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Extract from the Register of European Patents

EP About this file: EP0999575

EP0999575 - Sample separating apparatus and method, and substrate manufacturing method [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  27.08.2005
Database last updated on 18.10.2024
Most recent event   Tooltip27.08.2005Withdrawal of applicationpublished on 12.10.2005  [2005/41]
Applicant(s)For all designated states
CANON KABUSHIKI KAISHA
30-2, 3-chome, Shimomaruko, Ohta-ku
Tokyo / JP
[N/P]
Former [2000/19]For all designated states
CANON KABUSHIKI KAISHA
30-2, 3-chome, Shimomaruko, Ohta-ku
Tokyo / JP
Inventor(s)01 / Yanagita, Kazutaka
Canon Kabushiki Kaisha, 30-2, Shimomaruko 3-chome
Ohta-ku, Tokyo / JP
02 / Ohmi, Kazuaki
Canon Kabushiki Kaisha, 30-2, Shimomaruko 3-chome
Ohta-ku, Tokyo / JP
03 / Sakaguchi, Kiyofumi
Canon Kabushiki Kaisha, 30-2, Shimomaruko 3-chome
Ohta-ku, Tokyo / JP
[2000/19]
Representative(s)Beresford, Keith Denis Lewis, et al
Beresford Crump LLP
16 High Holborn
London WC1V 6BX / GB
[N/P]
Former [2000/19]Beresford, Keith Denis Lewis, et al
BERESFORD & Co. High Holborn 2-5 Warwick Court
London WC1R 5DJ / GB
Application number, filing date99308761.804.11.1999
[2000/19]
Priority number, dateJP1998031657406.11.1998         Original published format: JP 31657498
JP1999027298727.09.1999         Original published format: JP 27298799
[2000/19]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0999575
Date:10.05.2000
Language:EN
[2000/19]
Type: A3 Search report 
No.:EP0999575
Date:25.08.2004
[2004/35]
Search report(s)(Supplementary) European search report - dispatched on:EP08.07.2004
ClassificationIPC:H01L21/00
[2000/19]
CPC:
H01L21/67092 (EP,US); G01N1/00 (KR); Y10T156/1137 (EP,US);
Y10T156/1939 (EP,US); Y10T29/49821 (EP,US); Y10T83/364 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT [2005/20]
Former [2000/19]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Vorrichtung und Verfahren zum Trennen von Proben, und Substratherstellungsverfahren[2000/19]
English:Sample separating apparatus and method, and substrate manufacturing method[2000/19]
French:Dispositif et procédé de séparation d'échantillons, et procédé de fabrication de substrat[2000/19]
Examination procedure14.07.2004Amendment by applicant (claims and/or description)
07.01.2005Examination requested  [2005/10]
15.08.2005Application withdrawn by applicant  [2005/41]
Fees paidRenewal fee
19.11.2001Renewal fee patent year 03
29.11.2002Renewal fee patent year 04
26.11.2003Renewal fee patent year 05
18.11.2004Renewal fee patent year 06
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Documents cited:Search[X]EP0867917  (CANON KK [JP]) [X] 1-111 * column 21, lines 3-19; figures 4,6-11,17-20 * * abstract *;
 [XA]US5447596  (HAYASE IWAO [JP]) [X] 1,53,69,70,78-81,109,110 * abstract * [A] 82,102,108
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.