Extract from the Register of European Patents

EP About this file: EP0909957

EP0909957 - Measuring signals in a tester system [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  14.04.2006
Database last updated on 21.03.2026
Most recent event   Tooltip21.11.2008Change - lapse in a contracting state
Updated state(s): FR
published on 24.12.2008  [2008/52]
Applicant(s)For all designated states
SCHLUMBERGER TECHNOLOGIES, INC.
1601 Technology Drive San Jose
California 95110-1397 / US
[N/P]
Former [1999/16]For all designated states
SCHLUMBERGER TECHNOLOGIES, INC.
1601 Technology Drive
San Jose, California 95110-1397 / US
Inventor(s)01 / West, G Burnell
46750 Sentinel Drive
Fremont, California 94539 / US
[1999/16]
Representative(s)Hirsch & Associés
154 Boulevard Haussmann
75008 Paris / FR
[N/P]
Former [2002/42]Cabinet Hirsch
34, Rue de Bassano
75008 Paris / FR
Former [1999/16]Lemoyne, Didier
Schlumberger Industries, Test & Transactions, BP 620-04
92542 Montrouge-Cedex / FR
Application number, filing date98402555.114.10.1998
[1999/16]
Priority number, dateUS1997094974714.10.1997         Original published format: US 949747
[1999/16]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0909957
Date:21.04.1999
Language:EN
[1999/16]
Type: A3 Search report 
No.:EP0909957
Date:14.07.1999
[1999/28]
Type: B1 Patent specification 
No.:EP0909957
Date:08.06.2005
Language:EN
[2005/23]
Search report(s)(Supplementary) European search report - dispatched on:EP01.06.1999
ClassificationIPC:G04F10/04
[2004/20]
CPC:
G01R31/31922 (EP,US); G06F11/22 (KR); G01R31/31937 (EP,US)
Former IPC [1999/27]G01R31/319, G04F10/04
Former IPC [1999/16]G01R31/319
Designated contracting statesDE,   FR,   IT [2000/12]
Former [1999/16]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Messsignale in einem Testsystem[2005/04]
English:Measuring signals in a tester system[1999/16]
French:Signaux de mesure dans un système de test[1999/16]
Former [1999/16]Messsignalen in einem Testsystem
Examination procedure03.09.1999Examination requested  [1999/44]
24.03.2004Despatch of a communication from the examining division (Time limit: M06)
28.09.2004Reply to a communication from the examining division
25.10.2004Despatch of a communication from the examining division (Time limit: M04)
23.11.2004Reply to a communication from the examining division
22.12.2004Communication of intention to grant the patent
29.03.2005Fee for grant paid
29.03.2005Fee for publishing/printing paid
Opposition(s)09.03.2006No opposition filed within time limit [2006/22]
Fees paidRenewal fee
20.09.2000Renewal fee patent year 03
21.09.2001Renewal fee patent year 04
15.10.2002Renewal fee patent year 05
06.10.2003Renewal fee patent year 06
06.10.2004Renewal fee patent year 07
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Lapses during opposition  TooltipFR08.06.2005
IT08.06.2005
DE09.09.2005
[2008/52]
Former [2008/40]IT08.06.2005
DE09.09.2005
FR31.10.2005
Former [2008/15]IT08.06.2005
DE09.09.2005
Former [2006/35]DE09.09.2005
Documents cited:Search[XA]   PROF. DR. JOZEF KALISZ, DR. MICHAL PAWLOWSKI, DR RYSZARD PELKA: "Przisions-Zeitintervall-Messsystem", ELEKTRONIK, vol. 37, no. 14, 8 July 1988 (1988-07-08), Mnchen, pages 65 - 68, XP002100936
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