EP0995227 - A CONTROLLED CLEAVAGE PROCESS [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 10.04.2015 Database last updated on 02.09.2024 | Most recent event Tooltip | 10.04.2015 | Application deemed to be withdrawn | published on 13.05.2015 [2015/20] | Applicant(s) | For all designated states Silicon Genesis Corporation 590 Division Street Campbell, CA 95008 / US | [2000/17] | Inventor(s) | 01 /
HENLEY, Francois, J. 24580 Skyland Road Los Gatos, CA 95030 / US | 02 /
CHEUNG, Nathan, W. 1145 Stannage Avenue Albany, CA 94706 / US | [2000/17] | Representative(s) | Clark, Jane Anne, et al Mathys & Squire The Shard 32 London Bridge Street London SE1 9SG / GB | [N/P] |
Former [2007/50] | Clark, Jane Anne, et al Mathys & Squire 120 Holborn London EC1N 2SQ / GB | ||
Former [2000/17] | Kazi, Ilya, et al Mathys & Squire, 100 Gray's Inn Road London WC1X 8AL / GB | Application number, filing date | 98924756.4 | 11.05.1998 | [2000/17] | WO1998US09567 | Priority number, date | US19970046276P | 12.05.1997 Original published format: US 46276 P | US19980026115 | 19.02.1998 Original published format: US 26115 | US19980026027 | 19.02.1998 Original published format: US 26027 | [2000/17] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO9852216 | Date: | 19.11.1998 | Language: | EN | [1998/46] | Type: | A1 Application with search report | No.: | EP0995227 | Date: | 26.04.2000 | Language: | EN | The application published by WIPO in one of the EPO official languages on 19.11.1998 takes the place of the publication of the European patent application. | [2000/17] | Search report(s) | International search report - published on: | US | 19.11.1998 | (Supplementary) European search report - dispatched on: | EP | 18.05.2000 | Classification | IPC: | H01L21/304, H01L21/20, H01L21/762, B26F3/00, B26D3/28, H01L21/425 | [2000/27] | CPC: |
B26D3/28 (EP);
B26F3/00 (EP);
B26F3/002 (EP);
H01L21/26506 (EP);
H01L27/1203 (EP)
|
Former IPC [2000/17] | H01L21/425 | Designated contracting states | DE, FR, GB, IE, IT, NL [2000/17] | Title | German: | KONTROLLIERTES SPALTUNGSVERFAHREN | [2000/17] | English: | A CONTROLLED CLEAVAGE PROCESS | [2000/17] | French: | PROCEDE DE CLIVAGE CONTROLE | [2000/17] | Entry into regional phase | 10.12.1999 | National basic fee paid | 10.12.1999 | Search fee paid | 10.12.1999 | Designation fee(s) paid | 10.12.1999 | Examination fee paid | Examination procedure | 08.12.1998 | Request for preliminary examination filed International Preliminary Examining Authority: US | 10.12.1999 | Examination requested [2000/17] | 21.09.2007 | Despatch of a communication from the examining division (Time limit: M06) | 31.03.2008 | Reply to a communication from the examining division | 11.04.2013 | Despatch of a communication from the examining division (Time limit: M04) | 21.08.2013 | Reply to a communication from the examining division | 02.12.2014 | Application deemed to be withdrawn, date of legal effect [2015/20] | 09.01.2015 | Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [2015/20] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 21.09.2007 | Fees paid | Renewal fee | 10.12.1999 | Renewal fee patent year 03 | 20.04.2001 | Renewal fee patent year 04 | 21.05.2002 | Renewal fee patent year 05 | 26.05.2003 | Renewal fee patent year 06 | 04.06.2004 | Renewal fee patent year 07 | 19.05.2005 | Renewal fee patent year 08 | 30.05.2006 | Renewal fee patent year 09 | 30.05.2007 | Renewal fee patent year 10 | 08.02.2008 | Renewal fee patent year 11 | 26.05.2009 | Renewal fee patent year 12 | 27.05.2010 | Renewal fee patent year 13 | 31.05.2011 | Renewal fee patent year 14 | 29.05.2012 | Renewal fee patent year 15 | 29.05.2013 | Renewal fee patent year 16 | Penalty fee | Additional fee for renewal fee | 31.05.2004 | 07   M06   Fee paid on   04.06.2004 | 31.05.2014 | 17   M06   Not yet paid |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US4466852 (BELTZ RICHARD K [US], et al) [A] 1,6,7,13,17-23 * column 1, line 6 - line 20 * * column 1, line 58 - column 2, line 33 * * column 3, line 6 - line 33 * * column 5, line 34 - column 6, line 59; figures 6-8 * * column 7, line 12 - line 27 * * column 8, line 27 - line 37 *; | [YA]EP0397237 (PHILIPS NV [NL]) [Y] 8,9 * column 1, line 1 - line 9 * * column 3, line 47 - column 4, line 35; figures 1-4 * * column 5, line 5 - line 18; figure 6 * * column 5, line 28 - line 35 * [A] 1-7,13,17; | [A]US5213451 (FRANK WALTER [DE], et al) [A] 1,6,7,13,17-23 * column 1, line 7 - line 12 * * column 2, line 13 - line 43 * * column 2, line 62 - column 3, line 43; figure 1 * * column 4, line 53 - column 5, line 46 *; | [XY]EP0703609 (COMMISSARIAT ENERGIE ATOMIQUE [FR]) [X] 1-7,10-15,17,18 * column 1, line 5 - line 14 * * column 2, line 38 - column 3, line 24 * * column 3, line 46 - column 4, line 6 * * column 4, line 22 - line 30 * * column 5, line 6 - line 25 * * column 6, line 19 - line 23; figure 1 * * column 6, line 34 - line 56; figure 2 * * column 7, line 9 - line 43; figure 3 * [Y] 8,9; | [PX]EP0793263 (CANON KK [JP]) [PX] 1-7,10-15,17 * column 1, line 7 - line 36 * * column 6, line 29 - column 7, line 23; figures 17-19 * * column 18, line 15 - column 19, line 36; figures 4-7 * * column 22, line 35 - column 23, line 6 * * column 30, line 50 - column 31, line 19 * * column 44, line 43 - column 45, line 6 *; | [E]EP0843344 (CANON KK [JP]) [E] 1-7,10-15,17 * column 7, line 26 - column 8, line 27; figures 5A-5C * * column 8, line 36 - line 48 * * column 10, line 16 - line 43 * * column 12, line 10 - column 13, line 2 * * column 13, line 34 - column 14, line 24; figures 1A-1E *; | [E]EP0867921 (CANON KK [JP]) [E] 1-7,10-15,17 * column 10, line 6 - column 11, line 16; figures 1A-1D * * column 12, line 48 - column 13, line 21 * * column 15, line 39 - column 16, line 13; figure 2D *; | [A] - LU X ET AL, "SOI MATERIAL TECHNOLOGY USING PLASMA IMMERSION ION IMPLANTATION", PROCEEDINGS OF THE ANNUAL SOS/SOI TECHNOLOGY CONFERENCE. (FROM 1991 PROCEEDINGS OF THE INTERNATIONAL SOI CONFERENCE.) SILICON-ON-INSULATOR TECHNOLOGY AND DEVICES,US,NEW YORK, NY: IEEE, (1996), ISBN 0-7803-3316-0, pages 48 - 49, XP000736841 [A] 1-7,10-17 * the whole document * | International search | [A]US4982090 (WITTMAACK KLAUS [DE]); | [A]US5242861 (INABA TAKASHI [JP]); | [A]US5269880 (JOLLY GURVINDER [CA], et al); | [A] - INSPEC, (19000101), Database accession no. 73:481970, XP002910169 | by applicant | EP0703609 |