blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability
Register Forum

2022.02.11

More...
blank News flashes

News flashes

New version of the European Patent Register - SPC information for Unitary Patents.

2024-03-06

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1091208

EP1091208 - Method and apparatus for thermally analyzing a material [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  05.09.2003
Database last updated on 26.06.2024
Most recent event   Tooltip05.09.2008Change - representativepublished on 08.10.2008  [2008/41]
Applicant(s)For all designated states
Mettler-Toledo GmbH
Im Langacher
8606 Greifensee / CH
[2001/15]
Inventor(s)01 / Schawe, Jürgen Dr.
Burgstrasse 6
8604 Volketswil / CH
02 / Alig, Ingo Dr.
Meisenweg 22
64331 Weiterstadt / DE
03 / Lellinger, Dirk Dr.
Haydnstr. 11
64331 Weiterstadt / DE
 [2001/15]
Representative(s)Leinweber & Zimmermann
Patentanwalts-PartG mbB
European Patent Attorneys
Viktualienmarkt 8
80331 München / DE
[N/P]
Former [2008/41]Leinweber & Zimmermann
European Patent Attorneys Patentanwälte Rosental 7
80331 München / DE
Former [2001/15]Patentanwälte Leinweber & Zimmermann
Rosental 7, II Aufgang
80331 München / DE
Application number, filing date99118982.027.09.1999
[2001/15]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1091208
Date:11.04.2001
Language:EN
[2001/15]
Type: B1 Patent specification 
No.:EP1091208
Date:30.10.2002
Language:EN
[2002/44]
Search report(s)(Supplementary) European search report - dispatched on:EP10.03.2000
ClassificationIPC:G01N25/48
[2001/15]
CPC:
G01N25/4833 (EP,US)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [2001/15]
TitleGerman:Verfahren und Vorrichtung für die thermische Analyse eines Materials[2002/17]
English:Method and apparatus for thermally analyzing a material[2001/15]
French:Procédé et dispositif d'analyse thermique d'un matériau[2001/15]
Former [2001/15]Verfahren und Vorrichtung für die Thermalanalyse eines Materials
Examination procedure22.12.2000Examination requested  [2001/15]
22.12.2000Request for accelerated examination filed
29.05.2001Despatch of a communication from the examining division (Time limit: M04)
29.05.2001Decision about request for accelerated examination - accepted: Yes
27.09.2001Reply to a communication from the examining division
30.04.2002Despatch of communication of intention to grant (Approval: Yes)
04.07.2002Communication of intention to grant the patent
05.07.2002Fee for grant paid
05.07.2002Fee for publishing/printing paid
Opposition(s)31.07.2003No opposition filed within time limit [2003/43]
Fees paidRenewal fee
21.08.2001Renewal fee patent year 03
22.08.2002Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT30.10.2002
BE30.10.2002
FI30.10.2002
GR30.10.2002
IT30.10.2002
NL30.10.2002
DK30.01.2003
PT30.01.2003
SE30.01.2003
ES29.04.2003
[2008/17]
Former [2007/18]AT30.10.2002
BE30.10.2002
FI30.10.2002
GR30.10.2002
NL30.10.2002
DK30.01.2003
PT30.01.2003
SE30.01.2003
ES29.04.2003
Former [2004/05]AT30.10.2002
BE30.10.2002
FI30.10.2002
GR30.10.2002
NL30.10.2002
PT30.01.2003
SE30.01.2003
ES29.04.2003
Former [2003/51]AT30.10.2002
BE30.10.2002
FI30.10.2002
GR30.10.2002
NL30.10.2002
PT30.01.2003
SE30.01.2003
Former [2003/43]AT30.10.2002
FI30.10.2002
GR30.10.2002
NL30.10.2002
PT30.01.2003
SE30.01.2003
Former [2003/37]AT30.10.2002
GR30.10.2002
NL30.10.2002
PT30.01.2003
SE30.01.2003
Former [2003/31]GR30.10.2002
NL30.10.2002
PT30.01.2003
SE30.01.2003
Former [2003/30]NL30.10.2002
PT30.01.2003
SE30.01.2003
Former [2003/29]PT30.01.2003
SE30.01.2003
Former [2003/27]SE30.01.2003
Documents cited:Search[AD]EP0559362  (TA INSTR INC [US]) [AD] 1,5,14,18,20 * abstract *;
 [A]EP0572164  (TA INSTR INC [US]) [A] 1,14 * page 5, lines 10-12 *;
 [AD]WO9533200  (PERKIN ELMER CORP [US]) [AD] 1,5,14,18,20 * abstract *;
 [AD]WO9533199  (PERKIN ELMER CORP [US]) [AD] 1,5,14,18,20 * abstract *;
 [A]EP0701122  (TA INSTR INC [US]) [A] 1,14,18,20 * pages 2-4; figures 1,24,28-32 *;
 [A]WO9618886  (CONSIGLIO NAZIONALE RICERCHE [IT], et al) [A] 1 * abstract *;
 [A]  - AMENGUAL A ET AL, "SYSTEME D'ANALYSE THERMIQUE ET D'ANALYSE CALORIMETRIQUE DIFFERENTIELLE (DSC): APPLICATION A L'ETUDE DES CYCLES D'HYSTERESIS PRESENTES PAR LES MATERIAUX A MEMOIRE DE FORME", JOURNAL OF PHYSICS E. SCIENTIFIC INSTRUMENTS,GB,IOP PUBLISHING, BRISTOL, (198907), vol. 22, no. 7, ISSN 0022-3735, page 433-437, XP000036046 [A] 1 * abstract *

DOI:   http://dx.doi.org/10.1088/0022-3735/22/7/004
ExaminationUS4507974
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.