE M01 Not yet paid
	15.11.1999	IT M01 Not yet paid
	15.11.1999	LU M01 Not yet paid
	15.11.1999	MC M01 Not yet paid
	15.11.1999	PT M01 Not yet paid
	15.11.1999	SE M01 Not yet paid
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[XY]US5296727 (KAWAI SHINICHI [JP], et al) [X] 1-4,6 * column 6, line 26 - column 7, line 21; figures 5A-5G * [Y] 5,7-11;
		[YA]US4965213 (BLAKE TERENCE G W [US]) [Y] 5,8 * column 3, line 4 - column 4, line 7; figures 1,2 * [A] 6;
		[YA]US5463237 (FUNAKI MASAKI [JP]) [Y] 7-11 * column 9, line 18 - column 11, line 45; figures 1-7 * * column 12, line 22 - line 61; figures 11,12 * * figure 33 * [A] 1,3,4,6;
		[A]JPS5678156 ;
		[A]JPH05218425 ;
		[DA]JPS62133762 ;
		[DA]JPH02178965
		[A] - PATENT ABSTRACTS OF JAPAN, (19810912), vol. 005, no. 145, Database accession no. (E - 074), & JP56078156 A 19810626 (FUJITSU LTD) [A] 1-3
		[A] - PATENT ABSTRACTS OF JAPAN, (19931206), vol. 017, no. 657, Database accession no. (E - 1470), & JP05218425 A 19930827 (NIPPON TELEGR & TELEPH CORP) [A] 1-4,7,9-11 * abstract *
		[DA] - PATENT ABSTRACTS OF JAPAN, (19871121), vol. 011, no. 359, Database accession no. (E - 559), & JP62133762 A 19870616 (HITACHI LTD) [DA] 1,2,4,7,9,11 * abstract *
		[DA] - PATENT ABSTRACTS OF JAPAN, (19900926), vol. 014, no. 448, Database accession no. (E - 0983), & JP02178965 A 19900711 (NIPPON DENSO CO LTD ET AL) [DA] 1,7 * abstract *

The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.

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