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Extract from the Register of European Patents

EP About this file: EP1095409

EP1095409 - SILICON CARBIDE HORIZONTAL CHANNEL BUFFERED GATE SEMICONDUCTOR DEVICES [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  13.11.2015
Database last updated on 27.07.2024
Most recent event   Tooltip20.07.2018Lapse of the patent in a contracting state
New state(s): PT		published on 22.08.2018  [2018/34]
Applicant(s)For all designated states
Cree, Inc.
4600 Silicon Drive
Durham, NC 27703 / US
[2015/02]
Former [2001/18]For all designated states
CREE, INC.
4600 Silicon Drive
Durham, NC 27703 / US
Inventor(s)01 / SINGH, Ranbir
Apartment 2C
100 Rosedown Drive
Cary, NC 27513 / US
 [2015/02]
Former [2001/18]01 / SINGH, Ranbir
Apartment 2C, 100 Rosedown Drive
Cary, NC 27513 / US
Representative(s)Boult Wade Tennant LLP
Salisbury Square House
8 Salisbury Square
London EC4Y 8AP / GB
[N/P]
Former [2014/02]Boult Wade Tennant
Verulam Gardens
70 Gray's Inn Road
London WC1X 8BT / GB
Former [2010/42]Cross, Rupert Edward Blount, et al
Boult Wade Tennant Verulam Gardens 70 Gray's Inn Road
London WC1X 8BT / GB
Former [2001/18]Warren, Keith Stanley
BARON & WARREN 18 South End Kensington
London W8 5BU / GB
Application number, filing date99927350.108.06.1999
[2001/18]
WO1999US12861
Priority number, dateUS1998011268609.07.1998         Original published format: US 112686
[2001/18]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO0003440
Date:20.01.2000
Language:EN
[2000/03]
Type: A1 Application with search report 
No.:EP1095409
Date:02.05.2001
Language:EN
The application published by WIPO in one of the EPO official languages on 20.01.2000 takes the place of the publication of the European patent application.
[2001/18]
Type: B1 Patent specification 
No.:EP1095409
Date:07.01.2015
Language:EN
[2015/02]
Search report(s)International search report - published on:EP20.01.2000
ClassificationIPC:H01L29/24, H01L29/808, H01L21/04
[2001/18]
CPC:
H01L29/1608 (EP,US); H01L29/772 (KR); H01L29/66068 (EP,US);
H01L29/8083 (EP,US)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [2001/18]
TitleGerman:HALBLEITERBAULELEMENTE AUS SILIZIUM-KARBID MIT HORIZONTALEM KANAL UND GEPUFFERTEM GATE[2001/18]
English:SILICON CARBIDE HORIZONTAL CHANNEL BUFFERED GATE SEMICONDUCTOR DEVICES[2001/18]
French:DISPOSITIF A SEMI-CONDUCTEUR A GRILLE TAMPONNEE A CANAL HORIZONTAL AU CARBURE DE SILICIUM[2001/18]
Entry into regional phase01.02.2001National basic fee paid 
01.02.2001Designation fee(s) paid 
01.02.2001Examination fee paid 
Examination procedure26.10.1999Request for preliminary examination filed
International Preliminary Examining Authority: EP
01.02.2001Examination requested  [2001/18]
15.09.2006Despatch of a communication from the examining division (Time limit: M04)
19.01.2007Reply to a communication from the examining division
21.01.2008Despatch of a communication from the examining division (Time limit: M06)
31.07.2008Reply to a communication from the examining division
09.10.2009Date of oral proceedings
11.12.2009Date of oral proceedings
04.01.2010Despatch of communication that the application is refused, reason: substantive examination {1}
04.01.2010Minutes of oral proceedings despatched
01.08.2014Communication of intention to grant the patent
27.11.2014Fee for grant paid
27.11.2014Fee for publishing/printing paid
27.11.2014Receipt of the translation of the claim(s)
Appeal following examination09.03.2010Appeal received No.  T1154/10
13.05.2010Statement of grounds filed
08.05.2014Result of appeal procedure: remittal for grant
08.05.2014Date of oral proceedings
13.05.2014Minutes of oral proceedings despatched
Divisional application(s)EP10182679.0  / EP2264769
The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  15.09.2006
Opposition(s)08.10.2015No opposition filed within time limit [2015/51]
Fees paidRenewal fee
13.06.2001Renewal fee patent year 03
12.06.2002Renewal fee patent year 04
12.06.2003Renewal fee patent year 05
14.06.2004Renewal fee patent year 06
14.06.2005Renewal fee patent year 07
14.06.2006Renewal fee patent year 08
14.06.2007Renewal fee patent year 09
28.03.2008Renewal fee patent year 10
16.06.2009Renewal fee patent year 11
11.06.2010Renewal fee patent year 12
13.06.2011Renewal fee patent year 13
14.06.2012Renewal fee patent year 14
10.06.2013Renewal fee patent year 15
12.06.2014Renewal fee patent year 16
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipBE07.01.2015
CY07.01.2015
DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
PT07.01.2015
SE07.01.2015
GR08.04.2015
GB08.06.2015
IE08.06.2015
LU08.06.2015
CH30.06.2015
FR30.06.2015
LI30.06.2015
[2018/34]
Former [2017/40]BE07.01.2015
CY07.01.2015
DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
GB08.06.2015
IE08.06.2015
LU08.06.2015
CH30.06.2015
FR30.06.2015
LI30.06.2015
Former [2016/25]BE07.01.2015
DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
GB08.06.2015
IE08.06.2015
LU08.06.2015
CH30.06.2015
FR30.06.2015
LI30.06.2015
Former [2016/24]BE07.01.2015
DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
GB08.06.2015
IE08.06.2015
LU08.06.2015
CH30.06.2015
LI30.06.2015
Former [2016/23]DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
GB08.06.2015
IE08.06.2015
LU08.06.2015
CH30.06.2015
LI30.06.2015
Former [2016/22]DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
IE08.06.2015
LU08.06.2015
CH30.06.2015
LI30.06.2015
Former [2016/20]DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
IE08.06.2015
LU08.06.2015
Former [2016/11]DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
LU08.06.2015
Former [2016/09]DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
MC07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
Former [2016/03]DK07.01.2015
ES07.01.2015
FI07.01.2015
IT07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
Former [2015/50]DK07.01.2015
ES07.01.2015
FI07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
Former [2015/39]ES07.01.2015
FI07.01.2015
NL07.01.2015
SE07.01.2015
GR08.04.2015
Former [2015/37]ES07.01.2015
FI07.01.2015
SE07.01.2015
GR08.04.2015
Former [2015/36]ES07.01.2015
FI07.01.2015
SE07.01.2015
Former [2015/33]ES07.01.2015
Cited inInternational search[Y]JPS63128741  ;
 [A]EP0687015  (NGK INSULATORS LTD [JP]) [A] 1-33 * figure 1 *;
 [XA]EP0703629  (DAIMLER BENZ AG [DE]) [X] 1,2,4,13,16,18-22,25,27-31 * column 3, line 10; figures 1-7,9 * * column 3, lines 23,24 * * column 4, line 17 - line 22 * * column 4, line 29 - line 31 * [A] 3,14,17,23,26,32;
 [A]DE19608003  (DAIMLER BENZ AG [DE]) [A] 1-33 * figures 7,8 *;
 [A]EP0822600  (MOTOROLA INC [US]) [A] 1-33 * figure 1 *;
 [XAY]DE19644821  (DAIMLER BENZ AG [DE]) [X] 1,2,4-7,11,13,16,18-22 * column 2, line 36 - line 38 * * figure 4 * [A] 3,14,17,23,26,32 [Y] 15,24,33;
 [A]WO9812755  (NGK INSULATORS LTD [JP], et al) [A] 14,23,32 * figure 1 *;
 [Y]  - PATENT ABSTRACTS OF JAPAN, (19881014), vol. 012, no. 385, Database accession no. (E - 668), & JP63128741 A 19880601 (SANYO ELECTRIC CO LTD) [Y] 15,24,33 * abstract *
 [A]  - IWASAKI T ET AL, "ELECTRICAL CHARACTERISTICS OF A NOVEL GATE STRCUTURE 4H-SIC POWER STATIC INDUCTION TRANSISTOR", ISPSD '97. 1997 IEEE INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS, WEIMAR, MAY 26 - 29, 1997, INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, (19970526), no. CONF. 9, ISBN 0-7803-3994-0, XP000800175 [A] 1-33 * figure 1 *
ExaminationUS5321283
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.