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EP1105802
European procedure
Extract from the Register of European Patents
EP About this file: EP1105802
| EP1105802 - METHOD FOR REPAIRING FAULTY STORAGE CELLS OF AN INTEGRATED MEMORY [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 28.03.2003 Database last updated on 22.08.2024 | Most recent event Tooltip | 28.03.2008 | Lapse of the patent in a contracting state New state(s): IT | published on 30.04.2008 [2008/18] | Applicant(s) | For all designated states Infineon Technologies AG St.-Martin-Strasse 53 81669 München / DE | [2001/24] | Inventor(s) | 01 /
SCHAMBERGER, Florian Nonn 39 D-83435 Bad Reichenhall / DE | 02 /
SCHNEIDER, Helmut Siegmund-Schacky-Str. 20 D-80993 München / DE | [2001/24] | Representative(s) | Epping - Hermann - Fischer Patentanwaltsgesellschaft mbH Schlossschmidstrasse 5 80639 München / DE | [N/P] |
| Former [2001/24] | Epping Hermann & Fischer Ridlerstrasse 55 80339 München / DE | Application number, filing date | 99952423.4 | 17.08.1999 | [2001/24] | WO1999DE02571 | Priority number, date | DE1998138861 | 26.08.1998 Original published format: DE 19838861 | [2001/24] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | WO0013087 | Date: | 09.03.2000 | Language: | DE | [2000/10] | Type: | A1 Application with search report | No.: | EP1105802 | Date: | 13.06.2001 | Language: | DE | The application published by WIPO in one of the EPO official languages on 09.03.2000 takes the place of the publication of the European patent application. | [2001/24] | Type: | B1 Patent specification | No.: | EP1105802 | Date: | 22.05.2002 | Language: | DE | [2002/21] | Search report(s) | International search report - published on: | EP | 09.03.2000 | Classification | IPC: | G06F11/20 | [2001/24] | CPC: |
G11C29/72 (EP,US);
G06F11/20 (KR)
| Designated contracting states | DE, FR, GB, IE, IT [2002/21] |
| Former [2001/24] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | VERFAHREN ZUR REPARATUR VON DEFEKTEN SPEICHERZELLEN EINES INTEGRIERTEN SPEICHERS | [2001/24] | English: | METHOD FOR REPAIRING FAULTY STORAGE CELLS OF AN INTEGRATED MEMORY | [2001/24] | French: | PROCEDE DE REPARATION DE CELLULES DEFECTUEUSES D'UNE MEMOIRE INTEGREE | [2001/24] | Entry into regional phase | 15.01.2001 | National basic fee paid | 15.01.2001 | Designation fee(s) paid | 15.01.2001 | Examination fee paid | Examination procedure | 08.03.2000 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 15.01.2001 | Examination requested [2001/24] | 19.07.2001 | Despatch of communication of intention to grant (Approval: Yes) | 19.11.2001 | Communication of intention to grant the patent | 19.02.2002 | Fee for grant paid | 19.02.2002 | Fee for publishing/printing paid | Opposition(s) | 25.02.2003 | No opposition filed within time limit [2003/20] | Fees paid | Renewal fee | 21.08.2001 | Renewal fee patent year 03 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | IE | 22.05.2002 | IT | 22.05.2002 | [2008/18] |
| Former [2003/17] | IE | 22.05.2002 | Cited in | International search | [A]EP0140595 (EATON CORP [US]) [A] 1 * page 24, line 7 - page 33, line 20 *; | [A]FR2699301 (SGS THOMSON MICROELECTRONICS [FR], et al) [A] 1 * page 14, line 12 - page 16, line 22; figure 2 *; | [A]DE19736250 (ADVANTEST CORP [JP]) [A] 1 * page 3, line 49 - page 5, line 43; figures 9-11 *; | [A] - DAY J R, "A FAULT-DRIVEN, COMPREHENSIVE REDUNDANCY ALGORITHM", IEEE DESIGN & TEST OF COMPUTERS,US,IEEE COMPUTERS SOCIETY. LOS ALAMITOS, (19850601), vol. 2, no. 3, ISSN 0740-7475, pages 35 - 44, XP000744056 [A] 1 * page 39, column 3, line 12 - page 42, column 1, line 9; figures 3A-3F * | [A] - BOSSE G P, "HIGH SPEED REDUNDANCY PROCESSOR", PROCEEDINGS OF THE INTERNATIONAL TEST CONFERENCE,US,SILVER SPRING, IEEE COMP. SOC. PRESS, (1984), vol. SYMP. 1984, pages 282 - 286, XP000746695 [A] 1 * page 284, column 1, line 44 - page 285, column 1, line 49; figures 1,2 * |