Extract from the Register of European Patents

EP About this file: EP0893820

EP0893820 - Anisotropic chemical etching process of silicon oxide in the manufacture of MOS transistor flash EPROM devices [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  22.04.2005
Database last updated on 21.03.2026
Most recent event   Tooltip23.11.2007Change - applicantpublished on 26.12.2007  [2007/52]
Applicant(s)For:DE  FR  GB  NL 
Texas Instruments Incorporated
13500 North Central Expressway
Dallas, Texas 75265 / US
For:IT 
Consorzio Eagle
Via Nobel 13
67051 Avezzano (AQ) / IT
[2007/52]
Former [2004/27]For:DE  FR  GB  NL  AT  BE  CH  CY  DK  ES  FI  GR  IE  LU  MC  PT  SE  LI 
TEXAS INSTRUMENTS INCORPORATED
13500 North Central Expressway
Dallas Texas 75265 / US
For:IT 
Consorzio Eagle
Via Nobel 13
67051 Avezzano (AQ) / IT
Former [1999/04]For:BE  CH  DE  DK  ES  FI  FR  GB  GR  IE  IT  LI  LU  MC  NL  AT 
TEXAS INSTRUMENTS INCORPORATED
13500 North Central Expressway
Dallas Texas 75265 / US
For all designated states
Consorzio Eagle
Via Nobel 13
67051 Avezzano (AQ) / IT
Inventor(s)01 / Russo, Felice
Via Infante 7
67051 Avezzano / IT
02 / Miccoli, Giuseppe
868 Arbor Downs Drive Plano
Texas 75023 / US
03 / Torsi, Alessandro
Via Adolfo Infante 13
Avezzano / IT
04 / Chintapalli, Koteswara Rao
Via P.NTI Mattarella 4
Avezzano / IT
05 / Cautiero, Giuseppe
Via Treves 12
Avezzano / IT
[1999/06]
Representative(s)Darby, David Thomas, et al
Abel & Imray, 20 Red Lion Street
London WC1R 4PQ / GB
[N/P]
Former [1999/04]Darby, David Thomas, et al
Abel & Imray Northumberland House 303-306 High Holborn
London WC1V 7LH / GB
Application number, filing date98305602.914.07.1998
[1999/04]
Priority number, dateIT1997RM0043014.07.1997         Original published format: IT RM970430
[1999/04]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0893820
Date:27.01.1999
Language:EN
[1999/04]
Type: A3 Search report 
No.:EP0893820
Date:29.10.2003
[2003/44]
Search report(s)(Supplementary) European search report - dispatched on:EP17.09.2003
ClassificationIPC:H01L21/311, H01L21/314, H01L21/8247, H01L27/115, H01L21/336
[2003/43]
CPC:
H10P50/73 (EP,US); H10B41/30 (EP,KR,US); H10P14/662 (EP,US)
Former IPC [1999/04]H01L21/311, H01L21/314, H01L21/8247
Designated contracting statesDE,   FR,   GB,   IT,   NL [2004/30]
Former [1999/04]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Anisotropisches chemisches Ätzverfahren von Siliziumoxid in der Herstellung von MOS Transistor Flash EPROM Anordnungen[1999/04]
English:Anisotropic chemical etching process of silicon oxide in the manufacture of MOS transistor flash EPROM devices[1999/04]
French:Procédé d'attaque chimique anisotrope d'oxyde de silicium dans la fabrication de dispositifs flash EPROM à transistors MOS[1999/04]
Examination procedure29.04.2004Examination requested  [2004/27]
13.07.2004Despatch of a communication from the examining division (Time limit: M04)
24.11.2004Application deemed to be withdrawn, date of legal effect  [2005/23]
12.01.2005Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2005/23]
Fees paidRenewal fee
12.07.2000Renewal fee patent year 03
31.01.2002Renewal fee patent year 04
26.09.2002Renewal fee patent year 05
31.07.2003Renewal fee patent year 06
02.08.2004Renewal fee patent year 07
Penalty fee
Additional fee for renewal fee
31.07.200104   M06   Fee paid on   31.01.2002
31.07.200205   M06   Fee paid on   26.09.2002
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