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Extract from the Register of European Patents

EP About this file: EP1014121

EP1014121 - On-chip single layer horizontal deflecting waveguide and damascene method of fabricating the same [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  30.04.2004
Database last updated on 07.06.2024
Most recent event   Tooltip30.04.2004Application deemed to be withdrawnpublished on 16.06.2004  [2004/25]
Applicant(s)For all designated states
LSI Logic Corporation
1551 McCarthy Boulevard MS D-106
Milpitas, CA 95035 / US
[N/P]
Former [2000/26]For all designated states
LSI LOGIC CORPORATION
1551 McCarthy Boulevard MS D-106
Milpitas, CA 95035 / US
Inventor(s)01 / Hornbeck, Verne C.
8325 Freemantle Drive
Colorado Springs, CO 80920 / US
02 / Allman, Derryl D.J.
2825 Zephyr Drive
Colorado Springs, CO 80920 / US
[2000/26]
Representative(s)Menges, Rolf
Ackmann Menges
Patent- und Rechtsanwälte
Postfach 14 04 31
80454 München / DE
[N/P]
Former [2000/26]Menges, Rolf, Dipl.-Ing.
Ackmann, Menges & Demski, Patentanwälte Postfach 14 04 31
80454 München / DE
Application number, filing date99124884.016.12.1999
[2000/26]
Priority number, dateUS1998021718221.12.1998         Original published format: US 217182
[2000/26]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1014121
Date:28.06.2000
Language:EN
[2000/26]
Type: A3 Search report 
No.:EP1014121
Date:14.05.2003
[2003/20]
Search report(s)(Supplementary) European search report - dispatched on:EP27.03.2003
ClassificationIPC:G02B6/125
[2000/26]
CPC:
G02B6/136 (EP,US); G02B6/125 (EP,US); G02B6/132 (EP,US);
G02B2006/12104 (EP,US); G02B2006/12119 (EP,US); G02B2006/1215 (EP,US)
Designated contracting statesDE,   FR,   NL [2004/06]
Former [2000/26]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:On-chip Monoschicht horizontaler Umlenk-Wellenleiter und Damascene Herstellungsverfahren[2000/26]
English:On-chip single layer horizontal deflecting waveguide and damascene method of fabricating the same[2000/26]
French:Guide d'onde défléchissant sur puce à monocouche horizontal et méthode de damascène pour sa fabrication[2000/26]
Examination procedure13.06.2003Examination requested  [2003/33]
06.08.2003Despatch of a communication from the examining division (Time limit: M04)
17.12.2003Application deemed to be withdrawn, date of legal effect  [2004/25]
20.01.2004Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2004/25]
Fees paidRenewal fee
17.10.2001Renewal fee patent year 03
19.02.2003Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
31.12.200204   M06   Fee paid on   19.02.2003
31.12.200305   M06   Not yet paid
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Documents cited:Search[Y]JPS59171907  ;
 [A]JPH08304644  ;
 [A]DE3932369  (LICENTIA GMBH [DE]) [A] 1 * the whole document *;
 [A]WO9316403  (BRITISH TELECOMM [GB]) [A] 4 * figures 2,3,5 *;
 [A]EP0661561  (HITACHI LTD [JP]) [A] 17 * the whole document *;
 [YX]US5540346  (FUJIMOTO HARRY H [US], et al) [Y] 1-16,20 * abstract * [X] 17-19,21-24;
 [Y]EP0816880  (NGK INSULATORS LTD [JP]) [Y] 20 * column 5 *;
 [Y]DE19711121  (SIEMENS AG [DE]) [Y] 5 * figures 1,2,4,5B *;
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19850205), vol. 009, no. 026, Database accession no. (P - 332), & JP59171907 A 19840928 (KOGYO GIJUTSUIN;OTHERS: 0J) [Y] 1-16 * abstract *
 [Y]  - HIMENO A ET AL, "LOSS MEASUREMENT AND ANALYSIS OF HIGH-SILICA REFLECTION BENDING OPTICAL WAVEGUIDES", JOURNAL OF LIGHTWAVE TECHNOLOGY, IEEE. NEW YORK, US, (1988), vol. 6, no. 1, ISSN 0733-8724, pages 41 - 46, XP002034037 [Y] 1-16 * page 41 - page 42; figures 1,2 *

DOI:   http://dx.doi.org/10.1109/50.3961
 [Y]  - REINHARD MÄRZ, Integrated Optics: Design and Modeling, BOSTON, LONDON, ARTECH HOUSE, (1994), XP002232010 [Y] 1 * page 39 *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19970331), vol. 1997, no. 03, & JP08304644 A 19961122 (NIPPON TELEGR &TELEPH CORP ) [A] 4 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.