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Extract from the Register of European Patents

EP About this file: EP1007904

EP1007904 - METHOD AND DEVICE FOR MEASURING AN ENVELOPE SURFACE [Right-click to bookmark this link]
Former [2000/24]METHOD AND MEASURING DEVICE FOR MEASURING AT AN ENVELOPE SURFACE
[2004/36]
StatusNo opposition filed within time limit
Status updated on  13.01.2006
Database last updated on 12.10.2024
Most recent event   Tooltip13.01.2006No opposition filed within time limitpublished on 01.03.2006  [2006/09]
Applicant(s)For all designated states
Metso Paper, Inc.
Fabianinkatu 9 A
00130 Helsinki / FI
[2004/52]
Former [2002/02]For all designated states
Metso Paper Karlstad Aktiebolag
Box 1014
651 15 Karlstad / SE
Former [2000/24]For all designated states
Valmet-Karlstad AB
Box 1014
651 15 Karlstad / SE
Inventor(s)01 / ROSBERG, Lars, Tomas, Ragnar
Petersbergsgatan 32 A
S-653 44 Karlstad / SE
02 / STARK, Mats, Ola
Engholmsgatan 28B
S-652 21 Karlstad / SE
[2000/28]
Former [2000/24]01 / ROSBERG, Lars, Tomas, Ragnar
Oldevigsgatan 1
S-652 30 Karlstad / SE
02 / STARK, Mats, Ola
Engholmsgatan 28B
S-652 21 Karlstad / SE
Representative(s)Lundquist, Lars-Olof, et al
L-O Lundquist Patentbyra AB
Box 80
651 03 Karlstad / SE
[N/P]
Former [2004/52]Lundquist, Lars-Olof, et al
L-O Lundquist Patentbyra AB, Box 80
651 03 Karlstad / SE
Former [2000/24]Lundquist, Lars-Olof
L-O Lundquist Patentbyra AB, Box 80
651 03 Karlstad / SE
Application number, filing date98939039.813.08.1998
[2000/24]
WO1998SE01465
Priority number, dateSE1997000294522.08.1997         Original published format: SE 9702945
[2000/24]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO9910708
Date:04.03.1999
Language:EN
[1999/09]
Type: A1 Application with search report 
No.:EP1007904
Date:14.06.2000
Language:EN
The application published by WIPO in one of the EPO official languages on 04.03.1999 takes the place of the publication of the European patent application.
[2000/24]
Type: B1 Patent specification 
No.:EP1007904
Date:09.03.2005
Language:EN
[2005/10]
Search report(s)International search report - published on:SE04.03.1999
ClassificationIPC:G01B11/24, G01B11/30
[2000/24]
CPC:
G01B11/2408 (EP)
Designated contracting statesAT,   DE,   GB [2000/24]
TitleGerman:VERFAHREN UND VORRICHTUNG ZUM MESSEN EINER AUSSENOBERFLÄCHE[2000/24]
English:METHOD AND DEVICE FOR MEASURING AN ENVELOPE SURFACE[2004/36]
French:PROCEDE ET DISPOSITIF DE MESURE D'UNE SURFACE EXTERIEURE[2000/24]
Former [2000/24]METHOD AND MEASURING DEVICE FOR MEASURING AT AN ENVELOPE SURFACE
Entry into regional phase04.02.2000National basic fee paid 
04.02.2000Designation fee(s) paid 
04.02.2000Examination fee paid 
Examination procedure12.02.1999Request for preliminary examination filed
International Preliminary Examining Authority: SE
04.02.2000Examination requested  [2000/24]
17.09.2004Communication of intention to grant the patent
03.01.2005Fee for grant paid
03.01.2005Fee for publishing/printing paid
Opposition(s)12.12.2005No opposition filed within time limit [2006/09]
Fees paidRenewal fee
16.08.2000Renewal fee patent year 03
14.08.2001Renewal fee patent year 04
14.08.2002Renewal fee patent year 05
13.08.2003Renewal fee patent year 06
12.08.2004Renewal fee patent year 07
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Cited inInternational search[A]US3923402  (TURCOTTE PAUL);
 [A]US4725738  (LYSEN HEINRICH [DE]);
 [A]WO9604423  (WANGNER SYSTEMS CORP [US]);
 [A]US5587051  (OSTERMAYER VOLKER [US], et al);
 [A]US5605097  (RUCKL SIEGFRIED [AT], et al)
ExaminationUS5617645
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.