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Extract from the Register of European Patents

EP About this file: EP1082581

EP1082581 - SYSTEM FOR MEASURING STRUCTURES OF AN OBJECT [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  03.06.2005
Database last updated on 03.09.2024
Most recent event   Tooltip08.08.2008Change - representativepublished on 10.09.2008  [2008/37]
Applicant(s)For all designated states
Werth Messtechnik GmbH
Siemensstrasse 19
35394 Giessen / DE
[2001/11]
Inventor(s)01 / CHRISTOPH, Ralf
Taunusblick 2
D-35641 Schöffengrund / DE
 [2001/11]
Representative(s)Stoffregen, Hans-Herbert
Patentanwalt
Postfach 21 44
63411 Hanau / DE
[N/P]
Former [2008/37]Stoffregen, Hans-Herbert
Patentanwalt Postfach 21 44
63411 Hanau / DE
Former [2001/11]Stoffregen, Hans-Herbert, Dr. Dipl.-Phys.
Patentanwalt, Friedrich-Ebert-Anlage 11b
63450 Hanau / DE
Application number, filing date99927803.929.05.1999
[2001/11]
WO1999EP03744
Priority number, dateDE199812410629.05.1998         Original published format: DE 19824106
DE199814771116.10.1998         Original published format: DE 19847711
[2001/11]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO9963301
Date:09.12.1999
Language:DE
[1999/49]
Type: A1 Application with search report 
No.:EP1082581
Date:14.03.2001
Language:DE
The application published by WIPO in one of the EPO official languages on 09.12.1999 takes the place of the publication of the European patent application.
[2001/11]
Type: B1 Patent specification 
No.:EP1082581
Date:28.07.2004
Language:DE
[2004/31]
Search report(s)International search report - published on:EP09.12.1999
ClassificationIPC:G01B11/00, G01B21/04
[2001/11]
CPC:
G01B21/047 (EP,US); G01B11/007 (EP,US)
Designated contracting statesDE,   ES,   FR,   GB,   IT [2001/11]
TitleGerman:ANORDNUNG ZUR MESSUNG VON STRUKTUREN EINES OBJEKTES[2001/11]
English:SYSTEM FOR MEASURING STRUCTURES OF AN OBJECT[2001/11]
French:DISPOSITIF POUR LA MESURE DE STRUCTURES D'UN OBJET[2001/11]
Entry into regional phase18.11.2000National basic fee paid 
18.11.2000Designation fee(s) paid 
18.11.2000Examination fee paid 
Examination procedure13.11.1999Request for preliminary examination filed
International Preliminary Examining Authority: EP
18.11.2000Examination requested  [2001/11]
13.11.2002Despatch of a communication from the examining division (Time limit: M04)
18.03.2003Reply to a communication from the examining division
09.12.2003Communication of intention to grant the patent
15.04.2004Fee for grant paid
15.04.2004Fee for publishing/printing paid
Opposition(s)29.04.2005No opposition filed within time limit [2005/29]
Fees paidRenewal fee
30.05.2001Renewal fee patent year 03
28.05.2002Renewal fee patent year 04
30.05.2003Renewal fee patent year 05
25.05.2004Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipES08.11.2004
[2005/23]
Cited inInternational search[A]US4631834  (HAYASHI KOJI [JP], et al) [A] 1-4,6-8 * column 7, line 38 - column 12, line 7; figures 12-14 *;
 [Y]US4637119  (SCHNEIDER HORST [DE], et al) [Y] 1,3-5,7,8 * column 3, line 44 - column 6, line 65 *;
 [AD]DE4327250  (ZEISS CARL FA [DE])[AD] 1;
 [Y]DE29710242U  (TRAPET EUGEN DR [DE]) [Y] 1,3-5,7,8 * the whole document *;
 [PX]US5825666  (FREIFELD DANIEL [US]) [PX] 1 * column 5, line 10 - line 52 * * column 6, line 26 - line 31 * * column 9, line 18 - column 13, line 55; figures 1,6,22,23 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.