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Extract from the Register of European Patents

EP About this file: EP1096553

EP1096553 - ANISOTROPIC ETCHING METHOD [Right-click to bookmark this link]
Former [2001/18]ANISOTROPIC ETCHING METHOD AND APPARATUS
[2010/30]
StatusNo opposition filed within time limit
Status updated on  04.11.2011
Database last updated on 29.07.2024
Most recent event   Tooltip04.11.2011No opposition filed within time limitpublished on 07.12.2011  [2011/49]
Applicant(s)For all designated states
Mitsubishi Materials Silicon Corporation
5-1, Otemachi 1-chome Chiyoda-ku
Tokyo / JP
[2010/52]
Former [2001/18]For all designated states
Mitsubishi Materials Silicon Corporation
5-1, Otemachi 1-chome
Chiyoda-ku, Tokyo / JP
Inventor(s)01 / OI, Hiroyuki Mitsubishi Materials Silicon Corp.
5--1, Otemachi 1-chome Chiyoda-ku
Tokyo 100-0005 / JP
 [2001/18]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastrasse 30
81925 München / DE
[N/P]
Former [2001/18]HOFFMANN - EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date99925400.622.06.1999
[2001/18]
WO1999JP03298
Priority number, dateJP1998017863025.06.1998         Original published format: JP 17863098
JP1998017863125.06.1998         Original published format: JP 17863198
[2001/18]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO9967814
Date:29.12.1999
Language:EN
[1999/52]
Type: A1 Application with search report 
No.:EP1096553
Date:02.05.2001
Language:EN
The application published by WIPO in one of the EPO official languages on 29.12.1999 takes the place of the publication of the European patent application.
[2001/18]
Type: B1 Patent specification 
No.:EP1096553
Date:29.12.2010
Language:EN
[2010/52]
Search report(s)International search report - published on:JP29.12.1999
(Supplementary) European search report - dispatched on:EP12.02.2007
ClassificationIPC:H01L21/306
[2001/18]
CPC:
H01L21/30608 (EP); H01L21/306 (KR); H01L21/67086 (EP)
Designated contracting statesDE [2001/18]
TitleGerman:VERFAHREN ZUR ANISOTROPEN CHEMISCHEN ÄTZUNG[2010/30]
English:ANISOTROPIC ETCHING METHOD[2010/30]
French:PROCEDE D'ATTAQUE CHIMIQUE ANISOTROPE[2010/30]
Former [2001/18]VERFAHREN UND VORRICHTUNG ZUR ANISOTROPEN CHEMISCHEN ÄTZUNG
Former [2001/18]ANISOTROPIC ETCHING METHOD AND APPARATUS
Former [2001/18]PROCEDE ET APPAREIL D'ATTAQUE CHIMIQUE ANISOTROPE
Entry into regional phase20.12.2000Translation filed 
20.12.2000National basic fee paid 
20.12.2000Search fee paid 
20.12.2000Designation fee(s) paid 
20.12.2000Examination fee paid 
Examination procedure13.12.1999Request for preliminary examination filed
International Preliminary Examining Authority: JP
20.12.2000Examination requested  [2001/18]
12.06.2007Despatch of a communication from the examining division (Time limit: M04)
28.09.2007Reply to a communication from the examining division
11.06.2010Date of oral proceedings
06.07.2010Communication of intention to grant the patent
06.07.2010Minutes of oral proceedings despatched
08.11.2010Fee for grant paid
08.11.2010Fee for publishing/printing paid
Opposition(s)30.09.2011No opposition filed within time limit [2011/49]
Fees paidRenewal fee
19.06.2001Renewal fee patent year 03
26.06.2002Renewal fee patent year 04
23.06.2003Renewal fee patent year 05
25.06.2004Renewal fee patent year 06
29.06.2005Renewal fee patent year 07
28.06.2006Renewal fee patent year 08
26.06.2007Renewal fee patent year 09
26.06.2008Renewal fee patent year 10
25.06.2009Renewal fee patent year 11
29.06.2010Renewal fee patent year 12
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]US5511569  (MUKOGAWA YASUKAZU [JP]) [X] 2,3 * figure 1; example 1 * * figure 7; example 5 *;
 [A]JPH10151403  (DAINIPPON SCREEN MFG) [A] 3 * paragraphs [0012] - [0014]; figure 1 *
International search[A]JPH05198555  (HITACHI LTD, et al);
 [X]JPH0566714U  ;
 [X]JPH09266193  (SHINETSU HANDOTAI KK, et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.