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Extract from the Register of European Patents

EP About this file: EP1144989

EP1144989 - NANOTOMOGRAPHY [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  28.11.2003
Database last updated on 24.04.2024
Most recent event   Tooltip28.03.2008Lapse of the patent in a contracting state
New state(s): IT		published on 30.04.2008  [2008/18]
Applicant(s)For all designated states
Magerle, Robert
Lisztstrasse 1
95444 Bayreuth / DE
[2001/42]
Inventor(s)01 / see applicant
...
 [2001/42]
Representative(s)Bauer, Wulf
Patentanwälte
Bauer Vorberg Kayser
Partnerschaft mbB
Goltsteinstrasse 87
50968 Köln / DE
[N/P]
Former [2001/42]Bauer, Wulf, Dr.
Bayenthalgürtel 15
50968 Köln (Marienburg) / DE
Application number, filing date99952429.117.08.1999
[2001/42]
WO1999DE02577
Priority number, dateDE199815987723.12.1998         Original published format: DE 19859877
[2001/42]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO0039569
Date:06.07.2000
Language:DE
[2000/27]
Type: A1 Application with search report 
No.:EP1144989
Date:17.10.2001
Language:DE
The application published by WIPO in one of the EPO official languages on 06.07.2000 takes the place of the publication of the European patent application.
[2001/42]
Type: B1 Patent specification 
No.:EP1144989
Date:15.01.2003
Language:DE
[2003/03]
Search report(s)International search report - published on:EP06.07.2000
ClassificationIPC:G01N27/00, G01B7/34
[2001/42]
CPC:
G01Q30/04 (EP,US); B82Y15/00 (EP); G01Q30/20 (EP,US);
Y10S977/852 (EP,US)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [2001/42]
TitleGerman:NANOTOMOGRAPHIE[2001/42]
English:NANOTOMOGRAPHY[2001/42]
French:NANOTOMOGRAPHIE[2001/42]
Entry into regional phase23.07.2001National basic fee paid 
23.07.2001Designation fee(s) paid 
23.07.2001Examination fee paid 
Examination procedure14.07.2000Request for preliminary examination filed
International Preliminary Examining Authority: EP
23.07.2001Examination requested  [2001/42]
27.06.2002Despatch of communication of intention to grant (Approval: Yes)
08.11.2002Communication of intention to grant the patent
08.11.2002Fee for grant paid
08.11.2002Fee for publishing/printing paid
Opposition(s)16.10.2003No opposition filed within time limit [2004/03]
Fees paidRenewal fee
31.08.2001Renewal fee patent year 03
02.09.2002Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFI15.01.2003
GR15.01.2003
IE15.01.2003
IT15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
ES30.07.2003
AT17.08.2003
CY17.08.2003
LU17.08.2003
BE31.08.2003
CH31.08.2003
LI31.08.2003
MC31.08.2003
[2008/18]
Former [2005/11]FI15.01.2003
GR15.01.2003
IE15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
ES30.07.2003
AT17.08.2003
CY17.08.2003
LU17.08.2003
BE31.08.2003
CH31.08.2003
LI31.08.2003
MC31.08.2003
Former [2005/02]FI15.01.2003
GR15.01.2003
IE15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
ES30.07.2003
CY17.08.2003
LU17.08.2003
BE31.08.2003
CH31.08.2003
LI31.08.2003
MC31.08.2003
Former [2004/52]FI15.01.2003
GR15.01.2003
IE15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
ES30.07.2003
CY17.08.2003
LU17.08.2003
BE31.08.2003
CH31.08.2003
LI31.08.2003
Former [2004/39]FI15.01.2003
GR15.01.2003
IE15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
ES30.07.2003
CY17.08.2003
LU17.08.2003
CH31.08.2003
LI31.08.2003
Former [2004/36]FI15.01.2003
GR15.01.2003
IE15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
ES30.07.2003
CY17.08.2003
CH31.08.2003
LI31.08.2003
Former [2004/33]FI15.01.2003
GR15.01.2003
IE15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
ES30.07.2003
CH31.08.2003
LI31.08.2003
Former [2004/05]FI15.01.2003
GR15.01.2003
IE15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
ES30.07.2003
Former [2004/03]FI15.01.2003
GR15.01.2003
IE15.01.2003
NL15.01.2003
DK15.04.2003
SE15.04.2003
PT17.04.2003
Former [2003/46]FI15.01.2003
GR15.01.2003
NL15.01.2003
SE15.04.2003
PT17.04.2003
Former [2003/43]FI15.01.2003
NL15.01.2003
SE15.04.2003
PT17.04.2003
Former [2003/41]FI15.01.2003
NL15.01.2003
SE15.04.2003
Former [2003/30]SE15.04.2003
Cited inInternational search[A]JPH08160058  ;
 [A]JPS52137396  ;
 [A]  - RETTIG R ET AL, "Atomic scale properties of interior interfaces of semiconductor heterostructures as determined by quasi-digital highly selective etching and atomic force microscopy", EIGHTH INTERNATIONAL CONFERENCE ON MODULATED SEMICONDUCTOR STRUCTURES. MSS8, SANTA BARBARA, CA, USA, 14-18 JULY 1997, Physica E, 15 July 1998, Elsevier, Netherlands, vol. 2, no. 1-4, ISSN 1386-9477, pages 277 - 281, XP000870399 [A] 1-4,8-11,16,17 * the whole document *

DOI:   http://dx.doi.org/10.1016/S1386-9477(98)00058-7
 [A]  - CHANG D C ET AL, "Micro structural investigation of porous silicon depth profile by direct surface force microscopy", SURFACE/INTERFACE AND STRESS EFFECTS IN ELECTRONIC MATERIAL NANOSTRUCTURES. SYMPOSIUM, SURFACE/INTERFACE AND STRESS EFFECTS IN ELECTRONIC MATERIAL NANOSTRUCTURES. SYMPOSIUM, BOSTON, MA, USA, 27 NOV.-1 DEC. 1995, 1996, Pittsburgh, PA, USA, Mater. Res. Soc, USA, pages 173 - 177, XP000870218 [A] 1-4,8-11,16,17,19 * the whole document *
 [A]  - KALUKIN A R ET AL, "Effects of feature orientation in tomographic reconstructions", X-RAY MICROFOCUSING: APPLICATIONS AND TECHNIQUES, SAN DIEGO, CA, USA, 22-23 JULY 1998, Proceedings of the SPIE - The International Society for Optical Engineering, 1998, SPIE-Int. Soc. Opt. Eng, USA, vol. 3449, ISSN 0277-786X, pages 36 - 44, XP000869951 [A] 1-3,6,10,11 * the whole document *

DOI:   http://dx.doi.org/10.1117/12.330353
 [A]  - HARRISON C ET AL, "Layer by layer imaging of diblock copolymer films with a scanning electron microscope", POLYMER,GB,ELSEVIER SCIENCE PUBLISHERS B.V, vol. 39, no. 13, ISSN 0032-3861, page 2733-2744, XP004112216 [A] 1-3 * page 2733, column R, paragraph 2 - page 2734, column L, paragraph 3 * * page 2742, column L, paragraph 2 - page 2743, column L, paragraph 1 *

DOI:   http://dx.doi.org/10.1016/S0032-3861(97)00613-7
 [A]  - VAEZ-IRAVANI M ET AL, "CORRELATIVE IMAGING IN SCANNING NEAR-FIELD OPTICAL MICROSCOPY", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY: PART A,US,AMERICAN INSTITUTE OF PHYSICS. NEW YORK, vol. 11, no. 4, PART 01, ISSN 0734-2101, page 742-747, XP000403702 [A] 1,2,10 * the whole document *

DOI:   http://dx.doi.org/10.1116/1.578340
 [A]  - PATENT ABSTRACTS OF JAPAN, (19961031), vol. 1996, no. 10, & JP08160058 A 19960621 (NEC CORP) [A] 1-3,6,10-13 * abstract *
 [A]  - DATABASE WPI, 1, Derwent World Patents Index, vol. 1978, no. 01, Database accession no. 1978-00976A, XP002128666 & JPS52137396 A 19771116 (HITACHI LTD) [A] 1-3 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.