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Extract from the Register of European Patents

EP About this file: EP1005166

EP1005166 - Method for detecting frequency of digital phase locked loop [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  23.12.2005
Database last updated on 08.10.2024
Most recent event   Tooltip23.12.2005No opposition filed within time limitpublished on 08.02.2006  [2006/06]
Applicant(s)For all designated states
Samsung Electronics Co., Ltd.
416, Maetan-dong
Paldal-gu
Suwon-City, Kyungki-do / KR
[N/P]
Former [2000/22]For all designated states
SAMSUNG ELECTRONICS CO., LTD.
416, Maetan-dong, Paldal-gu
Suwon-City, Kyungki-do / KR
Inventor(s)01 / Park, Hyun-Soo, 119-312, Hanshin Apt.
55-10, Jamwon dong, Seocho-gu
Seoul / KR
02 / Shim, Jae-Seong
229-24, Jayang 1-dong, Kwangjin-gu
Seoul / KR
03 / Won, Yong-Kwang
187, Shin 1-ri, Dongtan-myeon, Hwasung kun
Kyungkido / KR
[2000/22]
Representative(s)Chugg, David John, et al
Appleyard Lees
15 Clare Road
Halifax
West Yorkshire HX1 2HY / GB
[N/P]
Former [2000/22]Chugg, David John, et al
Appleyard Lees, 15 Clare Road
Halifax, West Yorkshire HX1 2HY / GB
Application number, filing date99309397.024.11.1999
[2000/22]
Priority number, dateKR1998005094726.11.1998         Original published format: KR 9850947
[2000/22]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1005166
Date:31.05.2000
Language:EN
[2000/22]
Type: A3 Search report 
No.:EP1005166
Date:15.01.2003
[2003/03]
Type: B1 Patent specification 
No.:EP1005166
Date:16.02.2005
Language:EN
[2005/07]
Search report(s)(Supplementary) European search report - dispatched on:EP04.12.2002
ClassificationIPC:H03L7/113, G01R23/02
[2000/22]
CPC:
H03L7/091 (EP,US); H03L7/10 (KR); G11B20/1403 (EP,US);
H03L7/113 (EP,US); G01R23/10 (EP,US)
Designated contracting statesDE,   FR,   GB,   NL [2003/40]
Former [2000/22]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Verfahren zur Erfassung der Frequenz in einem digitalen Phasenregelkreis[2000/22]
English:Method for detecting frequency of digital phase locked loop[2000/22]
French:Procédé de détection de fréquence dans une boucle à verrouillage de phase numérique[2000/22]
Examination procedure06.12.1999Examination requested  [2000/22]
06.03.2003Despatch of a communication from the examining division (Time limit: M04)
27.06.2003Reply to a communication from the examining division
13.10.2003Despatch of a communication from the examining division (Time limit: M04)
14.02.2004Reply to a communication from the examining division
09.08.2004Communication of intention to grant the patent
02.12.2004Fee for grant paid
02.12.2004Fee for publishing/printing paid
Opposition(s)17.11.2005No opposition filed within time limit [2006/06]
Fees paidRenewal fee
06.11.2001Renewal fee patent year 03
07.11.2002Renewal fee patent year 04
31.10.2003Renewal fee patent year 05
20.10.2004Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]EP0342736  (PHILIPS NV [NL]) [X] 1-5 * column 6, line 8 - column 8, line 58; figures 1A-E,2 *;
 [X]EP0544358  (PHILIPS NV [NL]) [X] 1-5 * column 9, line 16 - column 9, line 38 * * column 7, line 5 - column 7, line 37; figure 3 * * column 1, line 24 - column 1, line 27 *;
 [A]US5416809  (MASUDA SHOZO [JP], et al) [A] 1-5 * the whole document *;
 [A]EP0853386  (PLESSEY SEMICONDUCTORS LTD [GB]) [A] 1-5 * the whole document *;
 [A]US5841323  (FUJIMOTO KENSUKE [JP]) [A] 1-5* the whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.