EP1033355 - TARGET FOR TRANSPARENT ELECTROCONDUCTIVE FILM AND ITS USE [Right-click to bookmark this link] | |||
Former [2000/36] | TARGET FOR TRANSPARENT ELECTROCONDUCTIVE FILM, TRANSPARENT ELECTROCONDUCTIVE MATERIAL, TRANSPARENT ELECTROCONDUCTIVE GLASS AND TRANSPARENT ELECTROCONDUCTIVE FILM | ||
[2016/33] | Status | The application is deemed to be withdrawn Status updated on 28.04.2017 Database last updated on 03.06.2024 | |
Former | Grant of patent is intended Status updated on 12.01.2017 | Most recent event Tooltip | 28.04.2017 | Application deemed to be withdrawn | published on 31.05.2017 [2017/22] | Applicant(s) | For all designated states IDEMITSU KOSAN COMPANY LIMITED 1-1, Marunouchi 3-chome Chiyoda-ku Tokyo 100-0005 / JP | [N/P] |
Former [2000/36] | For all designated states IDEMITSU KOSAN COMPANY LIMITED 1-1, Marunouchi 3-chome Chiyoda-ku Tokyo 100-0005 / JP | Inventor(s) | 01 /
INOUE, Kazuyoshi 8-8, Nihonbashi, Kayabacho 3-chome, Chuou-ku Tokyo 103-0025 / JP | [2000/36] | Representative(s) | Gille Hrabal Partnerschaftsgesellschaft mbB Patentanwälte Brucknerstraße 20 40593 Düsseldorf / DE | [N/P] |
Former [2000/36] | Gille Hrabal Struck Neidlein Prop Roos Patentanwälte Brucknerstrasse 20 40593 Düsseldorf / DE | Application number, filing date | 99938524.8 | 19.08.1999 | [2000/36] | WO1999JP04453 | Priority number, date | JP19980245322 | 31.08.1998 Original published format: JP 24532298 | JP19980251200 | 04.09.1998 Original published format: JP 25120098 | JP19990005046 | 12.01.1999 Original published format: JP 504699 | JP19990058384 | 05.03.1999 Original published format: JP 5838499 | [2000/36] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO0012445 | Date: | 09.03.2000 | Language: | EN | [2000/10] | Type: | A1 Application with search report | No.: | EP1033355 | Date: | 06.09.2000 | Language: | EN | The application published by WIPO in one of the EPO official languages on 09.03.2000 takes the place of the publication of the European patent application. | [2000/36] | Search report(s) | International search report - published on: | JP | 09.03.2000 | (Supplementary) European search report - dispatched on: | EP | 29.10.2010 | Classification | IPC: | C03C17/245, C04B35/01, C04B35/453, C04B35/457, C08J7/04, C23C14/08, C23C14/34, H01L31/0224, H01L51/52, G02F1/1343 | [2016/33] | CPC: |
C04B35/457 (EP,US);
C04B35/00 (KR);
C03C17/2453 (EP,US);
C04B35/01 (EP,US);
C04B35/453 (EP,US);
C08J7/0423 (US);
C08J7/044 (EP,US);
C23C14/086 (EP,US);
C23C14/3414 (EP,US);
H01L31/022466 (EP,US);
H10K50/81 (EP,KR,US);
C03C2217/23 (EP,US);
C03C2217/231 (EP,US);
C03C2218/154 (EP,US);
C04B2235/3239 (EP,US);
C04B2235/3251 (EP,US);
C04B2235/3256 (EP,US);
C04B2235/3262 (EP,US);
C04B2235/3284 (EP,US);
C04B2235/3286 (EP,US);
C04B2235/3289 (EP,US);
C04B2235/3293 (EP,US);
C04B2235/763 (EP,US);
C04B2235/767 (EP,US);
C04B2235/77 (EP,US);
C04B2235/80 (EP,US);
C04B2235/96 (EP,US);
|
Former IPC [2006/35] | C04B35/00, C04B35/457, C23C14/34, C08J7/06, C03C17/245 | ||
Former IPC [2000/36] | C04B35/00, C04B35/457, C23C14/34 | Designated contracting states | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE [2000/36] | Title | German: | TARGET FÜR TRANSPARENTE ELEKTRISCH LEITENDE SCHICHT UND SEINE VERWENDUNG | [2016/33] | English: | TARGET FOR TRANSPARENT ELECTROCONDUCTIVE FILM AND ITS USE | [2016/33] | French: | CIBLE POUR FILM ELECTROCONDUCTEUR TRANSPARENT ET SON UTILISATION | [2016/33] |
Former [2000/36] | TARGET FÜR TRANSPARENTE ELEKTRISCH LEITENDE SCHICHT, TRANSPARENTER ELEKTRISCH LEITENDER WERKSTOFF, TRANSPARENTES ELEKTRISCH LEITENDES GLAS UND TRANSPARENTE ELEKTRISCH LEITENDE SCHICHT | ||
Former [2000/36] | TARGET FOR TRANSPARENT ELECTROCONDUCTIVE FILM, TRANSPARENT ELECTROCONDUCTIVE MATERIAL, TRANSPARENT ELECTROCONDUCTIVE GLASS AND TRANSPARENT ELECTROCONDUCTIVE FILM | ||
Former [2000/36] | CIBLE POUR FILM ELECTROCONDUCTEUR TRANSPARENT, MATIERE ELECTROCONDUCTRICE TRANSPARENTE, VERRE ELECTROCONDUCTEUR TRANSPARENT ET FILM ELECTROCONDUCTEUR TRANSPARENT | Entry into regional phase | 12.04.2000 | Translation filed | 12.04.2000 | National basic fee paid | 12.04.2000 | Search fee paid | 12.04.2000 | Designation fee(s) paid | 12.08.2000 | Examination fee paid | Examination procedure | 12.08.2000 | Examination requested [2000/41] | 29.03.2011 | Despatch of a communication from the examining division (Time limit: M04) | 18.07.2011 | Reply to a communication from the examining division | 07.12.2012 | Despatch of a communication from the examining division (Time limit: M04) | 08.04.2013 | Reply to a communication from the examining division | 23.04.2014 | Despatch of a communication from the examining division (Time limit: M04) | 29.08.2014 | Reply to a communication from the examining division | 11.02.2016 | Application deemed to be withdrawn, date of legal effect [2017/22] | 20.07.2016 | Communication of intention to grant the patent | 13.01.2017 | Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time [2017/22] | Divisional application(s) | EP13161290.5 / EP2610229 | EP13161293.9 / EP2610230 | EP13161296.2 / EP2610231 | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 29.03.2011 | Fees paid | Renewal fee | 23.08.2001 | Renewal fee patent year 03 | 27.08.2002 | Renewal fee patent year 04 | 22.08.2003 | Renewal fee patent year 05 | 24.08.2004 | Renewal fee patent year 06 | 19.08.2005 | Renewal fee patent year 07 | 22.08.2006 | Renewal fee patent year 08 | 22.08.2007 | Renewal fee patent year 09 | 19.08.2008 | Renewal fee patent year 10 | 19.08.2009 | Renewal fee patent year 11 | 18.08.2010 | Renewal fee patent year 12 | 24.08.2011 | Renewal fee patent year 13 | 24.08.2012 | Renewal fee patent year 14 | 13.08.2013 | Renewal fee patent year 15 | 25.08.2014 | Renewal fee patent year 16 | 20.08.2015 | Renewal fee patent year 17 | Penalty fee | Additional fee for renewal fee | 31.08.2016 | 18   M06   Not yet paid |
Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]JPH06236710 ; | [A]JPH0570943 ; | [X]JPH01227951 ; | [X]JPS5948648 ; | [X]US2564706 (MOCHEL JOHN M) [X] 34,40,41 * column 1, line 35 - column 2, line 5 *; | [X]GB919373 (PHILIPS ELECTRICAL IND LTD) [X] 38,39 * claim 3 *; | [X]US4033169 (FUJISHIRO TAKESHI, et al) [X] 28 * column 3, line 42 - line 68 *; | [X]US4345000 (KAWAZOE SHOZO, et al) [X] 22,23 * column 8, line 58 - column 9, line 8 * * column 11, lines 20-34 *; | [X]JPS59163707 (NIPPON SHEET GLASS CO LTD) [X] 14,17-21 * the whole document *; | [X]JPS59198602 (NISSHA PRINTING) [X] 20,21 * the whole document *; | [X]JPS59204625 (DAICEL CHEM) [X] 14,17-19,22,23 * abstract *; | [X]EP0206236 (FIGARO ENG [JP]) [X] 24,25,28,34,38 * page 6, paragraph 3 * * page 8, paragraph 4 *; | [X]JPS62260086 (PERMELEC ELECTRODE LTD) [X] 28 * comparative example 1;; table 1 *; | [XA]JPS62260088 (PERMELEC ELECTRODE LTD) [X] 28 * the whole document * [A] 14-23,34-43; | [A]JPS62260087 (PERMELEC ELECTRODE LTD) [A] 14-23,34-43* comparative example 3 *; | [X]US4849252 (ARFSTEN NANNING [DE], et al) [X] 14,20,21,24,25,28,30,31 * examples 5,16,18; claim 1 *; | [I]US4900634 (TERNEU ROBERT [BE], et al) [I] 34,40,41 * claim 1 *; | [A]JPH04341707 (SHOWA DENKO KK) [A] 8-13 * abstract *; | [A]US5217692 (RUMP HANNS [DE], et al) [A] 26,27 * column 6, lines 25-27 *; | [X]JPH06128743 (MITSUBISHI MATERIALS CORP) [X] 24,28-33 * abstract *; | [X]JPH07157863 (TOSHIBA CORP) [X] 24,25,30,31 * paragraphs [0005] , [0011] *; | [X]JPH07283005 (MATSUSHITA ELECTRIC IND CO LTD) [X] 14 * paragraphs [0019] , [0024]; tables 1,2 *; | [A]EP0686982 (HOYA CORP [JP]) [A] 14-23 * table 12 *; | [A]JPH0860349 (MITSUBISHI MATERIALS CORP) [A] 8-13 * paragraphs [0002] , [0005] , [0008] *; | [XA]EP0713240 (SUMITOMO METAL MINING CO [JP], et al) [X] 24,25,30,31 * example 6 * [A] 14-23; | [X]JPH08185797 (SUMITOMO METAL MINING CO) [X] 24,25,28,30,31 * paragraph [0024]; table 1 *; | [X]WO9701853 (IDEMITSU KOSAN CO [JP], et al) [X] 24,25,28-33 * samples 5, 22, 38, 55;; tables 19,20 *; | [A]JPH0971860 (IDEMITSU KOSAN CO) [A] 1-7 * example 4; table 1 *; | [XA]JPH09161542 (IDEMITSU KOSAN CO) [X] 24,25,28-33 * paragraph [0015]; tables 1-3 * [A] 1-7; | [A]JPH09265351 (TEIJIN LTD) [A] 8-13 * example 2 *; | [YA]JPH1083719 (MINAMI UCHITSUGU, et al) [Y] 20-23 * paragraph [0008]; example 1 * [A] 8-13; | [XY]US5736071 (SATO KEIJI [JP]) [X] 14,17-19 * column 1, lines 51-53; claims 5,7 * [Y] 20-23; | [A] - PALMER, G. B. ET AL, "Conductivity and Transparency of ZnO/SnO2-Cosubstituted In2O3", CHEMISTRY OF MATERIALS ( 1997 ), 9(12), 3121-3126 CODEN: CMATEX; ISSN: 0897-4756, (1997), XP002390684 [A] 1-7 * table 1 * DOI: http://dx.doi.org/10.1021/cm9704037 | [A] - PATENT ABSTRACTS OF JAPAN, (19941124), vol. 018, no. 617, Database accession no. (E - 1634), & JP06236710 A 19940823 (IDEMITSU KOSAN CO LTD) [A] 1-7 * abstract * | [A] - PATENT ABSTRACTS OF JAPAN, (19930723), vol. 017, no. 394, Database accession no. (C - 1088), & JP05070943 A 19930323 (MITSUBISHI MATERIALS CORP) [A] 1-7 * abstract * | [A] - PALMER ET AL, JOURNAL OF SOLID STATE CHEMISTRY ACADEMIC PRESS USA, (1997), vol. 134, no. 1, ISSN 0022-4596, pages 192 - 197, XP003011359 [A] 1-7 * the whole document * DOI: http://dx.doi.org/10.1006/jssc.1997.7576 | [A] - MINAMI T ET AL, "New transparent conducting ZnO-In2O3-SnO2 thin films prepared by magnetron sputtering", THIN SOLID FILMS, ELSEVIER-SEQUOIA S.A. LAUSANNE, CH LNKD- DOI:10.1016/S0040-6090(97)00547-6, (19980401), vol. 317, no. 1-2, ISSN 0040-6090, pages 318 - 321, XP004147671 [A] 1-7 * the whole document * DOI: http://dx.doi.org/10.1016/S0040-6090(97)00547-6 | [X] - SUZUKI M ET AL, "Sintering of indium-tin-oxide with vanadium oxide additive", MATERIALS SCIENCE AND ENGINEERING B, ELSEVIER SEQUOIA, LAUSANNE, CH LNKD- DOI:10.1016/S0921-5107(98)00125-1, (19980612), vol. 54, no. 1-2, ISSN 0921-5107, pages 46 - 50, XP004147247 [X] 14,17-19 * page 47, column l * DOI: http://dx.doi.org/10.1016/S0921-5107(98)00125-1 | [X] - SUZUKI M ET AL, "ITO films sputter-deposited using an ITO target sintered with vanadium oxide additive", MATERIALS SCIENCE AND ENGINEERING B, ELSEVIER SEQUOIA, LAUSANNE, CH LNKD- DOI:10.1016/S0921-5107(98)00124-X, (19980612), vol. 54, no. 1-2, ISSN 0921-5107, pages 43 - 45, XP004147246 [X] 14,17-21 * the whole document * DOI: http://dx.doi.org/10.1016/S0921-5107(98)00124-X | [X] - DATABASE WPI, 0, Derwent World Patents Index, vol. 1989, no. 42, Database accession no. 1989-306006, XP002597164 & JPH01227951 A 19890912 (FIGARO GIKEN KK) [X] 24,25,28 * abstract * | [X] - DATABASE WPI, 0, Derwent World Patents Index, vol. 1984, no. 17, Database accession no. 1984-104900, XP002597165 & JPS5948648 A 19840319 (MATSUSHITA ELECTRIC WORKS LTD) [X] 28,29 * abstract * | [X] - RAY ET AL, "Preparation and study of doped and undoped tin dioxide films by the open air chemical vapour deposition technique", THIN SOLID FILMS, ELSEVIER-SEQUOIA S.A. LAUSANNE, CH LNKD- DOI:10.1016/S0040-6090(97)00268-X, (19971010), vol. 307, no. 1-2, ISSN 0040-6090, pages 221 - 227, XP005270700 [X] 34,40,41 * figures 6,7 * DOI: http://dx.doi.org/10.1016/S0040-6090(97)00268-X | [X] - BADAWY W ET AL, "The electrode properties of polycrystalline SnO2 containing up to 10% Sb or Ru oxides", ELECTROCHIMICA ACTA, ELSEVIER SCIENCE PUBLISHERS, BARKING, GB LNKD- DOI:10.1016/0013-4686(84)89001-5, vol. 29, no. 12, ISSN 0013-4686, (19841201), pages 1617 - 1623, (19841201), XP026551492 [X] 34,40,41 * experimental part * DOI: http://dx.doi.org/10.1016/0013-4686(84)89001-5 | [X] - STJERNA B ET AL, "Optical and electrical properties of radio frequency sputtered tin oxide films doped with oxygen vacancies, F, Sb, or Mo", JOURNAL OF APPLIED PHYSICS 1994 SEPT 15 AMERICAN INST OF PHYSICS, (19940915), vol. 76, no. 6, doi:DOI:10.1063/1.357383, pages 3797 - 3817, XP002597166 [X] 34,40,41 * part II (preparation);; figure 11 * DOI: http://dx.doi.org/10.1063/1.357383 | [X] - IWAKURA, CHIAKI ET AL, "ANODIC EVOLUTION OF OXYGEN AND CHLORINE ON FOREIGN METAL-DOPED SnO2 FILM ELECTRODES.", ELECTROCHIMICA ACTA 1981 APR, (198104), vol. 26, no. 4, doi:DOI:10.1016/0013-4686(81)87038-7, pages 579 - 584, XP002597167 [X] 34,38 * experimental section;; table 2 * DOI: http://dx.doi.org/10.1016/0013-4686(81)87038-7 | [X] - NITTA M ET AL, "Propane gas detector using SnO2 doped with Nb, V, Ti, or Mo", JOURNAL OF THE ELECTROCHEMICAL SOCIETY USA, (1978), vol. 125, no. 10, ISSN 0013-4651, pages 1676 - 1679, XP002597168 [X] 38 * experimental;; figure 5 * DOI: http://dx.doi.org/10.1149/1.2131271 | [X] - CASEY V ET AL, "A study of undoped and molybdenum doped, polycrystalline, tin oxide thin films produced by a simple reactive evaporation technique", JOURNAL OF PHYSICS D. APPLIED PHYSICS, IOP PUBLISHING, BRISTOL, GB LNKD- DOI:10.1088/0022-3727/23/9/012, (19900914), vol. 23, no. 9, ISSN 0022-3727, pages 1212 - 1215, XP020015471 [X] 34,40,41 * page 1212 - column r * * page 1215, column l, paragraph 3 * DOI: http://dx.doi.org/10.1088/0022-3727/23/9/012 | [X] - KRIVORUCHKO, P. P. ET AL, "Sintering of tin oxide-based refractory materials with respect to partial oxygen pressure in a gaseous medium", CA, CHEMICAL ABSTRACTS SERVICE, COLUMBUS, OHIO, US, (1980), Database accession no. 1980:624572, URL: STN, XP002597169 [X] 38,39 * abstract * | International search | [A]WO9701853 (IDEMITSU KOSAN CO [JP], et al) |