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Extract from the Register of European Patents

EP About this file: EP1074025

EP1074025 - X-RAY CONCENTRATOR AND X-RAY DIAGNOSTIC SYSTEM [Right-click to bookmark this link]
Former [2001/06]X-RAY DIAGNOSTIC SYSTEM
[2005/12]
StatusNo opposition filed within time limit
Status updated on  25.05.2012
Database last updated on 07.10.2024
Most recent event   Tooltip26.04.2013Lapse of the patent in a contracting state
New state(s): ES		published on 29.05.2013  [2013/22]
Applicant(s)For all designated states
Smithsonian Astrophysical Observatory
60 Garden Street
Cambridge, MA 02138 / US
[2001/06]
Inventor(s)01 / SILVER, Eric, H.
59 Maple Street
Needham, MA 02192 / US
02 / SCHNOPPER, Herbert, W.
112A Lakeview Avenue
Cambridge, MA 02192 / US
03 / INGRAM, Russell
6 Woodcliff Road
Canton, MA 02021 / US
 [2001/06]
Representative(s)Greenwood, John David, et al
Graham Watt & Co LLP
St Botolph's House
7-9 St Botolph's Road
Sevenoaks
Kent TN13 3AJ / GB
[N/P]
Former [2001/06]Greenwood, John David, et al
Graham Watt & Co. Riverhead
Sevenoaks Kent TN13 2BN / GB
Application number, filing date99917580.516.04.1999
[2001/06]
WO1999US08394
Priority number, dateUS1998006447622.04.1998         Original published format: US 64476
[2001/06]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO9953823
Date:28.10.1999
Language:EN
[1999/43]
Type: A2 Application without search report 
No.:EP1074025
Date:07.02.2001
Language:EN
The application published by WIPO in one of the EPO official languages on 28.10.1999 takes the place of the publication of the European patent application.
[2001/06]
Type: B1 Patent specification 
No.:EP1074025
Date:20.07.2011
Language:EN
[2011/29]
Search report(s)International search report - published on:EP24.08.2000
ClassificationIPC:G21K1/06
[2001/06]
CPC:
G03F7/70166 (EP,US); B82Y10/00 (EP,US)
Designated contracting statesAT,   DE,   ES,   FI,   FR,   GB,   IE,   IT,   NL [2001/06]
TitleGerman:VORRICHTUNG ZUR BÜNDELUNG VON RÖNTGENSTRAHLEN UND RÖNTGENDIAGNOSTIKANLAGE[2005/12]
English:X-RAY CONCENTRATOR AND X-RAY DIAGNOSTIC SYSTEM[2005/12]
French:DISPOSITIF FOCALISEUR DE RAYONS X ET INSTALLATION DE DIAGNOSTIC PAR RAYONS X[2005/12]
Former [2001/06]RÖNTGENDIAGNOSTIKANLAGE
Former [2001/06]X-RAY DIAGNOSTIC SYSTEM
Former [2001/06]SYSTEME DE DIAGNOSTIC AUX RAYONS X
Entry into regional phase21.11.2000National basic fee paid 
21.11.2000Designation fee(s) paid 
21.11.2000Examination fee paid 
Examination procedure22.11.1999Request for preliminary examination filed
International Preliminary Examining Authority: US
21.11.2000Examination requested  [2001/06]
27.11.2000Amendment by applicant (claims and/or description)
17.10.2002Despatch of a communication from the examining division (Time limit: M06)
28.04.2003Reply to a communication from the examining division
13.06.2003Despatch of a communication from the examining division (Time limit: M06)
19.12.2003Reply to a communication from the examining division
25.06.2004Despatch of a communication from the examining division (Time limit: M06)
21.12.2004Reply to a communication from the examining division
07.03.2005Despatch of a communication from the examining division (Time limit: M06)
19.09.2005Reply to a communication from the examining division
26.11.2009Despatch of a communication from the examining division (Time limit: M06)
04.06.2010Reply to a communication from the examining division
21.10.2010Communication of intention to grant the patent
28.02.2011Fee for grant paid
28.02.2011Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  17.10.2002
Opposition(s)23.04.2012No opposition filed within time limit [2012/26]
Fees paidRenewal fee
20.04.2001Renewal fee patent year 03
22.04.2002Renewal fee patent year 04
22.04.2003Renewal fee patent year 05
26.04.2004Renewal fee patent year 06
20.04.2005Renewal fee patent year 07
26.04.2006Renewal fee patent year 08
30.05.2007Renewal fee patent year 09
25.04.2008Renewal fee patent year 10
12.10.2009Renewal fee patent year 11
26.04.2010Renewal fee patent year 12
26.04.2011Renewal fee patent year 13
Penalty fee
Additional fee for renewal fee
30.04.200709   M06   Fee paid on   30.05.2007
30.04.200911   M06   Fee paid on   12.10.2009
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT20.07.2011
FI20.07.2011
ES31.10.2011
IE16.04.2012
[2013/22]
Former [2013/08]AT20.07.2011
FI20.07.2011
IE16.04.2012
Former [2012/11]AT20.07.2011
FI20.07.2011
Former [2012/09]FI20.07.2011
Cited inInternational search[Y]JPS60262338  ;
 [PX]WO9909401  (HARA DAVID B O [US]) [PX] 1,3,8,9,42 * page 4, line 11 - line 28 * * page 5, line 29 - page 7, line 6 ** figures 2,4-6 *;
 [XY]  - KANTSYREV V P ET AL, "INVESTIGATING THE CHARACTERISTICS OF X RADIATION FROM A HOT PLASMA BY MEANS OF GLASSCAPILLARY CONVERTERS", QUANTUM ELECTRONICS,US,AMERICAN INSTITUTE OF PHYSICS, WOODBURY, NY, (19931201), vol. 23, no. 12, ISSN 1063-7818, pages 1026 - 1029, XP000471590 [X] 1,4,8,37-39 * page 1026, paragraph 1 - page 1027, paragraph 1; figure 2 * [Y] 2,3,5-7,42,44

DOI:   http://dx.doi.org/10.1070/QE1993v023n12ABEH003277
 [XA]  - KANTSYREV V L ET AL, "POSSIBLE USE OF GLASS-CAPILLARY CONCENTRATORS OF SOFT X RAYS IN STUDIES OF HIGH-TEMPERATURE PLASMAS", TECHNICAL PHYSICS LETTERS,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19930401), vol. 19, no. 4, ISSN 1063-7850, pages 205 - 206, XP000395006 [X] 1,4,8,37,38 * page 205, column L, paragraph 1 - paragraph L * [A] 44,45
 [X]  - KANTSYREV V ET AL, "ENHANCEMENT OF THE FLUX DENSITY OF LINE RADIATION IN THE EXTREME ULTRAVIOLET WAVELENGTH REGION FOR SPECTROSCOPIC AND PLASMA DISGNOSTIC APPLICATIONS USING GLASS-CAPILLARY CONVERTERS", APPLIED PHYSICS LETTERS,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19950626), vol. 66, no. 26, ISSN 0003-6951, pages 3567 - 3569, XP000520507 [X] 1 * page 3567, paragraph 2 - page 3568, paragraph L *

DOI:   http://dx.doi.org/10.1063/1.113789
 [YA]  - DECKMAN H W ET AL, "Use of a scanning electron microscope as an X-ray source for EXAFS", WORKSHOP ON LABORATORY EXAFS FACILITIES AND THEIR RELATION TO SYNCHROTRON RADIATION SOURCES, SEATTLE, WA, USA, 28-30 APRIL 1980, AIP Conference Proceedings, 1980, USA, no. 64, ISSN 0094-243X, pages 91 - 92, XP000909065 [Y] 2,44 * the whole document * [A] 47

DOI:   http://dx.doi.org/10.1002/elps.1150180117
 [Y]  - ZOREV N N, "X-ray optics for plasma point sources", X-RAY INSTRUMENTATION IN MEDICINE AND BIOLOGY, PLASMA PHYSICS, ASTROPHYSICS AND SYNCHROTRON RADIATION, PARIS, FRANCE, 25-28 APRIL 1989, Proceedings of the SPIE - The International Society for Optical Engineering, 1989, USA, vol. 1140, ISSN 0277-786X, pages 214 - 219, XP000909066 [Y] 3 * page 214, paragraph 1 - paragraph 2 *
 [Y]  - PEARLMAN J S ET AL, "Bright discharge plasma sources for X-ray lithography", ELECTRON BEAM, X-RAY, AND ION-BEAM TECHNIQUES FOR SUBMICROMETER LITHOGRAPHIES IV, SANTA CLARA, CA, USA, 14-15 MARCH 1985, Proceedings of the SPIE - The International Society for Optical Engineering, 1985, USA, vol. 537, ISSN 0277-786X, pages 102 - 107, XP000909059 [Y] 5 * page 103, paragraph 2 - paragraph L *
 [PY]  - MILEY G H, "A portable neutron/tunable X-ray source based on inertial electrostatic confinement", NINTH SYMPOSIUM ON RADIATION MEASUREMENTS AND APPLICATIONS, ANN ARBOR, MI, USA, 11-14 MAY 1998, Nuclear Instruments & Methods in Physics Research, Section A (Accelerators, Spectrometers, Detectors and Associated Equipment), 11 Feb. 1999, Elsevier, Netherlands, vol. 422, no. 1-3, ISSN 0168-9002, pages 16 - 20, XP002138043 [PY] 6 * abstract *
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19860517), vol. 010, no. 133, Database accession no. (E - 404), & JP60262338 A 19851225 (FUJITSU KK) [Y] 7 * abstract *
 [Y]  - O'HARA D, "X-ray flux concentrating optics for improving the performance of light element energy dispersive spectroscopy", X-RAY AND ULTRAVIOLET SPECTROSCOPY AND POLARIMETRY II, SAN DIEGO, CA, USA, 23-24 JULY 1998, Proceedings of the SPIE - The International Society for Optical Engineering, 1998, SPIE-Int. Soc. Opt. Eng, USA, vol. 3443, ISSN 0277-786X, pages 98 - 104, XP000909055 [Y] 42 * page 99, paragraph 1 - paragraph 2 *

DOI:   http://dx.doi.org/10.1117/12.333603
 [A]  - DUVANOV B N ET AL, "MULTIELEMENT X-RAY CONCENTRATOR", SOVIET PHYSICS TECHNICAL PHYSICS,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, (19930401), vol. 38, no. 4, pages 334 - 337, XP000443319 [A] 30,47 * page 335, column L, paragraph L - column R, paragraph 1 *
Examination   - SERLEMITSOS P.J., "Conical foil X-ray mirrors: performance and projections", APPLIED OPTICS, OPTICAL SOCIETY OF AMERICA, US, (19880415), vol. 27, no. 8, ISSN 0003-6935, pages 1447 - 1452, XP009126058

DOI:   http://dx.doi.org/10.1364/AO.27.001447
    - PETER J. SERLEMITSOS; YANG SOONG, "Foil X-Ray Mirrors", ASTROPHYSICS AND SPACE SCIENCE, REIDEL, DORDRECHT, NL, (19960901), vol. 239, no. 2, ISSN 0004-640X, pages 177 - 196, XP009125725
    - CHRISTENSEN F.E. ET AL, "Studies of multilayers and thin-foil X-ray mirrors using a soft X-ray diffractometer", JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY, IOS PRESS, AMSTERDAM, NL LNKD- DOI:10.1016/0895-3996(90)90003-5, vol. 2, no. 2, ISSN 0895-3996, (19900601), pages 81 - 94, (19900601), XP023024961

DOI:   http://dx.doi.org/10.1016/0895-3996(90)90003-5
    - SERLEMITSOS P.J. ET AL, "THE MULTILAYER OPTION FOR CONICAL FOIL X-RAY MIRRORS", PROCEEDINGS OF THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING (SPIE), SPIE, USA LNKD- DOI:10.1117/12.278853, (19970727), vol. 3113, ISSN 0277-786X, pages 244 - 252, XP000961464

DOI:   http://dx.doi.org/10.1117/12.278853
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.