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Extract from the Register of European Patents

EP About this file: EP0969501

EP0969501 - Method of making power semiconductor components [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  25.08.2006
Database last updated on 11.09.2024
Most recent event   Tooltip25.08.2006No opposition filed within time limitpublished on 27.09.2006  [2006/39]
Applicant(s)For all designated states
SEMIKRON Elektronik GmbH & Co. KG
Sigmundstrasse 200
90431 Nürnberg / DE
[2005/34]
Former [2000/01]For all designated states
Semikron Elektronik GmbH
Postfach 82 02 51
D-90253 Nürnberg / DE
Inventor(s)01 / Herzer, Reinhard, Dr. habil.
Gartenstrasse 4
98693 Ilmenau / DE
02 / Netzel, Mario, Dr.
Heinrich-Heine-Strasse 29
0642 Branunsbedra / DE
[2000/01]
Application number, filing date99112146.824.06.1999
[2000/01]
Priority number, dateDE199812961402.07.1998         Original published format: DE 19829614
[2000/01]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0969501
Date:05.01.2000
Language:DE
[2000/01]
Type: B1 Patent specification 
No.:EP0969501
Date:19.10.2005
Language:DE
[2005/42]
Search report(s)(Supplementary) European search report - dispatched on:EP05.11.1999
ClassificationIPC:H01L21/331, H01L21/332, H01L21/329
[2000/01]
CPC:
H01L29/66136 (EP); H01L29/66333 (EP); H01L29/66363 (EP);
H01L29/66378 (EP)
Designated contracting statesAT,   CH,   DE,   ES,   FR,   GB,   IT,   LI,   SE [2000/37]
Former [2000/01]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Verfahren zur Herstellung von Leistungshalbleiterbauelementen[2000/01]
English:Method of making power semiconductor components[2000/01]
French:Méthode de fabrication de composants de puissance semi-conducteurs[2000/01]
Examination procedure17.12.1999Examination requested  [2000/09]
17.01.2002Despatch of a communication from the examining division (Time limit: M04)
14.05.2002Reply to a communication from the examining division
20.12.2004Despatch of a communication from the examining division (Time limit: M04)
20.04.2005Reply to a communication from the examining division
18.07.2005Communication of intention to grant the patent
28.07.2005Fee for grant paid
28.07.2005Fee for publishing/printing paid
Opposition(s)20.07.2006No opposition filed within time limit [2006/39]
Fees paidRenewal fee
17.04.2001Renewal fee patent year 03
15.04.2002Renewal fee patent year 04
11.04.2003Renewal fee patent year 05
07.05.2004Renewal fee patent year 06
15.04.2005Renewal fee patent year 07
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Documents cited:Search[Y]JPH021985  ;
 [Y]EP0313000  (SIEMENS AG [DE]) [Y] 1-5 * page 3, line 25 - line 43; figure 1 *;
 [DY]EP0330122  (SIEMENS AG [DE]) [DY] 5* column 3, line 20 - line 32; figure 1 *
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19900313), vol. 014, no. 133, Database accession no. (E - 0902), & JP02001985 A 19900108 (MITSUBISHI ELECTRIC CORP) [Y] 1-5 * abstract *
ExaminationJPS60145660
    - PATENT ABSTRACTS OF JAPAN, (19851206), vol. 009, no. 310, Database accession no. (E - 364), & JP60145660 A 19850801 (MITSUBISHI DENKI KK)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.