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EP0919804
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EP About this file: EP0919804
| EP0919804 - Inspection system for planar object [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 31.12.2004 Database last updated on 04.06.2024 | Most recent event Tooltip | 31.12.2004 | Application deemed to be withdrawn | published on 16.02.2005 [2005/07] | Applicant(s) | For all designated states Agilent Technologies, Inc. (A Delaware Corporation) 395 Page Mill Road Palo Alto CA 94303 / US | [N/P] |
| Former [2001/41] | For all designated states Agilent Technologies, Inc. (a Delaware corporation) 395 Page Mill Road Palo Alto, CA 94303 / US | ||
| Former [2001/32] | For all designated states Agilent Technologies Inc. a Delaware Corporation 395 Page Mill Road Palo Alto, CA 94303 / US | ||
| Former [2001/31] | For all designated states Agilent Technologies Inc. a Delaware Corporation 395 Page Mill Road Palo Alto, CA 94303 / US | ||
| Former [2001/16] | For all designated states Agilent Technologies, Inc. 395 Page Mill Road Palo Alto, CA 94303 / US | ||
| Former [1999/22] | For all designated states Hewlett-Packard Company 3000 Hanover Street Palo Alto, California 94304 / US | Inventor(s) | 01 /
Toh, Peng Seng 35, Jurong East Avenue 1, No. 07-05 Parc Oasis 609774 / SG | [1999/22] | Representative(s) | Jehan, Robert, et al Williams Powell 44 Prospect Place Bromley, Kent BR2 9HN / GB | [N/P] |
| Former [1999/22] | Jehan, Robert, et al Williams, Powell & Associates, 4 St Paul's Churchyard London EC4M 8AY / GB | Application number, filing date | 98309393.1 | 17.11.1998 | [1999/22] | Priority number, date | SG19970004179 | 01.12.1997 Original published format: SG 9704179 | [1999/22] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP0919804 | Date: | 02.06.1999 | Language: | EN | [1999/22] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 01.04.1999 | Classification | IPC: | G01N21/88 | [1999/22] | CPC: |
G01N21/88 (EP,US)
| Designated contracting states | BE, CH, DE, LI, NL [2000/07] |
| Former [1999/22] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Flachobjektinspektionssystem | [1999/22] | English: | Inspection system for planar object | [1999/22] | French: | Système d'inspection d'objet plan | [1999/22] | Examination procedure | 29.11.1999 | Examination requested [2000/04] | 03.12.1999 | Loss of particular rights, legal effect: designated state(s) | 22.03.2000 | Despatch of communication of loss of particular rights: designated state(s) FR | 29.03.2004 | Despatch of a communication from the examining division (Time limit: M04) | 10.08.2004 | Application deemed to be withdrawn, date of legal effect [2005/07] | 14.09.2004 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2005/07] | Fees paid | Renewal fee | 03.11.2000 | Renewal fee patent year 03 | 22.11.2001 | Renewal fee patent year 04 | 25.11.2002 | Renewal fee patent year 05 | 21.11.2003 | Renewal fee patent year 06 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 13.01.2000 | FR M01 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]JPH0359446 ; | [XA]US4686565 (ANDO MORITOSHI [JP]) [X] 1,10 * column 5, line 36 - column 6, line 54; figure 5 * [A] 11; | [A]US4696047 (CHRISTIAN DONALD J [US], et al) [A] 1,10,11 * column 2, line 34 - column 3, line 10; figure 2 *; | [A]US5185811 (BEERS GREGORY E [US], et al) [A] 1,4-6,10,11 * column 2, line 66 - column 3, line 15; figure 1 *; | [XA]US5563703 (LEBEAU CHRISTOPHER J [US], et al) [X] 1,2,10 * column 2, line 20 - column 4, line 20; figures 3,4 * [A] 11 | [A] - PATENT ABSTRACTS OF JAPAN, (19910531), vol. 015, no. 214, Database accession no. (P - 1209), & JP03059446 A 19910314 (NEC CORP) [A] 1 * abstract * |